Contrast of device structures in x-ray section topographs (English)
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In:
Journal of Physics D: Applied Physics
;
26
, 4A Special issue
;
137-141
;
1993
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ISSN:
- Article (Journal) / Print
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Title:Contrast of device structures in x-ray section topographs
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Additional title:Kontrast von Bauelementestrukturen in Röntgenabschnittstopogrammen
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Contributors:Holland, A.J. ( author ) / Tanner, B.K. ( author )
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Published in:Journal of Physics D: Applied Physics ; 26, 4A Special issue ; 137-141
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Publisher:
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Publication date:1993
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Size:5 Seiten, 9 Bilder, 18 Quellen
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ISSN:
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Coden:
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DOI:
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Type of media:Article (Journal)
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents – Volume 26, Issue 4A Special issue
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 22
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Analysis of (n, - n) and (n, -n, N) x-ray rocking curves of processed siliconServidori, M. / Fabbri, R. et al. | 1993
- 45
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X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growthBarnett, S.J. / Whitehouse, C.R. / Keir, A.M. / Clark, G.F. / Usher, B. / Tanner, B.K. / Emeny, M.T. / Johnson, A.D. et al. | 1993
- 76
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X-ray study of dislocation structure formation features in epitaxial systems with small mismatchProkhorov, I.A. / Zakharov, B.G. / Manshin, V.S. / Shulpina, I.L. et al. | 1993
- 86
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X-ray scattering topographic study of lattice-mismatched compound semiconductor heteroepitaxial layersSuzuki, Yoshifumi / Chikaura, Yoshinori / Kii, Hideki et al. | 1993
- 137
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Contrast of device structures in x-ray section topographsHolland, A.J. / Tanner, B.K. et al. | 1993
- 151
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X-ray scattering from multiple-layer structures forming Bragg-case interferometersTanner, B.K. et al. | 1993
- 167
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Structural characterization of GaAs/GaP superlatticesMazuelas, A. / Ruiz, A. / Ponce, F. / Briones, F. et al. | 1993
- 173
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Characterization of III-V heteroepitaxial layers by x-ray diffractionPacherova, O. / Sourek, Z. / Kub, J. et al. | 1993
- 181
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X-ray diffraction determination of a semiconductor epilayer unit cell oriented and distorted arbitrarilyUsher, B.F. / Smith, G.W. / Barnett, S.J. / Keir, A.M. / Pitt, A.D. et al. | 1993
- 202
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X-ray total external reflection fluorescence study of LB films on solid substrateZheludeva, S.I. / Kovalchuk, M.V. / Novikova, N.N. / Soshenov, A.N. / Erochin, V.E. / Feigin, L.A. et al. | 1993