Year of publication
Type of media
Source
Type of material
Licence
Language
Synonyms were used for: Rauigkeit
Search without synonyms: keywords:(Rauigkeit)
Used synonyms:
- coarseness
- glattheit
- oberflachenrauheit
- oberflachenrauhigkeit
- oberflachenrauigkeit
- rauheit
- rauhigkeit
- roughness
- ruggedness
- surface roughness
-
Surface roughness and scattering : summaries of papers presented at the Surface Roughness and Scattering Topical Meeting, June 1 - 3, 1992, Tucson, Arizona
TIBKAT | 1992|Keywords: Surface roughness -
Scattering and surface roughness III : 1 - 2 August 2000, San Diego, USA
TIBKAT | 2000|Keywords: Surface roughness -
Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays II : 29 - 30 January 1998, San Jose, California
TIBKAT | 1998|Keywords: Surface roughness -
Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays : 8-9 August 1996, Denver, Colorado
TIBKAT | 1996|Keywords: Surface roughness -
Reflection, scattering, and diffraction from surfaces : 11 - 12 August 2008, San Diego, California, USA
TIBKAT | 2008|Keywords: Surface roughness -
Measurement and effects of surface defects and quality of polish : January 21 - 22, 1985, Los Angeles, California
TIBKAT | 1985|Keywords: Surface roughness -
Modern analysis of scattering phenomena : proceedings from the international workshop held at Domaine de Tournon, Aix en Provence, France, 5 - 8 September 1990
TIBKAT | 1991|Keywords: Surface roughness -
XIV. Internationales Oberflächenkolloquium : 30.01.-01.02.2017 an der Technischen Universität Chemnitz : Tagungsband
TIBKAT | 2017|Keywords: Rauigkeit -
Automatische Analyse holografischer Interferogramme fuer die zerstoerungsfreie Pruefung
Tema Archive | 1979|Keywords: RAUHEIT -
The 12th international conference on thermal spraying. Vol. 1, Section B: Applications. London, UK, 4-9 June 1989
Tema Archive | 1989Keywords: RAUIGKEIT -
Proceedings of SPIE. ECO 1. Surface measurement and characterization, Hamburg, D, 19-21 September 1988
Tema Archive | 1989Keywords: RAUIGKEIT -
Proceedings of SPIE. X-ray multilayers for diffratometers, monochromators, and spectrometers, San Diego, USA, 17-19 August, 1988
Tema Archive | 1988Keywords: RAUIGKEIT -
Gaseous dielectrics, proceedings of the international symposium on gaseous dielectrics, Knoxville, Tennessee, USA, March 6-8, 1978
Tema Archive | 1978Keywords: RAUIGKEIT -
Proceedings of SPIE. Surface characterization and testing 2 (röm.), San Diego, USA, 10-11 August 1989
Tema Archive | 1989Keywords: RAUIGKEIT
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