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SPICE Analysis of the SEU Sensitivity of a Fully Depleted SOI CMOS SRAM Cell
Online Contents | 1994| -
An Examination of High-Injection Physics of Silicon P-N Junctions With Applications in Photocurrent Modeling
British Library Online Contents | 2013| -
Parametric Variability Affecting 45 nm SOI SRAM Single Event Upset Cross-Sections
British Library Online Contents | 2010| -
Multiscale Numerical Models for Simulation of Radiation Events in Semiconductor Devices
British Library Online Contents | 2008| -
Multiscale Numerical Models for Simulation of Radiation Events in Semiconductor Devices
British Library Conference Proceedings | 2008| -
The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies
British Library Online Contents | 2012|
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