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Calibration of Displacement Laser Interferometer Systems for Industrial Metrology
Free accessDOAJ | 2019| -
Achieving traceability and sub-nanometer uncertainty using interferometric techniques
National licenceIOP Institute of Physics | 2008| -
Bandwidth characteristics and comparisons of surface texture measuring instruments
National licenceTOPICAL REVIEWIOP Institute of Physics | 2010| -
METHOD AND APPARATUS FOR MEASURING INNER DIAMETER OF TRANSPARENT TUBE
Free accessEuropean Patent Office | 2019| -
Bandwidth characteristics and comparisons of surface texture measuring instruments
National licenceCORRIGENDUMIOP Institute of Physics | 2010| -
Metrological characteristics for the calibration of surface topography measuring instruments: a review
Free accessTopical ReviewIOP Institute of Physics | 2021| -
IMAGE SEQUENCE AND EVALUATION METHOD AND SYSTEM FOR STRUCTURED ILLUMINATION MICROSCOPY
Free accessEuropean Patent Office | 2015| -
IMAGE SEQUENCE, EVALUATION METHOD AND SYSTEM BY STRUCTURED ILLUMINATION MICROSCOPE METHOD
Free accessEuropean Patent Office | 2015| -
OPTICAL INTERFERENCE MEASUREMENT DEVICE AND OPTICAL INTERFERENCE MEASUREMENT METHOD
Free accessEuropean Patent Office | 2017| -
Design and calibration of a parallel-moving displacement generator for nano-metrology
National licenceIOP Institute of Physics | 1998| -
Viewpoint Planning for Range Sensors Using Feature Cluster Constrained Spaces for Robot Vision Systems
Free accessDOAJ | 2023| -
Optimisation of Imaging Confocal Microscopy for Topography Measurements of Metal Additive Surfaces
Free accessDOAJ | 2023|
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