X‐ray diffraction study of strain and defect structure of nonpolar a‐plane GaN‐layers grown on r‐plane sapphire (English)
- New search for: Kyutt, R. N.
- New search for: Shcheglov, M. P.
- New search for: Ratnikov, V. V.
- New search for: Kalmykov, A. E.
- New search for: Kyutt, R. N.
- New search for: Shcheglov, M. P.
- New search for: Ratnikov, V. V.
- New search for: Kalmykov, A. E.
In:
physica status solidi (a)
;
206
, 8
;
1757-1760
;
2009
- Article (Journal) / Electronic Resource
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Title:X‐ray diffraction study of strain and defect structure of nonpolar a‐plane GaN‐layers grown on r‐plane sapphire
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Contributors:Kyutt, R. N. ( author ) / Shcheglov, M. P. ( author ) / Ratnikov, V. V. ( author ) / Kalmykov, A. E. ( author )
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Published in:physica status solidi (a) ; 206, 8 ; 1757-1760
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Publisher:
- New search for: WILEY‐VCH Verlag
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Publication date:2009-08-01
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Size:4 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 206, Issue 8
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1681
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Contents: (Phys. Status Solidi A 8/2009)| 2009
- 1688
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Recent and forthcoming publications in pss| 2009
- 1689
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PrefaceStangl, Julian / Bauer, Günther et al. | 2009
- 1693
-
ObituaryMoore, Moreton et al. | 2009
- 1695
-
A dynamical theory for the X‐ray diffraction from the partially relaxed layersBenediktovich, Andrey / Feranchuk, Ilya et al. | 2009
- 1699
-
Lattice parameter determination by coincidental multi‐beam X‐ray diffractionBorcha, Mariana / Fodchuk, Igor / Krytsun, Igor et al. | 2009
- 1704
-
Submicron resolution X‐ray diffraction from periodically patterned GaAs nanorods grown onto Ge[111]Davydok, Anton / Biermanns, Andreas / Pietsch, Ullrich / Grenzer, Jörg / Paetzelt, Hendrik / Gottschalch, Volker / Bauer, Jens et al. | 2009
- 1709
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In situ X‐ray investigation of SiGe/Si islands grown by liquid phase epitaxyDeiter, S. / Hanke, M. / Eisenschmidt, C. / Boeck, T. / Teubner, T. / Jendritzki, U. / Gerlitzke, A.‐K. / Schadow, G. et al. | 2009
- 1714
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Influence of quantum‐dots density on average in‐plane strain of optoelectronic devices investigated by high‐resolution X‐ray diffractionFreitas, Raul O. / Diaz, Beatriz / Abramof, Eduardo / Quivy, Alain A. / Morelhão, Sérgio L. et al. | 2009
- 1718
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From nanoislands to nanowires: Growth of germanium on gallium‐terminated silicon surfacesSchmidt, Th. / Flege, J. I. / Speckmann, M. / Clausen, T. / Gangopadhyay, S. / Locatelli, A. / Mentes, T. O. / Heun, S. / Guo, F. Z. / Sutter, P. et al. | 2009
- 1723
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Recent developments in tomographic small‐angle X‐ray scatteringFeldkamp, J. M. / Kuhlmann, M. / Roth, S. V. / Timmann, A. / Gehrke, R. / Shakhverdova, I. / Paufler, P. / Filatov, S. K. / Bubnova, R. S. / Schroer, C. G. et al. | 2009
- 1727
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A combined X‐ray, ellipsometry and atomic force microscopy study on thin parylene‐C filmsFlesch, Heinz‐Georg / Werzer, Oliver / Weis, Martin / Jakabovič, Ján / Kováč, Jaroslav / Haško, Daniel / Jakopič, Georg / Wondergem, Harry J. / Resel, Roland et al. | 2009
- 1731
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Ripple structures on surfaces and underlying crystalline layers in ion beam irradiated Si wafersGrenzer, J. / Biermanns, A. / Mücklich, A. / Grigorian, S. A. / Pietsch, U. et al. | 2009
- 1736
-
Anomalous X‐ray scattering study of the local structure in Ge‐Se glassesHosokawa, S. / Oh, I. / Sakurai, M. / Pilgrim, W.‐C. / Boudet, N. / Bérar, J.‐F. et al. | 2009
- 1740
-
