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Gateway data management method and system for smart city
Free accessEuropean Patent Office | 2023| -
Silicon on insulator (SOI)-based GaN wafer and preparation method thereof
Free accessEuropean Patent Office | 2021| -
Optical Response of Free-Carrier Plasma Effects of MeV Arsenic-Ion-Implanted Silicon
Online Contents | 1994| -
Determination method for defect type in monocrystalline silicon wafer
Free accessEuropean Patent Office | 2023| -
Preparation method of SOI-based p-GaN enhanced GaN power switch device
Free accessEuropean Patent Office | 2020| -
Silicon-based gallium nitride microwave device and preparation method thereof
Free accessEuropean Patent Office | 2020| -
Preparation method of SOI-based concave gate enhanced GaN power switch device
Free accessEuropean Patent Office | 2020| -
Low-leakage-inductance planar transformer winding winding method and planar transformer
Free accessEuropean Patent Office | 2022| -
Preparation of SiC MOSFET based on high-k gate dielectric and low-temperature ohmic contact process
Free accessEuropean Patent Office | 2020| -
Characteristics of carbon nitride films synthesized by single‐source ion beam enhanced deposition system
National licenceAmerican Institute of Physics | 1996| -
Battery management chip circuit on the base of silicon on insulator (SOI) process
Free accessEuropean Patent Office | 2020| -
Controlled direct growth of Al2O3-doped HfO2 films on graphene by H2O-based atomic layer deposition
National licenceRoyal Society of Chemistry | 2015| -
BATTERY MANAGMENT CHIP CIRCUIT ON THE BASE OF SILICON ON INSULATOR (SOI) PROCESS
Free accessEuropean Patent Office | 2019|
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