A variety of microstructural defects in crystalline silicon solar cells (English)
- New search for: Skarvada, Pavel
- New search for: Tomanek, Pavel
- New search for: Koktavy, Pavel
- New search for: Macku, Robert
- New search for: Sicner, Jiri
- New search for: Vondra, Marek
- New search for: Dallaeva, Dinara
- New search for: Smith, Steve
- New search for: Grmela, Lubomir
- New search for: Skarvada, Pavel
- New search for: Tomanek, Pavel
- New search for: Koktavy, Pavel
- New search for: Macku, Robert
- New search for: Sicner, Jiri
- New search for: Vondra, Marek
- New search for: Dallaeva, Dinara
- New search for: Smith, Steve
- New search for: Grmela, Lubomir
In:
SSSI, Solid State Surfaces and Interfaces, 8
;
50-56
;
2014
-
ISSN:
- Conference paper / Print
-
Title:A variety of microstructural defects in crystalline silicon solar cells
-
Contributors:Skarvada, Pavel ( author ) / Tomanek, Pavel ( author ) / Koktavy, Pavel ( author ) / Macku, Robert ( author ) / Sicner, Jiri ( author ) / Vondra, Marek ( author ) / Dallaeva, Dinara ( author ) / Smith, Steve ( author ) / Grmela, Lubomir ( author )
-
Published in:Applied Surface Science ; 312 ; 50-56
-
Publisher:
-
Publication date:2014
-
Size:7 Seiten, 19 Quellen
-
ISSN:
-
Coden:
-
DOI:
-
Type of media:Conference paper
-
Type of material:Print
-
Language:English
-
Keywords:Solarzelle , Silicium , Lichtemission , Messen , Fehlercharakterisierung , Verfahrensschritt , Fehlerortung , Mikrostruktur , Schliffbild , Oberflächenfehler , Lichtstrahl , Photostrom , Nichtlinearität , Spannung (elektrisch) , Flächeninhalt , Mikromaßstab , elektrische Vorspannung , kristalliner Stoff , sichtbares Licht
-
Source: