Year of publication
Type of material
Licence
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LUH institutes collection
Synonyms were used for: REM
Search without synonyms: keywords:("REM")
Used synonyms:
- rasterelektronenmikroskop
- scanning electron microscopes
- sem
-
Extension of the gravity center method for diameter calibration of polystyrene standard particles with a metrological AFM [8378-18]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Monte Carlo study of the influence of electron beam focusing to SEM linewidth measurement [8729-19]
British Library Conference Proceedings | 2013|Keywords: Scanning electron microscopes -
Electron microscopy and forensic practice (Invited Paper) [8729-3]
British Library Conference Proceedings | 2013|Keywords: Scanning electron microscopes -
Thermal Property Imaging of Aluminum Nitride Composites
Online Contents | 2015|Keywords: Scanning electron microscopes -
Hierarchical Superhydrophobic Copper for Sustained Dropwise Condensation
Online Contents | 2015|Keywords: Scanning electron microscopes -
Response of electrospun CNT composites to irradiation [8378-42]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Progress on CD-AFM tip width calibration standards (Invited Paper) [8378-10]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Conference Committee
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Image processing with Maple for simplified analysis in scanning microscopy [8378-23]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Hybrid metrology for critical dimension based on scanning methods for IC manufacturing [8378-15]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Integrating research and advanced microscopy into the high school curriculum (Invited Paper) [8378-38]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Forensic practice in the field of protection of cultural heritage (Invited Paper) [8378-35]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Deformation of polystyrene nanoparticles under different AFM tapping loads [8378-16]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS) (Invited Paper) [8378-02]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Introduction to Special Session on Microscopy for Science, Technology, Engineering and Math (STEM) Educators
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Robust probes for high resolution chemical detection and imaging [8378-40]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Nanomanipulation system for scanning electron microscope (Invited Paper) [8378-24]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes -
Numerical simulation using in the preparation process of micron‐sized silica–aluminium composite powders by high‐energy alloying: Building visualisation and guiding preparation
Free accessWiley | 2023|Keywords: scanning electron microscopes -
Advances in high-speed low-latency communications for nanopositioning in advanced microscopy [8378-28]
British Library Conference Proceedings | 2012|Keywords: Scanning electron microscopes
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