Heteroepitaxial growth of lattice matched films on GaAs(001)Jenichen, B. / Kaganer, V. M. / Shayduk, R. / Braun, W. / Trampert, A. et al. | 2009
- 1744
-
Interfacial roughness of Fe3Si/GaAs(001) films studied by X‐ray crystal truncation rodsKaganer, Vladimir / Jenichen, Bernd / Shayduk, Roman / Braun, Wolfgang et al. | 2009
- 1748
-
Three‐dimensional ordering in self‐organized (In,Ga)As quantum dot multilayer structuresKladko, V. / Slobodian, M. / Lytvyn, P. / Strelchuk, V. / Mazur, Yu. / Marega, E. / Hussein, M. / Salamo, G. et al. | 2009
- 1752
-
X‐ray investigation of CdSe nanowiresKurtuluş, Özgül / Li, Zhen / Mews, Alf / Pietsch, Ullrich et al. | 2009
- 1757
-
X‐ray diffraction study of strain and defect structure of nonpolar a‐plane GaN‐layers grown on r‐plane sapphireKyutt, R. N. / Shcheglov, M. P. / Ratnikov, V. V. / Kalmykov, A. E. et al. | 2009
- 1761
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Sensitivity of triple‐crystal X‐ray diffractometers to microdefects in siliconMolodkin, V. B. / Olikhovskii, S. I. / Len, E. G. / Kislovskii, E. N. / Kladko, V. P. / Reshetnyk, O. V. / Vladimirova, T. P. / Sheludchenko, B. V. et al. | 2009
- 1766
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Influence of relaxation of the atomic order in f.c.c.‐Ni–Al alloys on X‐ray diffuse scatteringBokoch, S. M. / Leonov, D. S. / Kulish, M. P. / Tatarenko, V. A. / Kunitsky, Yu. A. et al. | 2009
- 1771
-
High‐resolution three‐dimensional reciprocal space mapping of semiconductor nanostructuresMariager, Simon O. / Schlepütz, Christian M. / Aagesen, Martin / Sørensen, Claus B. / Johnson, Erik / Willmott, Philip R. / Feidenhans'l, Robert et al. | 2009
- 1775
-
Interdiffusion in Ge rich SiGe/Ge multilayers studied by in situ diffractionMeduňa, M. / Caha, O. / Keplinger, M. / Stangl, J. / Bauer, G. / Mussler, G. / Grützmacher, D. et al. | 2009
- 1780
-
Multi‐layer thickness determination using differential‐based enhanced Fourier transforms of X‐ray reflectivity dataPoust, Benjamin / Sandhu, Rajinder / Goorsky, Mark et al. | 2009
- 1785
-
Anisotropy of mosaic structure of GaAsP layers grown on GaAs substratesSaka, T. / Kato, T. / Jin, X. G. / Tanioku, M. / Ujihara, T. / Takeda, Y. / Yamamoto, N. / Nakagawa, Y. / Mano, A. / Okumi, S. et al. | 2009
- 1790
-
X‐ray diffuse scattering effects from Coulomb‐type defects in multilayered structuresOlikhovskii, S. I. / Molodkin, V. B. / Skakunova, E. S. / Kislovskii, E. N. / Fodchuk, I. M. et al. | 2009
- 1795
-
A synchrotron tensile test setup for nanocrystalline thin filmsUlyanenkova, T. / Baumbusch, R. / Filatova, T. / Doyle, S. / Castrup, A. / Gruber, P. A. / Markmann, J. / Weissmüller, J. / Baumbach, T. / Hahn, H. et al. | 2009
- 1799
-
A comprehensive investigation of the structural properties of ferroelectric PbZr0.2Ti0.8O3 thin films grown by PLDWalker, David / Thomas, Pam A. / Collins, Steve P. et al. | 2009
- 1804
-
Structural changes in Si crystals exposed to chemical etching and ion implantationFodchuk, I. / Zaplitnyy, R. / Kazemirskiy, T. / Litvinchuk, I. / Swiatek, Z. et al. | 2009
- 1809
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X‐ray characterization of epi‐Ge/Pr2O3/Si(111) layer stacks by pole figures and reciprocal space mappingZaumseil, Peter / Giussani, Alessandro / Rodenbach, Peter / Schroeder, Thomas et al. | 2009
- 1816
-
Synchrotron topographic studies of growth defects in the core of a SrLaGaO4 single crystalMalinowska, Agnieszka / Lefeld‐Sosnowska, Maria / Wieteska, Krzysztof / Wierzchowski, Wojciech / Härtwig, Jürgen / Graeff, Walter et al. | 2009
- 1820
-
X‐ray section images of dislocations and dislocation barriers in SiNovikov, S. / Fodchuk, I. / Fedortsov, D. / Struk, A. et al. | 2009
- 1825
-
Observation of dislocations in hen egg‐white lysozyme crystals by synchrotron monochromatic‐beam X‐ray topographyMukobayashi, Yu. / Kitajima, Natsuko / Yamamoto, Yu. / Kajiwara, Kentaro / Sugiyama, Hiroshi / Hirano, Keiichi / Kojima, Kenichi / Tachibana, Masaru et al. | 2009
- 1829
-
Spatially resolved strain within a single SiGe island investigated by X‐ray scanning microdiffractionDiaz, Ana / Mocuta, Cristian / Stangl, Julian / Vila‐Comamala, Joan / David, Christian / Metzger, Till H. / Bauer, Günther et al. | 2009
