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Structure and conditions for the formation of fullerite crystallites in Sn-C60 films
Springer Verlag | 2009|Keywords: 61.10.Kw -
Water penetration mechanisms in nuclear glasses by X-ray and neutron reflectometry
Elsevier | 2007|Keywords: 61.10.Kw -
Spontaneous growth of single crystals of various shapes in tin-fullerite films
Springer Verlag | 2006|Keywords: 61.10. Kw -
Physicochemical investigation into the specific features of the phase transformations in electrodeposited nanocrystalline oxotungstate films
Springer Verlag | 2006|Keywords: 61.10.Kw -
Supported membranes on polyelectrolyte layers studied by X‐ray reflectometry
Wiley | 2006|Keywords: 61.10.Kw -
New possibilities for determination of solids surface parameters by X‐ray reflectivity
Wiley | 2007|Keywords: 61.10.Kw -
Characterization of the GaN‐rich side of GaNP grown by metal‐organic chemical vapor deposition
Wiley | 2003|Keywords: 61.10.Kw -
TEM characterization of La/B4C multilayer systems by the geometric phase method
Wiley | 2005|Keywords: 61.10.Kw -
Properties of cubic GaN films obtained by nitridation of porous GaAs(001)
Wiley | 2005|Keywords: 61.10.Kw -
Ordering in undoped hexagonal AlxGa1–xN grown on sapphire (0001) with 0.09 < x < 0.247
Wiley | 2003|Keywords: 61.10.Kw -
Adsorption–desorption isotherms of nanoporous thin films measured by X-ray reflectometry
Elsevier | 2005|Keywords: 61.10.Kw -
Difference method for solution of the inverse problem of reflectometry of multilayer films
Springer Verlag | 2006|Keywords: 61.10.Kw -
Non-destructive surface characterization of float glass: X-ray reflectivity and grazing incidence X-ray fluorescence analysis
Elsevier | 2004|Keywords: 61.10.Kw -
Application of X-ray scattering technique to the study of supersmooth surfaces
Elsevier | 2004|Keywords: 61.10.Kw -
Thickness determination for SiO2 films on Si by X-ray reflectometry at the Si K edge
Elsevier | 2003|Keywords: 61.10.Kw -
Investigation of the annealing effects on the structural and optical properties of sputtered ZnO thin films
Elsevier | 2005|Keywords: 61.10.Kw -
Dispersion of fullerenes in phospholipid bilayers and the subsequent phase changes in the host bilayers
Elsevier | 2004|Keywords: 61.10.Kw -
Investigation of interface roughness and roughness correlation in solid-state multilayer by coplanar diffuse X-ray scattering
Elsevier | 2003|Keywords: 61.10.kw
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