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Synonyms were used for: dielektrische Schicht
Search without synonyms: keywords:("dielektrische Schicht")
Used synonyms:
- dielectric films
- dielectric layers
- dielectric thin films
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Challenges in Interface Trap Characterization of Deep Sub-Micron MOS Devices Using Charge Pumping Techniques
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Deposition and Characterization of Ultrathin Ta~2O~5 Layers Deposited on Silicon From a Ta(OC~2H~5)~5 Precursor
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Characterization of the P~b~1 Interface Defect in Thermal (100)Si/SiO~2 by Electron Spin Resonance: ^2^9Si Hyperfine Structure and Electrical Relevance
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Multi-Million Atom Molecular-Dynamics Simulations of Stresses in Si(111)/Si~3N~4 Nanopixels
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Measurement Technique, Oxide Thickness and Area Dependence of Soft-Breakdown
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Room Temperature Ultraviolet Photoluminescence from 800^oC Thermally Oxidized Si~1~-~x~-~yGe~xC~y Thin Films on Si(100) Substrate
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Evaluation of the Degradation Dynamics of Thin Silicon Dioxide Films Using Model-Independent Procedures
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Dielectric Properties of Bi~2Ti~2O~7 Thin Films With (111) Orientation
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
A Study of Trap Profiles in Thin Silicon Dioxide Films at Dielectric Breakdown Using Percolation Model
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films -
Analysis of MOS Device Capacitance-Voltage Characteristics Based on the Self-Consistent Solution of the Schrodinger and Poisson Equations
British Library Conference Proceedings | 2000|Keywords: ultrathin dielectric films, dielectric films
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