Year of publication
Type of material
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TIB reading rooms collection
Synonyms were used for: SIMS
Search without synonyms: keywords:("SIMS")
Used synonyms:
- gesims
- imma
- ionenstrahlmikroanalyse
- isma
- secondary ion mass spectrometry
- sekundarionen massenspektrometrie
-
In-house synthesized poly(ether ether ketone) ionenes. I. ToF-SIMS spectra in the positive ion mode
Free accessAmerican Institute of Physics | 2024|Keywords: Secondary Ion Mass Spectrometry (SIMS) -
Mixed-cation, mixed-halide perovskite ToF-SIMS spectra
American Institute of Physics | 2024|Keywords: Secondary Ion Mass Spectrometry (SIMS) -
ToF-SIMS spectra of historical inorganic pigments: Lead-based pigments in positive polarity
Free accessAmerican Institute of Physics | 2024|Keywords: Secondary Ion Mass Spectrometry (SIMS) -
Kupferoxid-Modellsysteme zur Untersuchung von perkolations-basierter H2S-Detektion
TIBKAT | 2018|Keywords: Sekundärionen-Massenspektrometrie -
Toward accurate composition analysis of GaN and AlGaN using atom probe tomography
Free accessAmerican Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Chemical and oxygen isotope composition of gem-quality apatites: Implications for oxygen isotope reference materials for secondary ion mass spectrometry (SIMS)
Elsevier | 2016|Keywords: Secondary ion mass spectrometry -
Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction
Free accessAmerican Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Multitechnique elemental depth profiling of InAlGaN and InAlN films
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Localisation of iron in wheat grain using high resolution secondary ion mass spectrometry
Elsevier | 2011|Keywords: Secondary ion mass spectrometry -
Latest improvements in isotopic uranium particle analysis by large geometry–secondary ion mass spectrometry for nuclear safeguards purposes
Free accessAmerican Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Effect of kinetic energy and impact angle on carbon ejection from a free-standing graphene bombarded by kilo-electron-volt C60
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Relationships between crater and sputtered material characteristics in large gas cluster sputtering of polymers: Results from molecular dynamics simulations
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Accurate and reproducible in-depth observation of organic–inorganic hybrid materials using FIB-TOF-SIMS
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Critical need and future directions of SIMS depth profiling in CMOS fabrication
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Dynamic SIMS for materials analysis in nuclear science
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Molecular ionization probability in cluster-SIMS
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
The Practice of TOF-SIMS : time of flight secondary ion mass spectrometry
TIBKAT | 2016|Keywords: Sekundärionen-Massenspektrometrie -
Visualizing ion transport mechanisms through oxide scales grown on mixed nickel- and cobalt-base model alloys at 900 °C using FIB-SIMS techniques
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Improvement in detection limit for time-of-flight SIMS analysis of dopants in GaN structures
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS) -
Matrix and element dependences of useful yield in Si and SiO2 matrices using laser-ionization sputtered neutral mass spectrometry
American Institute of Physics | 2018|Keywords: Special Issue on Secondary Ion Mass Spectrometry (SIMS)
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