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Methods of optical device fabrication using an electron beam apparatus
Free accessEuropean Patent Office | 2022| -
USE OF ELECTRON BEAM SCANNING ELECTRON MICROSCOPY FOR CHARACTERIZATION OF A SIDEWALL OCCLUDED FROM LINE-OF-SIGHT OF THE ELECTRON BEAM
Free accessEuropean Patent Office | 2021| -
Multi charged particle beam writing method, and multi charged particle beam writing apparatus
Free accessEuropean Patent Office | 2016| -
Ion beam source for optical device fabrication using a segmented ion source having one or more angled surfaces
Free accessEuropean Patent Office | 2023| -
ADJUSTING METHOD OF CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE SYSTEM
Free accessEuropean Patent Office | 2020| -
FOLD OVER EMITTER AND COLLECTOR FIELD EMISSION TRANSISTOR
Free accessEuropean Patent Office | 2019| -
Innovative imaging technique in transmission charged particle microscopy
Free accessEuropean Patent Office | 2020| -
Package Comprising an Ion-Trap and Method of Fabrication
Free accessEuropean Patent Office | 2020| -
AUTOMATIC GENERATION OF LABELED IMAGE FROM PRIMARY MICROSCOPE DETECTOR USING IMAGE FROM SECONDARY MICROSCOPE DETECTOR
Free accessEuropean Patent Office | 2020| -
Charged particle beam device and image processing method in charged particle beam device
Free accessEuropean Patent Office | 2020| -
Package comprising an ion-trap and method of fabrication
Free accessEuropean Patent Office | 2020| -
Apparatus for Trapping Ion without Exposure of Dielectric Layer and Method for Fabricating the Same
Free accessEuropean Patent Office | 2017 -
X-ray tube having planar emitter with tunable emission characteristics
Free accessEuropean Patent Office | 2017| -
Package Comprising an Ion-Trap and Method of Fabrication
Free accessEuropean Patent Office | 2019|
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