The Use of Probability Limits of COM–Poisson Charts and their Applications (English)
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- New search for: Lin, Zhengyan
- New search for: Abbasi, Saddam Akber
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- New search for: Saghir, Aamir
- New search for: Lin, Zhengyan
- New search for: Abbasi, Saddam Akber
- New search for: Ahmad, Shabbir
In:
Quality and Reliability Engineering International
;
29
, 5
;
759-770
;
2013
- Article (Journal) / Electronic Resource
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Title:The Use of Probability Limits of COM–Poisson Charts and their Applications
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Contributors:Saghir, Aamir ( author ) / Lin, Zhengyan ( author ) / Abbasi, Saddam Akber ( author ) / Ahmad, Shabbir ( author )
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Published in:Quality and Reliability Engineering International ; 29, 5 ; 759-770
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Publisher:
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Publication date:2013-07-01
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Size:12 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 29, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 619
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Editorial| 2013
- 621
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Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control SystemsNiu, Shiwen / Zhan, Wei et al. | 2013
- 631
-
Statistical Inference on Constant Stress Accelerated Life Tests under Generalized Gamma Lifetime DistributionsFan, Tsai‐Hung / Yu, Chia‐Hsiang et al. | 2013
- 639
-
The Effect of Parameter Estimation on Upper‐sided Bernoulli Cumulative Sum ChartsLee, Jaeheon / Wang, Ning / Xu, Liaosa / Schuh, Anna / Woodall, William H. et al. | 2013
- 653
-
CS‐EWMA Chart for Monitoring Process DispersionAbbas, Nasir / Riaz, Muhammad / Does, Ronald J. M. M. et al. | 2013
- 665
-
A Generalized Likelihood Ratio Chart for Monitoring Bernoulli ProcessesHuang, Wandi / Wang, Sai / Reynolds, Marion R. Jr. et al. | 2013
- 681
-
An Economic Approach to the Management of High‐Quality ProcessesYılmaz, Şebnem / Burnak, Nimetullah et al. | 2013
- 691
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Acquisition and Testing, DT/OT Testing: The Need for Two‐Parameter RequirementsHill, Raymond R. / Gutman, Alex J. / Chambal, Stephen P. / Kitchen, Jerry W. et al. | 2013
- 699
-
Reliability Prediction Based on Variation Mode and Effect AnalysisPavasson, Jonas / Cronholm, Kent / Strand, Henrik / Karlberg, Magnus et al. | 2013
- 709
-
Reliability Modeling for Ultrathin Gate Oxides Subject to Logistic Degradation Processes with Random Onset TimePeng, Hao / Feng, Qianmei et al. | 2013
- 719
-
A Close Form Solution for the Product Acceptance Determination Based on the Popular Index CpkPearn, W. L. / Wu, C. H. et al. | 2013
- 725
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Towards Improved Analysis Methods for Two‐Level Factorial Experiments with Time Series ResponsesVanhatalo, Erik / Bergquist, Bjarne / Vännman, Kerstin et al. | 2013
- 743
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Nonlinear Profile Monitoring of Reflow Process Data Based on the Sum of Sine FunctionsFan, Shu‐Kai S. / Chang, Yuan‐Jung / Aidara, Nafy et al. | 2013
- 759
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The Use of Probability Limits of COM–Poisson Charts and their ApplicationsSaghir, Aamir / Lin, Zhengyan / Abbasi, Saddam Akber / Ahmad, Shabbir et al. | 2013
- 771
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A Response Surface Methodology for Modeling Time Series Response DataStorm, Scott M. / Hill, Raymond R. / Pignatiello, Joseph J. Jr. et al. | 2013