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High quality ultrafast transmission electron microscopy using resonant microwave cavities
Free accessArXiv | 2017| -
Study of Surface Damage in Silicon by Irradiation with Focused Rubidium Ions
Free accessArXiv | 2023| -
Dual mode microwave deflection cavities for ultrafast electron microscopy
American Institute of Physics | 2018| -
Study of surface damage in silicon by irradiation with focused rubidium ions using a cold-atom ion source
Free accessAmerican Institute of Physics | 2023| -
Dual mode microwave deflection cavities for ultrafast electron microscopy
Free accessArXiv | 2019| -
Subnanosecond Thomson scattering on a vacuum arc discharge in tin vapor
British Library Online Contents | 2005| -
Time resolved Thomson scattering measurements on a high pressure mercury lamp
British Library Online Contents | 2005| -
Optoelectronic Properties of Expanding Thermal Plasma Deposited Textured Zinc Oxide: Effect of Aluminum Doping
British Library Conference Proceedings | 2006| -
Optoelectronic Properties of Expanding Thermal Plasma Deposited Textured Zinc Oxide: Effect of Aluminum Doping
British Library Online Contents | 2006| -
Subnanosecond Thomson scattering setup for space and time resolved measurements with reduced background signal
National licenceAmerican Institute of Physics | 2005| -
Radicals of Plasma Needle Detected with Fluorescent Probe
British Library Conference Proceedings | 2005| -
Comparison of experimental and simulated extreme ultraviolet spectra of xenon and tin discharges (12 pages)
British Library Online Contents | 2005| -
Thomson Scattering Measurements on a High Pressure Ar Model Lamp
British Library Conference Proceedings | 2003| -
Time-resolved pinhole camera imaging and extreme ultraviolet spectrometry on a hollow cathode discharge in xenon
National licenceAmerican Physical Society | 2003| -
Time-resolved pinhole camera imaging and extreme ultraviolet spectrometry on a hollow cathode discharge in xenon (10 pages)
British Library Online Contents | 2003|
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