Screening for counterfeit electronic parts (English)
- New search for: Sood, Bhanu
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In:
Journal of Materials Science - Materials in Electronics
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22
, 10
;
1511-1522
;
2011
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ISSN:
- Article (Journal) / Print
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Title:Screening for counterfeit electronic parts
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Additional title:Überprüfung auf gefälschte Elektronikteile
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Contributors:
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Published in:Journal of Materials Science - Materials in Electronics ; 22, 10 ; 1511-1522
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Publisher:
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Publication date:2011
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Size:12 Seiten, 5 Bilder, 5 Tabellen, 16 Quellen
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ISSN:
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Coden:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents – Volume 22, Issue 10
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1509
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IntroductionKnauss, Lee et al. | 2011
- 1511
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Screening for counterfeit electronic partsSood, Bhanu / Das, Diganta / Pecht, Michael et al. | 2011
- 1523
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Failure localization with active and passive voltage contrast in FIB and SEMRosenkranz, Ruediger et al. | 2011
- 1536
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Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devicesLiu, Tao-Chi / Chen, Chih / Liu, Shih-Ting / Chang, Ming-Lun / Lin, Jandel et al. | 2011
- 1542
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Two-photon absorption laser assisted device alteration using continuous wave 1,340 nm laserNiu, Baohua / Pardy, Patrick / Fortier, Jerry / Ortega, Mel / Eiles, Travis et al. | 2011
- 1553
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Characterization of poly-Si thin-film solar cell functions and parameters with IR optical interaction techniquesBoostandoost, M. / Friedrich, F. / Kerst, U. / Boit, C. / Gall, S. / Yokoyama, Y. et al. | 2011
- 1580
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Extending acoustic microscopy for comprehensive failure analysis applicationsBrand, Sebastian / Czurratis, Peter / Hoffrogge, Peter / Temple, Dorota / Malta, Dean / Reed, Jason / Petzold, Matthias et al. | 2011
- 1594
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LA ICP-MS in microelectronics failure analysisPan, Zixiao / Wei, Wei / Li, Fuhe et al. | 2011
- 1602
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Conductive filament formation in printed circuit boards: effects of reflow conditions and flame retardantsSood, Bhanu / Pecht, Michael et al. | 2011
- 1616
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Disassembly methodology for conducting failure analysis on lithium–ion batteriesWilliard, Nick / Sood, Bhanu / Osterman, Michael / Pecht, Michael et al. | 2011