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Ion beams as a tool for the characterization of near-pseudomorphic CdZnO epilayers (Invited Paper) [8263-28]
British Library Conference Proceedings | 2012| -
Effects of Gd2O3 Gate Dielectric on Proton-Irradiated AlGaN/GaN HEMTs
British Library Online Contents | 2017| -
Tuning the surface morphology in self-organized ion beam nanopatterning of Si(001) via metal incorporation: from holes to dots
British Library Online Contents | 2008| -
On the origin of strain relaxation in epitaxial CdZnO layers (Invited Paper) [8626-22]
British Library Conference Proceedings | 2013| -
Aluminium incorporation in AlxGa1−xN/GaN heterostructures: A comparative study by ion beam analysis and X-ray diffraction
British Library Online Contents | 2008| -
Effects of Gd2O3 Gate Dielectric on Proton-Irradiated AlGaN/GaN HEMTs
Online Contents | 2017|Contributors: Redondo-Cubero, A
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