Strength Testing (English)
- New search for: Freiman, Stephen W.
- New search for: Mecholsky, John J. Jr.
- New search for: Freiman, Stephen W.
- New search for: Mecholsky, John J. Jr.
In:
The Fracture of Brittle Materials
: Testing and Analysis
;
68-98
;
2012
-
ISBN:
- Article/Chapter (Book) / Electronic Resource
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Title:Strength Testing
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Contributors:Freiman, Stephen W. ( author ) / Mecholsky, John J. Jr. ( author )
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Published in:The Fracture of Brittle Materials : Testing and Analysis ; 68-98
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Publisher:
- New search for: John Wiley & Sons, Inc.
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Place of publication:Hoboken, NJ, USA
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Publication date:2012-02-17
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Size:31 pages
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ISBN:
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DOI:
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Type of media:Article/Chapter (Book)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents eBook
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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IntroductionFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 6
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Fracture Mechanics BackgroundFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 19
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Environmentally Enhanced Crack GrowthFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 32
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Fracture Mechanics TestsFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 68
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Strength TestingFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 99
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Quantitative FractographyFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 131
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Microstructural EffectsFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 145
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Predicting ReliabilityFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 158
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Concluding RemarksFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 161
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ReferencesFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 175
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Name IndexFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- 179
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Subject IndexFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012
- i
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FrontmatterFreiman, Stephen W. / Mecholsky, John J. Jr. et al. | 2012