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Simulation of electron trajectories in the 3D field of two coupled hemispherical electrostatic deflectors
British Library Conference Proceedings | 2000| -
Investigation of an EuS-coated cooled field emitter for application in state on the art electron microscopes
British Library Conference Proceedings | 2000| -
Magneto-optical linear dichroism in threshold photoemission electron microscopy of a polycrystalline Fe-film
British Library Conference Proceedings | 2000| -
Spectral distribution of backscattered electrons of charged insulators
British Library Conference Proceedings | 2000| -
Conditions of study of electrode masses structures in environmental scanning electron microscope
British Library Conference Proceedings | 2000| -
Electron ray-tracing for numerical determination of aberrations
British Library Conference Proceedings | 2000| -
Towards more quantitative results from three dimensional electron microscopy of macromolecules
British Library Conference Proceedings | 2000| -
Photoemission electron microscopy with high chemical and magnetic sensitivity
British Library Conference Proceedings | 2000| -
Electron energy-loss near-edge structures of silicon and silicon carbide
British Library Conference Proceedings | 2000| -
Application of EFTEM for cross-sectional on-product characterization of semiconductor devices
British Library Conference Proceedings | 2000| -
Application of low-energy backscattered electron detection in the inspection of semiconductor devices technology
British Library Conference Proceedings | 2000| -
A new method for the determination of the wave aberration function
British Library Conference Proceedings | 2000| -
Quantitative measurement of intensity profiles of equal thickness fringes of Si and MgO crystals and estimation of crystal potential
British Library Conference Proceedings | 2000|
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