Did you mean: person:("wang, H.-J.") • person:("mann, H.-J.")
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Improvement of Charge Trapping Characteristics of N~2O-Annealed and Reoxidized N~2O-Annealed Thin Oxides
British Library Online Contents | 1992| -
Performance and Reliability Enhancement for CVD Tungsten Polycided CMOS Transistors Due to Fluorine Incorporation in the Gate Oxide
British Library Online Contents | 1994| -
Hot-Carrier Effects in Thin-Film Fully-Depleted SOI MOSFET's
British Library Online Contents | 1994| -
Interface characterization of fully-depleted SOI MOSFET by a subthreshold I-V method
British Library Conference Proceedings | 1994| -
Tunneling Current Through MIS Structures With Ultra-Thin Insulators
British Library Conference Proceedings | 1996| -
Characterization of Hot-Carrier Effects in Thin-Film, Fully-Depleted, SOI MOSFETs
British Library Conference Proceedings | 1994| -
Suppressing Flash EEPROM Erase Leakage with Negative Gate Bias and LDD Erase Junction
British Library Conference Proceedings | 1993| -
Thermal stability of TiN metal gate prepared by atomic layer deposition or physical vapor deposition on HfO2 high-K dielectric
National licenceAmerican Institute of Physics | 2010| -
Performance and Reliability Enhancement for CVD Tungsten Polycided CMOS Transistors Due to Fluorine Incorportion in the Gate Oxide
Online Contents | 1994|Contributors: Wann, H.-J. -
Physics of base charge dynamics in the three port transistor laser
Online Contents | 2010|Contributors: Wann, H. J.
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