Effect of phosphorus concentration on the electronic structure of nanocrystalline electrodeposited Ni–P alloys: an XPS and XAES investigation (English)
- New search for: Elsener, B.
- New search for: Atzei, D.
- New search for: Krolikowski, A.
- New search for: Rossi, A.
- New search for: Elsener, B.
- New search for: Atzei, D.
- New search for: Krolikowski, A.
- New search for: Rossi, A.
In:
Surface and Interface Analysis
;
40
, 5
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919-926
;
2008
- Article (Journal) / Electronic Resource
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Title:Effect of phosphorus concentration on the electronic structure of nanocrystalline electrodeposited Ni–P alloys: an XPS and XAES investigation
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Contributors:
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Published in:Surface and Interface Analysis ; 40, 5 ; 919-926
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Publisher:
- New search for: John Wiley & Sons, Ltd.
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Publication date:2008-05-01
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Size:8 pages
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ISSN:
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DOI:
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Type of media:Article (Journal)
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Type of material:Electronic Resource
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Language:English
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Keywords:
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Source:
Table of contents – Volume 40, Issue 5
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 893
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Adsorption dynamics and kinetics of CO2 on Fe/FeOx nanoclusters supported on HOPGKadossov, E. / Burghaus, U. et al. | 2008
- 899
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Preparation of glutamine films on silicon substratesGarcia, Irene T. S. / Porto, Fabiane G. da S. / do Amaral, Queila D. F. / Carreño, Neftalí L. V. / Martins, Márcio M. / Wallau, Martin et al. | 2008
- 906
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Compatibilizing effect of functionalized polystyrene blends: a study of morphology, thermal, and mechanical propertiesShabbir, Saima / Zulfiqar, Sonia / Lieberwirth, Ingo / Kausar, Ayesha / Sarwar, Muhammad Ilyas et al. | 2008
- 914
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Film morphology and orientation of N-cyclohexyl-g-aminopropyl polydimethylsiloxaneLi, M. / An, Q. / Huang, L. et al. | 2008
- 914
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Film morphology and orientation of N‐cyclohexyl‐γ‐aminopropyl polydimethylsiloxaneLi, Mingtao / An, Qiufeng / Huang, Lianxian et al. | 2008
- 919
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Effect of phosphorus concentration on the electronic structure of nanocrystalline electrodeposited Ni–P alloys: an XPS and XAES investigationElsener, B. / Atzei, D. / Krolikowski, A. / Rossi, A. et al. | 2008
- 927
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UPS of multilayer nitrogen‐bearing compounds on the Si(100) surfaceBush, B. / Craig, J. H. Jr. / Roos, K. R. / Lozano, J. / Field, K. W. et al. | 2008
- 931
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Nanostructuring at the surface of low‐energy lead‐implanted silicon by electron beam annealingMarkwitz, Andreas / Davy, Perry / Kennedy, John / Baumann, Horst et al. | 2008
- 935
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Structure analysis of SiCGe films grown on SiCLianbi, Li / Zhiming, Chen / Tao, Lin / Hongbin, Pu / Jia, Li / Qingmin, Li et al. | 2008
- 939
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Interfacial characterization of chemical solution‐deposited thin films of PbSe on GaAs(100)Shandalov, Michael / Rozenblat, Avraham / Kedem, Nir / Popovitz‐Biro, Ronit / Golan, Yuval et al. | 2008
- 944
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Kinetics corrosion process of carbon steel in hydrochloric acid in absence and presence of 2‐(cyclohexylaminomercapto) benzothiazolePatru Samide, Adriana / Bibicu, Ion et al. | 2008
- 953
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Short‐circuit diffusion of ultrasonic bonding interfaces in microelectronic packagingLi, Junhui / Han, Lei / Zhong, Jue et al. | 2008
- 958
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Soft X‐ray emission electron microscopy: chemical state microscopy from interface and bulkZimina, A. / Batchelor, D. R. / Eisebitt, S. / Schmeisser, D. / Shulakov, A. / Eberhardt, W. et al. | 2008
- 961
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Effect of carbon fiber surface treatments on the flexural strength and tribological properties of short carbon fiber/polyimide compositesZhang, Xinrui / Pei, Xianqiang / Mu, Bo / Wang, Qihua et al. | 2008
- 966
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Summary of ISO/TC 201 Standard: XXX. ISO 18516: 2006—Surface chemical analysis—Auger electron spectroscopy and X‐ray photoelectron spectroscopy—Determination of lateral resolutionWolstenholme, J. et al. | 2008