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Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs
Online Contents | 2015| -
Radiation Issues in the New Generation of High Energy Physics Experiments
British Library Online Contents | 2004| -
When a parent has cancer: How does it impact on children's psychosocial functioning? A systematic review
British Library Online Contents | 2018| -
Noise Contribution of the Body Resistance in Partially-Depleted SOI MOSFET's
Online Contents | 1998| -
Radiation-Induced Edge Effects in Deep Submicron CMOS Transistors
British Library Online Contents | 2005| -
Radiation-Induced Edge Effects in Deep Submicron CMOS Transistors
British Library Conference Proceedings | 2005| -
Computational method to estimate Single Event Upset rates in an accelerator environment
British Library Online Contents | 2000| -
Impact of NBTI Aging on the Single-Event Upset of SRAM Cells
British Library Online Contents | 2010| -
Single Event Gate Rupture in 130-nm CMOS Transistor Arrays Subjected to X-Ray Irradiation
British Library Online Contents | 2010| -
Single Event Gate Rupture in 130-nm CMOS Transistor Arrays Subjected to X-Ray Irradiation
British Library Conference Proceedings | 2010| -
Radiation-Induced Short Channel (RISCE) and Narrow Channel (RINCE) Effects in 65 and 130 nm MOSFETs
British Library Online Contents | 2015|
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