Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy—A Morphological and Structural Study (English)
- New search for: Bharadwaj, L M
- New search for: Gantcheva, V
- New search for: Simov, S
- New search for: Balossier, G
- New search for: Faure, J
- New search for: Bonhomme, P
- New search for: Kumar, Parshant
- New search for: Bajpai, R P
- New search for: Bharadwaj, L M
- New search for: Gantcheva, V
- New search for: Simov, S
- New search for: Balossier, G
- New search for: Faure, J
- New search for: Bonhomme, P
- New search for: Kumar, Parshant
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In:
IETE Technical Review
;
15
, 1-2
;
37-44
;
1998
- Article (Journal) / Electronic Resource
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Title:Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy—A Morphological and Structural Study
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Contributors:Bharadwaj, L M ( author ) / Gantcheva, V ( author ) / Simov, S ( author ) / Balossier, G ( author ) / Faure, J ( author ) / Bonhomme, P ( author ) / Kumar, Parshant ( author ) / Bajpai, R P ( author )
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Published in:IETE Technical Review ; 15, 1-2 ; 37-44
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Publisher:
- New search for: Taylor & Francis
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Publication date:1998-01-01
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Size:8 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Source:
Table of contents – Volume 15, Issue 1-2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3
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Guest EditorialBajpai, R P et al. | 1998
- 5
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An Indigenously Developed PC Based Rapid Thermal Chemical Vapour Deposition SystemDixit, B B / Rao, K S N / Gautam, G K / Suryanarayana, P / Eranna, G / Joshi, B C / Deshwal, V P / Varma, R et al. | 1998
- 13
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Microelectronics Instrumentation at CSIOBajpai, R P et al. | 1998
- 15
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PC-Based Contact Resistance Measurement System using TLM MethodGangurde, K D / Shaligram, A D et al. | 1998
- 21
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In-situ Monitoring of Crystal Growth in LPE using MicroprocessorPatel, S A / Chaudhari, C B / Gautam, D K et al. | 1998
- 27
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Development of an Automated High Pressure Oxidation System (HiPOS)Bhat, K N / Rao, P R S / Vijayakumar, J / Seetharaman, S / Gopinath, K / Chari, K S et al. | 1998
- 37
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Reverse Engineering of Integrated Circuits using Cross-Sectional Transmission Electron Microscopy—A Morphological and Structural StudyBharadwaj, L M / Gantcheva, V / Simov, S / Balossier, G / Faure, J / Bonhomme, P / Kumar, Parshant / Bajpai, R P et al. | 1998
- 45
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Microprocessor Controlled Inclined Etching for the Measurement of Carrier Concentration ProfileNarsay, Deep / Chaudhari, C B / Gautam, D K et al. | 1998
- 49
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Reactive Ion Etching (RIE) System Design and its CharacterisationPaul, A K / Sodhi, K / Dimri, A K / Banerjie, P C / Bajpai, R P et al. | 1998
- 55
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PC Based Simple ac Hall Measurement SystemGhanshyam, C / Reddy, M H Madhusudhana / Ram, Nathai / Mishra, Sunita / Bhalla, Ketan / Bajpai, R P et al. | 1998
- 59
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A Fuzzy Method to Optimize the Performance of Si d-MESFETs: Influence of Pearson ProfileRajesh, S / Thomas, Ciby / Gupta, R S et al. | 1998
- 65
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Diamond Thin Films by Microwave Plasma Chemical Vapour Deposition ProcessBarshilia, H C / Vankar, V D et al. | 1998
- 71
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Growth of Diamond Thin Films using Oxy-Acetylene Flame ProcessKapil, R / Mehta, B R / Vankar, V D et al. | 1998
- 77
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Optimization of Ion Implanted Low-High-Low Impurity Profile for Silicon n+pp+ SDR DiodePanda, A K / Pati, S P et al. | 1998
- 83
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Design and Technology Development of a Bipolar Array Chip for Analog ASICsKal, S / Das, S / Pal, R / Basu, P K / Pillai, S V / Lahiri, S K et al. | 1998
- 99
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Structure and Properties of Diamond Thin Films Grown by Hot-Filament Chemical Vapour Deposition TechniqueDilawar, Nita / Vankar, V D et al. | 1998
- 105
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Development of Computer Controlled Deep Level Transient Spectroscopy SystemReddy, P N / Reddy, B P N / Pandurangaiah, S V / Chari, K S et al. | 1998
- 111
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Modelling and Simulation of Multi-Layered VLSI Interconnects used in High-Speed CommunicationsKulkarni, S Y / Murthy, K V V et al. | 1998
- 119
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Strategies and Requisites of Testing LSI/VLSI DevicesFazil, M M / Sood, A K / Bajpai, R P et al. | 1998
- 123
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Modelling, Simulation and Design Optimization of Rapid Thermal Processing SystemKulkarni, R N / Shaligram, A D et al. | 1998
- 131
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Possible Application of Laser Doppler Displacement (LDD) System in Stepper Optical LithographyKalonia, R C / Mitra, G / Bajpai, R P / Mohan, Chander / Bahuguna, B B et al. | 1998
- 135
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From Short Waves in the Laboratory to Communication Revolution Across the GlobeRao, U R et al. | 1998
- 141
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Instruction to Contributors| 1998