SEM/EBIC investigations of extended defect system in GaN epilayers (English)
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- New search for: Shmidt, N.M.
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In:
EDS, International Conference on Extended Defects in Semiconductors, 10
;
1797-1801
;
2005
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ISSN:
- Conference paper / Print
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Title:SEM/EBIC investigations of extended defect system in GaN epilayers
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Contributors:Shmidt, N.M. ( author ) / Sitnikova, A.A. ( author ) / Zolotareva, R.V. ( author ) / Sirotkin, V.V. ( author ) / Soltanovich, O.A. ( author ) / Yakimov, E.B. ( author )
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Published in:Physica Status Solidi / C: Current topics in solid state physics ; 2, 6 ; 1797-1801
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Publisher:
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Publication date:2005
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Size:5 Seiten, 5 Bilder, 16 Quellen
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:Erforschung , epitaxiale Schicht , Elektronenbeweglichkeit , Versetzungsdichte , Rekombination , Radius , Schraubenversetzung , zellenförmige Struktur , Domänenwand , A3-B5-Verbindung , Al2O3 , Aluminiumverbindung , Amaryl , Aufdampfen , Beschichten , Beschichtungsmethode , Keramik , Kristallisation , CVD-Beschichten , Dampfphasenepitaxie , Durchstrahlungselektronenmikroskopie , Edelmetallverbindung , Edelstein , Elektronenmikroskopie , Epitaxialtechnik , Fabrikation , Fertigungsprozess
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Source: