Effects of beam spot size on the correlation between laser and heavy ion SEU testing (English)
- New search for: Miller, F.
- New search for: Buard, N.
- New search for: Carriere, T.
- New search for: Dufayel, R.
- New search for: Gaillard, R.
- New search for: Poirot, P.
- New search for: Palau, J.M.
- New search for: Sagnes, B.
- New search for: Fouillat, P.
- New search for: Miller, F.
- New search for: Buard, N.
- New search for: Carriere, T.
- New search for: Dufayel, R.
- New search for: Gaillard, R.
- New search for: Poirot, P.
- New search for: Palau, J.M.
- New search for: Sagnes, B.
- New search for: Fouillat, P.
In:
IEEE Transactions on Nuclear Science
;
51
, 6, pt.2
;
3708-3715
;
2004
-
ISSN:
- Article (Journal) / Print
-
Title:Effects of beam spot size on the correlation between laser and heavy ion SEU testing
-
Contributors:Miller, F. ( author ) / Buard, N. ( author ) / Carriere, T. ( author ) / Dufayel, R. ( author ) / Gaillard, R. ( author ) / Poirot, P. ( author ) / Palau, J.M. ( author ) / Sagnes, B. ( author ) / Fouillat, P. ( author )
-
Published in:IEEE Transactions on Nuclear Science ; 51, 6, pt.2 ; 3708-3715
-
Publisher:
-
Publication date:2004
-
Size:8 Seiten, 14 Quellen
-
ISSN:
-
Coden:
-
DOI:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
-
Keywords:
-
Source:
Table of contents – Volume 51, Issue 6, pt.2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 3211
-
Spatial distribution of electron-hole pairs induced by electrons and protons in SiO2Murat, M. / Akkerman, A. / Barak, J. et al. | 2004
- 3219
-
Effect of thermal annealing on radiation-induced degradation of bipolar technologies when the dose rate is switched from high to lowDucret, S. / Saigne, F. / Boch, J. / Schrimpf, R.D. / Fleetwood, D.M. / Vaille, J.R. / Dusseau, L. / David, J.P. / Ecoffet, R. et al. | 2004
- 3336
-
Improved model for single-event burnout mechanismKuboyama, S. / Ikeda, N. / Hirao, T. / Matsuda, S. et al. | 2004
- 3354
-
Simulation-based analysis of SEU effects in SRAM-based FPGAsViolante, M. / Sterpone, L. / Ceschia, M. / Bortolato, D. / Bernardi, P. / Reorda, M.S. / Paccagnella, A. et al. | 2004
- 3388
-
Observation of the solar particle events of October and November 2003 from CREDO and MPTBDyer, C.S. / Hunter, K. / Clucas, S. / Campbell, A. et al. | 2004
- 3413
-
Particle effects on the ISGRI Instrument On-board the INTEGRAL SatelliteClaret, A. / Limousin, O. / Lugiez, F. / Laurent, P. / Renaud, M. et al. | 2004
- 3435
-
Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experimentsLambert, D. / Baggio, J. / Ferlet-Cavrois, V. / Flament, O. / Saigne, F. / Sagnes, B. / Buard, N. / Carriere, T. et al. | 2004
- 3452
-
A neutron spectrometer for avionic environment investigationsHubert, G. / Trochet, P. / Riant, O. / Heinz, P. / Gaillard, R. et al. | 2004
- 3486
-
Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross sectionBarak, J. / Haran, A. / Adler, E. / Azoulay, M. / Levinson, J. / Zentner, A. / David, D. / Fischer, B.E. / Heiss, M. / Betel, D. et al. | 2004
- 3564
-
Radiation degradation mechanisms in laser diodesJohnston, A.H. / Miyahira, T.F. et al. | 2004
- 3585
-
Proton radiation damage at low temperature in GaAs and GaN light-emitting diodesKhanna, S.M. / Estan, D. / Houdayer, A. / Liu, H.C. / Dudek, R. et al. | 2004
- 3638
-
Quality control of intensity modulated radiation therapy with optically stimulated luminescent filmsIdri, K. / Santoro, L. / Charpiot, E. / Herault, J. / Costa, A. / Ailleres, N. / Delard, R. / Vaille, J.R. / Fesquet, J. / Dusseau, L. et al. | 2004
- 3649
-
Measurement of device parameters using image recovery techniques in large-scale IC devicesScheick, L. / Edmonds, L. et al. | 2004
- 3686
-
Using surface charge analysis to characterize the radiation response of Si/SiO2 structuresStacey, J.W. / Schrimpf, R.D. / Fleetwood, D.M. / Holmes, K.C. et al. | 2004
- 3708
-
Effects of beam spot size on the correlation between laser and heavy ion SEU testingMiller, F. / Buard, N. / Carriere, T. / Dufayel, R. / Gaillard, R. / Poirot, P. / Palau, J.M. / Sagnes, B. / Fouillat, P. et al. | 2004
- 3730
-
Proton, neutron, and gamma degradation of optocouplersGorelick, J.L. / Ladbury, R. et al. | 2004