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Corrosion Mechanisms in Microelectronic Devices
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Plastic Mold Decapsulation Study by Solder Dipping
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Investigating the Behavior of Power Transistors in Intermittent Operation
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Optimum Process Route for Highly Reliable VLSI Plastic Encapsulated Devices
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Field and Fluence Dependence of Interface Trap and Surface Charge Generation During Thin Oxide Wearout
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Integrated Circuit Fault Imaging With SEM Voltage Contrast
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Influence of Epitaxy on the Au-Si Eutectic Bonding
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
A New Physical Analysis Method for Defect Detection in the Thin Insulator Film of MOS Structures
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
The Influence of Microcircuit Integration on ESD Performance
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Defect Analysis Of VLSI Dynamic Memories (Invited Paper)
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Effective Detection of Defects in Complex CMOS Devices Using its Power Down Feature
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Experimental Study of Voltage Acceleration on Ionic Contamination
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Failure Diagnostics by Acoustic Microscope in Microelectronic Components
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Applications of Advanced E-Beam Probing Techniques in Failure Analysis of VLSI Devices
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Die Cracking in Ceramic Packaging - A New Failure Mechanism
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Statistical Experimental Design and Multivariate Analysis for Kinetic Studies in Electromigration
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
SEM Cathodoluminescence for Failure Analysis of Optoelectronic Devices
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
A New Environmental Contamination Mechanism of Boron in Wafer Fabrication Process
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Analysis of Junction Spiking and its Induced Latch-up in NMOS by Emission Microscopy (Invited Paper)
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y. -
Reconfiguration Techniques for Memory Chip Repair
British Library Conference Proceedings | 1989|Contributors: Khim, S. Y.
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