- 1833
-
Elliptical micropipes in SiC revealed by computer simulating phase contrast imagesArgunova, Tatiana / Kohn, Victor / Jung, Ji‐Won / Je, Jung‐Ho et al. | 2009
- 1838
-
Development of visualization method of grain boundaries in stainless steel by using white X‐ray micro‐beam and image detectorKajiwara, Kentaro / Sato, Masugu / Hashimoto, Tamotsu / Hirosawa, Ichiro / Yamada, Takuyo / Terachi, Takumi / Fukumura, Takuya / Arioka, Koji et al. | 2009
- 1842
-
Measurement of the spatial coherence of synchrotron beams using the Talbot effectKluender, Rafael / Masiello, Fabio / van Vaerenbergh, Pierre / Härtwig, Jürgen et al. | 2009
- 1846
-
Fourier transform holography in the context of coherent diffraction imaging with hard X‐raysStadler, Lorenz‐M. / Gutt, Christian / Autenrieth, Tina / Leupold, Olaf / Rehbein, Stefan / Chushkin, Yuriy / Grübel, Gerhard et al. | 2009
- 1850
-
Characterization of phases in an Al casting alloy by synchrotron tomographyTolnai, Domonkos / Degischer, Hans Peter / Lendvai, János et al. | 2009
- 1855
-
Bragg–(Bragg)m–Laue diffraction and its interference fringeHirano, Kenji / Fukamachi, Tomoe / Yoshizawa, Masami / Negishi, Riichirou / Hirano, Keiichi / Kawamura, Takaaki et al. | 2009
- 1860
-
Correctness of a particular solution of inverse problem in rocking curve imagingHuber, Isabella / Mikulík, Petr / Baumbach, Tilo et al. | 2009
- 1865
-
In‐phase and anti‐phase interference fringes in Laue caseNegishi, Riichirou / Fukamachi, Tomoe / Yoshizawa, Masami / Hirano, Kenji / Hirano, Keiichi / Kawamura, Takaaki et al. | 2009
- 1870
-
Integrated intensities in Laue–Bragg cases for non‐absorbing crystals in X‐ray dynamical diffractionSaka, Takashi et al. | 2009
- 1875
-
Reflection of femtosecond pulses from soft X‐ray free‐electron laser by periodical multilayersKsenzov, D. / Grigorian, S. / Hendel, S. / Bienert, F. / Sacher, M. D. / Heinzmann, U. / Pietsch, U. et al. | 2009
- 1880
-
A furnace for coherent beam transmission topography applied to ferroelectric crystalsPernot, Petra / Gorges, Bernard / Vitoux, Hugo / Kluender, Rafael / Masiello, Fabio / Baruchel, José et al. | 2009
- 1885
-
Dislocation nucleation from surface step in silicon: The glide set versus the shuffle setGodet, Julien / Hirel, Pierre / Brochard, Sandrine / Pizzagalli, Laurent et al. | 2009
- 1892
-
Polar AlN/GaN interfaces: Structures and energeticsKioseoglou, J. / Kalesaki, E. / Lymperakis, L. / Dimitrakopulos, G. P. / Komninou, Ph. / Karakostas, Th. et al. | 2009
- 1898
-
Structural changes and peculiarities of NiPdSi formation investigated by Raman and Auger spectroscopyKarabko, Aliaksandra / Dostanko, Anatoly / Kong, JinFang / Shen, Wenzhong et al. | 2009
- 1904
-
In situ analysis of optoelectronic properties of dislocations in ZnO in TEM observationsOhno, Yutaka / Taishi, Toshinori / Yonenaga, Ichiro et al. | 2009
- 1912
-
Gradual degradation of GaAs‐based quantum well lasers, creation of defects, and generation of compressive strainTomm, Jens W. / Ziegler, Mathias / Oudart, Myriam / Nagle, Julien / Jiménez, Juan et al. | 2009
- 1916
-
Helium implantation into 4H‐SiCBarbot, Jean François / Leclerc, Stéphanie / David, Marie‐Laure / Oliviero, Erwan / Montsouka, Romaric / Pailloux, Frederic / Eyidi, Dominique / Denanot, Marie‐Françoise / Beaufort, Marie‐France / Declémy, Alain et al. | 2009
- 1924
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Combined structural and optical studies of stacking faults in 4H‐SiC layers grown by chemical vapour depositionMarinova, Maya / Robert, Teddy / Juillaguet, Sandrine / Tsiaoussis, Ioannis / Frangis, Nikolaos / Polychroniadis, Efstathios / Camassel, Jean / Chassagne, Thierry et al. | 2009
- 1931
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Core models of a‐edge threading dislocations in wurtzite III(Al,Ga,In)‐nitridesKioseoglou, J. / Komninou, Ph. / Karakostas, Th. et al. | 2009
-
Cover Picture (Phys. Status Solidi A 8/2009)Mariager, Simon O. / Schlepütz, Christian M. / Aagesen, Martin / Sørensen, Claus B. / Johnson, Erik / Willmott, Philip R. / Feidenhans'l, Robert et al. | 2009