Electric contact behavior of Cu-Sn intermetallic compound formed in tin platings (English)
- New search for: Shao, C.B.
- New search for: Zhang, J.G.
- New search for: Shao, C.B.
- New search for: Zhang, J.G.
In:
Electrical Contacts - 1998, IEEE Holm Conference on Electrical Contacts, 44
;
26-33
;
1998
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ISBN:
- Conference paper / Print
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Title:Electric contact behavior of Cu-Sn intermetallic compound formed in tin platings
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Contributors:Shao, C.B. ( author ) / Zhang, J.G. ( author )
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Published in:
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Publisher:
- New search for: Institute of Electrical and Electronics Engineers (IEEE)
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Place of publication:New York
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Publication date:1998
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Size:8 Seiten, 12 Quellen
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ISBN:
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DOI:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Electrical contact resistance: properties of stationary interfacesTimsit, S. et al. | 1998
- 20
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Shape memory alloy coil-shaped clamp for enhanced normal force in electrical connectorsKulisic, I. / Gray, G.L. / Mohney, S.E. et al. | 1998
- 26
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Electric contact behavior of Cu-Sn intermetallic compound formed in tin platingsShao, C.B. / Zhang, J.G. et al. | 1998
- 34
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Mechanical properties and fretting behavior of sulfide filmShao, C.B. / Zhang, J.G. et al. | 1998
- 44
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Mechanical modeling of fretting cycles of electrical contactsTristani, L. / Zindine, E.M. / Boyer, L. / Klimek, G. et al. | 1998
- 53
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Magnetic flux density as a probe of the state of electrical contactsNordstrom, A. / Gustafsson, R. et al. | 1998
- 57
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Concerning reliability modeling of connectorsMroczkowski, R.S. et al. | 1998
- 69
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Arc structure, arc motion and gas pressure between laterally enclosed arc runnersZeller, P. / Rieder, W. et al. | 1998
- 75
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High power current limiting with conductor-filled polymer compositesDuggal, A.R. / Sun, F.G. / Levinson, L.M. et al. | 1998
- 82
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Study on arc moving image with high frame rate CCD for low voltage apparatusJiaomin Liu, / Jianguo Lu, et al. | 1998
- 87
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A new approach to suppress arcing in current interruptionChen, W.W. et al. | 1998
- 93
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Electrode processes and arc form in miniature circuit breakersMcBride, J.W. / Jeffery, P.A. / Weaver, P.M. et al. | 1998
- 100
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Investigation of arcing effects during contact blow open processZhou, X. / Theisen, P. et al. | 1998
- 100
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Investingation of Arcing Effects During Contact Blow Open ProcessZhou, X. / Theisen, P. / Institute of Electrical and Electronics Engineers et al. | 1998
- 109
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STM study of topographical changes on gold contact surfaces caused by loadingPendleton, W.E. / Tackett, A. / Korzeniowski, L. / Cvijanovich, G.B. / Williams, R.T. / Jones, W.C. et al. | 1998
- 120
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Computer simulation of topographical changes on gold contact surfaces caused by loadingPendleton, W.E. / Tackett, A. / Korzeniowski, L. / Cvijanovich, G.B. / Williams, R.T. / Jones, W.C. et al. | 1998
- 127
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Study of contacts in an electrostatically actuated microswitchMajumder, S. / McGruer, N.E. / Adams, G.G. / Zavracky, A. / Zavracky, P.M. / Morrison, R.H. / Krim, J. et al. | 1998
- 133
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Contact physics of gold microcontacts for MEMS switchesHyman, D. / Mehregany, M. et al. | 1998
- 141
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Performance of the gold-tin connector interface in a flight environmentAbbott, W.H. et al. | 1998
- 151
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Nickel matrix composite electrocoatings as stationary electrical contactsDervos, C.T. / Kollia, C. / Psarrou, S. / Vassiliou, P. / Spyrellis, N. et al. | 1998
- 159
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Investigation of the thickness of lubricant film on gold plated surfaceZhou, Y.L. / Zhang, J.G. et al. | 1998
- 166
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Analysis of compounds in airborne dust collected in BeijingJi-Gao Zhang, / Ya-Nan Liang, / Jiang-Wen Wan, / Bai-Sheng Sun, et al. | 1998
- 172
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A study of contact resistance model for the busbar joints lubricated by contact aid compoundsZhang, G.S. / Lin, J. / Chen, W. et al. | 1998
- 179
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Aging of defective electrical joints in underground power distribution systemsFournier, D. et al. | 1998
- 193
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Optimization of silver tin oxide chemistry to enhance electrical performance in a.c. applicationFrancisco, H.A. / Myers, M. et al. | 1998
- 202
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Adjustment state and quasisteady state of structure and composition of AgMeO contacts by breaking arcsJiang-Wen Wan, / Ji-Gao Zhang, / Ming-Zhe Rong, et al. | 1998
- 207
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Influence of AC interruption points on AC arc erosion of silver based contact materialsNouri, H. / Davies, T.S. / Head, J. et al. | 1998
- 214
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A new design of multi-contact reed relay for improving switching load capacityLiang-Jun Xu, / Ji-Gao Zhang, / Miedzinski, B. et al. | 1998
- 220
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Parameters influencing the contact compatibility of organic vapours in telecommunication and control switchesKoidl, H.P. / Rieder, W.F. / Salzmann, Q.R. et al. | 1998
- 226
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The finite-element model and analysis of static contact resistance and thermal process for contact with filmLi Kui, / Su Xiuping, / Li Zhigang, / Lu Jianguo, / Zhang Guansheng, et al. | 1998
- 230
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Environmental conditions of residential electrical connectionsAronstein, J. et al. | 1998
- 239
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Stress relaxation of aluminum wire conductorsBraunovic, M. et al. | 1998
- 252
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Contribution to the modeling of the heating phenomenon of electric contactsSantandrea, L. / Teste, P. / Andlauer, R. / Leblanc, T. / Chabrerie, J.-P. et al. | 1998
- 256
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Environmental effects on the electrical performance of silver contact-substrate systemsDervos, C.T. / Vassiliou, P. et al. | 1998
- 269
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Optimization of the break-arc erosion performance of contact materials in switching devicesBraumann, P. / Koffler, A. / Wingert, P. et al. | 1998
- 276
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The effect of microstructure on the electrical performance of Ag-WC-C contact materialsAllen, S.E. / Streicher, E. et al. | 1998
- 287
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Erosion and resistance characteristics of AgW and AgC contacts at high current arcing in airShea, J.J. et al. | 1998
- 292
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Switching behavior of silver/graphite contact material in different atmospheres with regard to contact erosionVinaricky, E. / Behrens, V. et al. | 1998
- 301
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Study of electric field between two parallel electrodes with arc at a low voltagePodolsky, D. / Kapustin, V. et al. | 1998
- 307
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Influence of contact geometry and current on effective erosion of Cu-Cr, Ag-WC and Ag-Cr vacuum contact materialsSchulman, M.B. / Slade, P.G. / Loud, L.D. / Li, W. et al. | 1998
- i
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Electrical Contacts - 1998. Proceedings of the Forty-Fourth IEEE Holm Conference on Electrical Contacts (Cat. No.98CB36238)| 1998