Recoil implantation from thin surface films on silicon (English)
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- New search for: Grotzschel, R.
- New search for: Klabes, R.
- New search for: Kreissig, U.
- New search for: Schmidt, A.
- New search for: Grotzschel, R.
- New search for: Klabes, R.
- New search for: Kreissig, U.
- New search for: Schmidt, A.
In:
Radiation Effects and Defects in Solids
;
36
, 3-4
;
129-134
;
1978
- Article (Journal) / Electronic Resource
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Title:Recoil implantation from thin surface films on silicon
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Contributors:Grotzschel, R. ( author ) / Klabes, R. ( author ) / Kreissig, U. ( author ) / Schmidt, A. ( author )
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Published in:Radiation Effects and Defects in Solids ; 36, 3-4 ; 129-134
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Publisher:
- New search for: Taylor & Francis
-
Publication date:1978-01-01
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Size:6 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 36, Issue 3-4
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 129
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Recoil implantation from thin surface films on siliconGrotzschel, R. / Klabes, R. / Kreissig, U. / Schmidt, A. et al. | 1978
- 135
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Lattice location studies of deuterium in Pd0.8Au0.2 and Ta crystals by ion channelingTakahashi, J. / Yamaguchi, S. / Koiwa, M. / Fujino, Y. / Yoshinari, O. / Hirabayashi, M. et al. | 1978
- 141
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Irradiation damage of alkali halide crystals during positron bombardmentArefiev, K. P. / Arefiev, V. P. / Vorobiev, S. A. et al. | 1978
- 149
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Heavy ion ranges in aluminium and siliconCombasson, J. L. / Farmery, B. W. / McCulloch, D. / Neilson, G. W. / Thompson, M. W. et al. | 1978
- 157
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Enhanced diffusion mechanismsBourgoin, J. C. / Corbett, J. W. et al. | 1978
- 189
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The sputtering processes during 6 kev Xe ion beam bombardment of halidesSzymonski, M. / Overeijnder, H. / De Vries, A. E. et al. | 1978
- 197
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The effect of spatial correlations on the steady state nucleation of voidsPeak, David / Corbett, James W. et al. | 1978
- 205
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Contribution of strain effects toward the damage measured in semiconductors by channelingWalker, R. S. / Thompson, D. A. et al. | 1978
- 215
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The ionization energy for 160 mev alpha-particles channelled in siliconJarvis, O. N. / Sherwood, A. C. / Whitehead, C. / Lucas, M. W. et al. | 1978
- 219
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γ-Radiolysis of methyl iodide in 3-methyl pentane glassy matrix and the effects caused by its aggregationSaha, S. K. / Iyer, R. M. et al. | 1978
- 225
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Some features of laser annealing of implanted silicon layersKhaibullin, I. B. / Shtyrkov, E. I. / Zaripov, M. M. / Bayazitov, R. M. / Galjautdinov, M. F. et al. | 1978
- 235
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Stage III recovery kinetics of electron-irradiated CuWienhold, P. / Sonnenberg, K. / Antesberger, A. et al. | 1978
- 245
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Absorption spectra of radiation products (Cd , Pb , I-2) in sodium metaphosphate glassesBarkatt, Aaron / Kobayashi, Yoshimitsu / Rabani, Joseph et al. | 1978
- 249
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Neutron damage rate of copper alloyed aluminumPapathanassopoulos, C. / Papatriantafillou, C. / Rocofyllou, E. / Theophilou, A. et al. | 1978
- 255
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A review of: “RAPIDLY QUENCHED METALS, Section II, Edited by N. J. Grant and B. C. Giessen (Proceedings of the Second International Conference on Rapidly Quenched Metals, Cambridge, Massachusetts, November 17-19, 1975). Elsevier Sequoia S.A. (Lausanne), 1976.”Grant, W. A. et al. | 1978