SXRT Investigations on Electrically Stressed 4H-SiC PiN Diodes for 6.5 kV (English)
- New search for: Kallinger, Birgit
- New search for: Berwian, Patrick
- New search for: Friedrich, Jochen
- New search for: Hecht, Christian
- New search for: Peters, Dethard
- New search for: Friedrichs, Peter
- New search for: Thomas, Bernd
- New search for: Kallinger, Birgit
- New search for: Berwian, Patrick
- New search for: Friedrich, Jochen
- New search for: Hecht, Christian
- New search for: Peters, Dethard
- New search for: Friedrichs, Peter
- New search for: Thomas, Bernd
In:
ECSCRM, European Conference on Silicon Carbide and Related Materials, 9
;
899-902
;
2013
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ISSN:
- Conference paper / Print
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Title:SXRT Investigations on Electrically Stressed 4H-SiC PiN Diodes for 6.5 kV
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Contributors:Kallinger, Birgit ( author ) / Berwian, Patrick ( author ) / Friedrich, Jochen ( author ) / Hecht, Christian ( author ) / Peters, Dethard ( author ) / Friedrichs, Peter ( author ) / Thomas, Bernd ( author )
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Published in:Materials Science Forum ; 740-742 ; 899-902
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Publisher:
- New search for: Trans Tech Publications
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Place of publication:Zürich
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Publication date:2013
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Size:4 Seiten
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ISSN:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source: