Year of publication
Type of material
Licence
TIB reading rooms collection
LUH institutes collection
Synonyms were used for: REM
Search without synonyms: keywords:("REM")
Used synonyms:
- rasterelektronenmikroskop
- scanning electron microscopes
- sem
-
Shear force microscopy using piezoresistive cantilevers in surface metrology [9236-10]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
A tale of three trials: from science to junk science [9236-44]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Nanoscale imaging by micro-cavity scanning microscopy [9236-37]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
On the limits of miniature electron column technology [9236-12]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Does your SEM really tell the truth? How would you know? part 3: vibration and drift [9236-4]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
3D Monte Carlo modeling of the SEM: Are there applications to photomask metrology? (Invited Paper) [9236-1]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Scanning microscopies 2014 : 16 - 18 September 2014, Monterey, California, United States ; [including the "Microscopy for STEM Educators" Workshop]
TIBKAT | 2014|Keywords: Scanning electron microscopes -
Project NANO (nanoscience and nanotechnology outreach): a STEM training program that brings SEM's and stereoscopes into high-school and middle-school classrooms [9236-54]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
High throughput data acquisition with a multi-beam SEM [9236-11]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Investigations on CMOS photodiodes using scanning electron microscopy with electron beam induced current measurements [9236-7]
British Library Conference Proceedings | 2014|Keywords: Scanning electron microscopes -
Scanning microscopies 2013: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 30 April - 1 May 2013, Baltimore, Maryland, United States ; [part of SPIE defense, security + sensing]
TIBKAT | 2013|Keywords: Scanning electron microscopes -
Scanning microscopies 2012: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 24 - 26 April 2012, Baltimore, Maryland, United States ; [the Scanning Microscopies: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences Conference ... merged with the SPIE Defense, Security and Sensing (DSS 2012) Conference]
TIBKAT | 2012|Keywords: Scanning electron microscopes -
Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences : 26 - 28 April 2011, Orlando, Florida, United States ; [the Scanning Microscopies: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences Meeting joined the SPIE Defense, Security and Sensing (DSS 2011) Conference]
TIBKAT | 2011|Keywords: Scanning electron microscopes -
Scanning microscopy 2010 : 17 - 19 May 2010, Monterey, California, United States ; [... the second of the SPIE Scanning Microscopy Symposia series]
TIBKAT | 2010|Keywords: Scanning electron microscopes -
Development, theory and application of the reflection confocal scanning infra-red microscope
Free accessBASE | 2016|Keywords: Scanning electron microscopes -
Detektory elektronów w elektronowych mikroskopach skaningowych wysokopróżniowych
TIBKAT | 2010|Keywords: Scanning electron microscopes -
Stability analyses of submicron-boron mineral prepared by mechanical milling process in concrete roads
Online Contents | 2016|Keywords: Scanning electron microscopes -
Influence of technological and environmental factors on the behaviour of the reinforcement anchorage zone of prestressed concrete sleepers
Online Contents | 2016|Keywords: Scanning electron microscopes -
On the Reliability of Automated Analysis of Fracture Surfaces Using a Novel Computer Vision‐Based Tool
Wiley | 2023|Keywords: scanning electron microscopes -
Comparison of the Wear Properties of Polymer Composites Having CNT With and Without Glass Fiber Reinforcement
Online Contents | 2015|Keywords: Scanning electron microscopes
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