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Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
Free accessIOP Institute of Physics | 2008| -
Chromatic Confocal Electron Microscopy with a Finite Pinhole Size
Free accessIOP Institute of Physics | 2012| -
Towards quantitative analysis of core-shell catalyst nano-particles by aberration corrected high angle annular dark field STEM and EDX
Free accessIOP Institute of Physics | 2010| -
Quantitative analysis of core-shell catalyst nanoparticles for industrial applications
Free accessIOP Institute of Physics | 2012| -
Experimental setup for energy-filtered scanning confocal electron microscopy (EFSCEM) in a double aberration-corrected transmission electron microscope
Free accessIOP Institute of Physics | 2010| -
Quantitative techniques for aberration corrected HAADF STEM of nano-materials
Free accessIOP Institute of Physics | 2012| -
Imaging and analysis of axial heterostructured silicon nanowires
Free accessIOP Institute of Physics | 2010| -
Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
Free accessIOP Institute of Physics | 2010| -
Quantification of ADF STEM images of molybdenum chalcogenide nanowires
Free accessIOP Institute of Physics | 2006| -
Imaging and diffraction characterisation of 2D inorganic nanostructures
Free accessIOP Institute of Physics | 2012| -
Orientational and translational ordering of sub-monolayer films of passivated multiply-twinned gold clusters
National licenceIOP Institute of Physics | 2000| -
(S)TEM analysis of the interdiffusion and barrier layer formation in Mn/Cu heterostructures on SiO2 for interconnect technologies
Free accessIOP Institute of Physics | 2012|
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