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Study and realization of a trap pyroelectric detector for absolute high radiant powers and energies
Tema Archive | 2004|Keywords: Trap (Haftstelle) -
Unification of trap-limited electron transport in semiconducting polymers
Tema Archive | 2012|Keywords: Trap (Haftstelle) -
New insights of BTI degradation in MOSFETs with SiON gate dielectrics
Tema Archive | 2009|Keywords: Trap (Haftstelle) -
Photoelectrical response in single-layer graphene transistors
Tema Archive | 2009|Keywords: Trap (Haftstelle) -
Growth and in-line characterization of silicon nanodots integrated in discrete charge trapping non-volatile memories
Tema Archive | 2011|Keywords: Trap (Haftstelle) -
Bose-Einstein condensation on a microelectronic chip
Tema Archive | 2001|Keywords: Trap (Haftstelle) -
Trapping centers and their distribution in Tl2InGaSe4 single crystals by thermally stimulated luminescence
Tema Archive | 2014|Keywords: Trap (Haftstelle) -
Probability density tomography of microcavity polaritons confined in cylindrical traps of various sizes
Tema Archive | 2010|Keywords: Trap (Haftstelle) -
Trap levels in Eu-doped SrAl2O4 phosphor crystals co-doped with rare-earth elements
Tema Archive | 2006|Keywords: Trap (Haftstelle) -
Interfacial trap density-of-states in pentacene- and ZnO-based thin-film transistors measured via novel photo-excited charge-collection spectroscopy
Tema Archive | 2010|Keywords: Trap (Haftstelle) -
Characteristics of integrated magneto-optical traps for atom chips
Tema Archive | 2011|Keywords: Trap (Haftstelle) -
Low-temperature hysteresis in the field effect of bilayer graphene
Tema Archive | 2011|Keywords: Trap (Haftstelle) -
A comprehensive model for PMOS NBTI degradation: Recent progress
Tema Archive | 2007|Keywords: Trap (Haftstelle) -
Effect of x-ray irradiation on the electrical characteristics of ultra-thin gate oxides
Tema Archive | 1999|Keywords: Trap (Haftstelle) -
Performance and reliability improvement of flash device by a novel programming method
Tema Archive | 2007|Keywords: Trap (Haftstelle) -
Nitrogen incorporation in Al2O3 thin films prepared by pulsed ultrasonic sprayed pyrolysis
Tema Archive | 2009|Keywords: Trap (Haftstelle)
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