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Synonyms were used for: Optimization
Search without synonyms: keywords:(Optimization)
Used synonyms:
- improvement technique
- optimieren
- optimierung
- optimisation
- verbesserung
- verbesserungstechnik
-
Motion-compensated transform coding of video using adaptive displacement fields
SPIE | 1998|Keywords: Lagrangian optimization algorithm -
Optimum mask and source patterns to print a given shape
SPIE | 2002|Keywords: source optimization, global optimization -
Optimization of multilayer reflectors for extreme ultraviolet lithography
SPIE | 2004|Keywords: optimization -
Optimization of sub-100-nm designs for mask cost reduction
SPIE | 2004|Keywords: design optimization -
Low-stress ultra-thick SU-8 UV photolithography process for MEMS
SPIE | 2005|Keywords: process optimization -
Extending aggressive low-k1 design rule requirements for 90 and 65 nm nodes via simultaneous optimization of numerical aperture, illumination and optical proximity correction
SPIE | 2005|Keywords: NA–illumination–OPC optimization -
General framework for parameter optimization in imaging interferometric lithography
SPIE | 2005|Keywords: optimization -
Fast pixel-based mask optimization for inverse lithography
SPIE | 2006|Keywords: illuminator optimization -
Direct optimization approach for lithographic process conditions
SPIE | 2007|Keywords: automatic optimization -
Adaptive scanning optical microscope: large field of view and high-resolution imaging using a MEMS deformable mirror
SPIE | 2008|Keywords: optimization -
Efficient simulation and optimization of wafer topographies in double patterning
SPIE | 2009|Keywords: waferstack optimization -
Analytical optimization of high-transmission attenuated phase-shifting reticles
SPIE | 2009|Keywords: optimization -
Experimental verification of source-mask optimization and freeform illumination for 22-nm node static random access memory cells
SPIE | 2011|Keywords: source mask co-optimization, FlexRay, source mask optimization -
Accurate layer thickness control and planarization for multilayer SU-8 structures
SPIE | 2011|Keywords: process optimization -
Toward 22 nm: fast and effective intrafield monitoring and optimization of process windows and critical dimension uniformity
SPIE | 2011|Keywords: optimization -
Parametric constraints in multi-beam interference
SPIE | 2012|Keywords: parametric constraints, optimization
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