Year of publication
Type of media
Source
Type of material
Licence
Language
1–20 of 44 hits
Sort by:
Sort by:
-
Passivation Layer Charge-Induced Failure Mechanisms in 0.5 m CMOS Technology
British Library Conference Proceedings | 1992| -
Characterization of Plasma-Enhanced Chemical Vapor Deposited Nitride Films Used in Very Large Scale Integrated Applications
British Library Online Contents | 1993| -
Passivation Effects on the Stress Migration and Electromigration Performance of Ti-AlCu-TiN Metallurgy
British Library Conference Proceedings | 1995| -
Plasma‐induced gate‐oxide charging issues for sub‐0.5 μm complementary metal–oxide–semiconductor technologies
American Institute of Physics | 1995| -
Deposition of textured yttria‐stabilized ZrO2 films on oxidized silicon
National licenceAmerican Institute of Physics | 1991| -
0.13mum Generation Integration of Dual Damascene Copper in SiLK and FSG
British Library Conference Proceedings | 2002| -
On‐axis sputter deposition of superconducting YBa2Cu3O7‐δ on Si(100)
American Institute of Physics | 1991| -
Single target sputtering of superconducting YBa2Cu3O7−δ thin films on Si (100)
National licenceAmerican Institute of Physics | 1989| -
Integrated W Policide Tool for Advanced DRAM Manufacturing
British Library Conference Proceedings | 1995| -
Critical Reliability Issues for sub-0.25-micron Generation Copper Wiring
British Library Conference Proceedings | 2000| -
Hysteresis model for polycrystalline high‐Tc superconductors
National licenceAmerican Institute of Physics | 1988| -
Low‐field structure in the magnetization of polycrystalline YBa2Cu3O7−x and ErBa2Cu3O7−x
National licenceAmerican Institute of Physics | 1988| -
Advanced Low-Temperature TEOS Oxide Gap Fill Processes for Sub-0.5m DRAM Technologies
British Library Conference Proceedings | 1993| -
Plasma-induced gate-oxide charging issues for sub-0.5 m complementary metal-oxide-semiconductor technologies
British Library Online Contents | 1995| -
Electromigration Reliability Study of Submicron Cu Interconnections
British Library Conference Proceedings | 2000| -
Dual Gate Oxide Charging Damage in Damascene Copper Technologies
British Library Conference Proceedings | 2000| -
Advanced Intermetal Dielectric Gapfill Process for High Aspect Ratio CMOS Technologies
British Library Conference Proceedings | 1996| -
Integration of HDPCVD FSG for 0.25-micron CMOS Technology
British Library Conference Proceedings | 1998|
Send my search to (beta)
Send your search query (search terms without filters) to other databases, portals and catalogues to find more interesting hits.
Dimensions:
full data search
or
title and abstract search
Dimensions is a database for abstracts and citations that links information on research funding with the resulting publications, studies and patents.
TIB AV portal
In the TIB AV-Portal, audiovisual media from science and teaching can be foundand own scientific videos can be published.
Specialised Information Service for Mobility and Transport Research (FID move)
Open Research Knowledge Graph (ORKG)
The FID move can be used to search for subject-specific literature, research data and other information from mobility and transport research.
The Open Research Knowledge Graph provides structured descriptions of research content and makes it comparable.
Common Union Catalogue (GVK)
Freely accessible part of the collaborative K10plus catalogue with materials relevant for interlibrary loan and direct delivery services.