Comparison of I5M and 4Pi‐microscopy (English)
- New search for: BEWERSDORF, J.
- New search for: SCHMIDT, R.
- New search for: HELL, S. W.
- New search for: BEWERSDORF, J.
- New search for: SCHMIDT, R.
- New search for: HELL, S. W.
In:
Journal of Microscopy
;
222
, 2
;
105-117
;
2006
- Article (Journal) / Electronic Resource
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Title:Comparison of I5M and 4Pi‐microscopy
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Contributors:
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Published in:Journal of Microscopy ; 222, 2 ; 105-117
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Publisher:
- New search for: Blackwell Publishing Ltd
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Publication date:2006-05-01
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Size:13 pages
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ISSN:
-
DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:fluorescence , interference , widefield , superresolution , OTF , Confocal , two‐photon , resolution , deconvolution , multiphoton , PSF
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Source:
Table of contents – Volume 222, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 69
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‘Five‐parameter’ analysis of grain boundary networks by electron backscatter diffractionRANDLE, VALERIE et al. | 2006
- 76
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Automated microscopy system for mosaic acquisition and processingCHOW, S. K. / HAKOZAKI, H. / PRICE, D. L. / MACLEAN, N. A. B. / DEERINCK, T. J. / BOUWER, J. C. / MARTONE, M. E. / PELTIER, S. T. / ELLISMAN, M. H. et al. | 2006
- 85
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EBSD investigation of the microstructure and texture characteristics of hot deformed duplex stainless steelCIZEK, P. / WYNNE, B. P. / RAINFORTH, W. M. et al. | 2006
- 97
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An analysis of microband orientation in a commercial purity aluminium alloy subjected to forward and reverse torsion using Electron Backscatter Diffraction (EBSD)LOPEZ‐PEDROSA, M. / WYNNE, B. P. / RAINFORTH, W. M. et al. | 2006
- 105
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Comparison of I5M and 4Pi‐microscopyBEWERSDORF, J. / SCHMIDT, R. / HELL, S. W. et al. | 2006
- 118
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Epifluorescence, confocal and total internal reflection microscopy for single‐molecule experiments: a quantitative comparisonLANG, E. / BAIER, J. / KÖHLER, J. et al. | 2006
- 124
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A physical phantom for the calibration of three‐dimensional X‐ray microtomography examinationPERILLI, E. / BARUFFALDI, F. / BISI, M. C. / CRISTOFOLINI, L. / CAPPELLO, A. et al. | 2006
- 135
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Filter cubes with built‐in ultrabright light‐emitting diodes as exchangeable excitation light sources in fluorescence microscopyMOSER, C. / MAYR, T. / KLIMANT, I. et al. | 2006
- 141
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Stereology for StatisticiansMattfeldt, Torsten et al. | 2006