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The full wave solution for scattering from two dimensional irregular layered structures is expressed a sum of the radiation fields, the lateral waves, and the surface waves. Only the radiation far fields are considered in this work, since excitations of plane waves are considered and the observation points are in the far field region. The like and cross polarized diffuse scattered fields are derived for three medium irregular structures with two dimensional rough interfaces. The thickness of the coating material or thin film between the two interfaces is assumed to be constant. Thus in this case both interfaces are rough and there are five different scattering processes identified in the full wave results. The full wave (first order) diffuse scatter solutions (at a single rough interface) reduce to the perturbation solution when the surface rms heights (in wavelengths) and slopes are very small and of the same order of smallness. When the surface radii of curvature (related to correlation length) and rms heights are very large (compared to the wave length) the full wave (first order) scatter solutions reduce to the physical optics solutions. The polarimetric solutions can be applied to remote sensing of dielectric coating materials on rough surfaces.