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A Model Relating Wearout and Breakdown in Thin Silicon Oxide Films
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Die's Layer Deprocessing of Decapsulated Package for Advanced CMOS Devices by Using Reactive Ion Etching Technique
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Failure Analysis and Mechanistic Study of an Interlead Leakage Problem
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Packaging Failure Analysis of Multilayer Molded Plastic Quad Flatpack
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Simulation Tool for Studying Specimen Charging in the Scanning Electron Microscope
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
A Time-of-Flight Spectrometer for the Electron-Beam Testing of Micro-Chips
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Polyimide Surface Characteristics for Adhesion Strength at the Interface Between Polyimide and Mold Resin
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Effectors of High Temperature Reliability in Epoxy Encapsulated Devices
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Faulty Chip Location Based on Board Design Specification Analysis
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Electro-Thermomigration Failures Due to ESD in CMOS IC's
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Structural Considerations for the Design of Integrated Circuits
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Complexity Models of ASIC and Memory Product Technologies: How to Compute and to Apply in Failure Analysis Environment
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Detrimental Impact of Moisture on AL-MG Wirebond in Plastic Packages and the Preventions
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Reliability of Die Bond Joint for Power IC Devices
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Case Study of Timing Defect for CMOS VLSI Device
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Failure Analysis of Integrated Circuits Using Electron Beam and Focused Ion Beam Techniques
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Observations of EBIC Contrast of Unconnected Junctions
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
The Advantages of Using Capacitively Coupled Electron Beam Induced Current on Schottky Diode in Analyzing Semiconductor Defects and Their Implications on MOS Structures
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
Construction Analysis of DRAM by Atomic Force Microscopy: A New Approach (Invited Paper)
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y. -
RIE Grassless Etch Process for Failure Analysis Applications
British Library Conference Proceedings | 1993|Contributors: Khim, S. Y.
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