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Bias-tunable electron transport in a magnetic double-barrier nanostructure
Elsevier | 2008|Keywords: 73.40.Gk -
Correlation between morphology and transport properties of composite films
Elsevier | 2007|Keywords: 73.40.Gk -
Correlation between morphology and transport properties of composite films: Charge transport in composites
Elsevier | 2006|Keywords: 73.40.Gk -
Effect of the -doping on the electron transport in an antiparallel double -magnetic-barrier nanostructure
Elsevier | 2009|Keywords: 73.40.Gk -
Electrical characteristics of hole resonant tunneling diodes with high Ge fraction (x>0.4) Si/strained Si1−xGex/Si(100) heterostructure
Elsevier | 2008|Keywords: 73.40.Gk -
Electron field emission properties of carbon nanotubes-deposited flexible film
Elsevier | 2005|Keywords: 73.40.GK -
Electronic transport and tip-loading force effect in self-assembled monolayer studied by conducting atomic force microscopy
Elsevier | 2005|Keywords: 73.40.Gk -
Electron-spin polarization in anti-parallel double -magnetic-barrier nanostructures
Elsevier | 2005|Keywords: 73.40.Gk -
Field emission characteristics of nano-structured carbon films deposited on differently pretreated Mo films
Elsevier | 2008|Keywords: 73.40.Gk -
First-principles calculation of field emission from adsorbed atom on metallic electrode
Elsevier | 2004|Keywords: 73.40,GK -
High resolution STM imaging with oriented single crystalline tips
Elsevier | 2012|Keywords: 73.40.Gk -
Investigating the effects of the interface defects on the gate leakage current in MOSFETs
Elsevier | 2008|Keywords: 73.40.Gk -
Magnetic characterization of MnPt/CoFe bilayers using the MOKE technique
Elsevier | 2008|Keywords: 73.40.Gk -
Mechanism and control of current transport in GaN and AlGaN Schottky barriers for chemical sensor applications
Elsevier | 2007|Keywords: 73.40.Gk -
Numerical analysis of gate leakage current in AlGaN Schottky diodes
Elsevier | 2008|Keywords: 73.40.Gk -
Resonant tunneling in Si–SiGe superlattices on relaxed buffer substrates
Elsevier | 2003|Keywords: 73.40.Gk. -
Surface passivation of III–V semiconductors for future CMOS devices—Past research, present status and key issues for future
Elsevier | 2010|Keywords: 73.40.Gk
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