Secondary extinction in textured films (English)
- New search for: Yamakov, V.
- New search for: Tomov, I.
- New search for: Yamakov, V.
- New search for: Tomov, I.
In:
JOURNAL OF APPLIED CRYSTALLOGRAPHY
;
32
, 2
;
300-308
;
1999
-
ISSN:
- Article (Journal) / Print
-
Title:Secondary extinction in textured films
-
Contributors:Yamakov, V. ( author ) / Tomov, I. ( author )
-
Published in:JOURNAL OF APPLIED CRYSTALLOGRAPHY ; 32, 2 ; 300-308
-
Publisher:
- New search for: MUNKSGAARD - SUBSCRIPTION SERVICE
-
Publication date:1999-01-01
-
Size:9 pages
-
ISSN:
-
Type of media:Article (Journal)
-
Type of material:Print
-
Language:English
- New search for: 548
- Further information on Dewey Decimal Classification
-
Classification:
DDC: 548 -
Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 32, Issue 2
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 143
-
Influence of miscut on crystal truncation rod scatteringMunkholm, A. / Brennan, S. et al. | 1999
- 143
-
RESEARCH PAPERS - Influence of miscut on crystal truncation rod scatteringMunkholm, A. et al. | 1999
- 154
-
RESEARCH PAPERS - White-beam topography of Rayleigh waves: A numerical studyMocella, V. et al. | 1999
- 154
-
White-beam topography of Rayleigh waves: a numerical studyMocella, V. / Epelboin, Y. et al. | 1999
- 160
-
RESEARCH PAPERS - Polycapillary X-ray optics for microdiffractionMacDonald, C.A. et al. | 1999
- 160
-
Polycapillary X-ray optics for microdiffractionMacDonald, C. A. / Owens, S. M. / Gibson, W. M. et al. | 1999
- 168
-
A new Cu Ka~2-elimination algorithmDong, C. / Chen, H. / Wu, F. et al. | 1999
- 168
-
RESEARCH PAPERS - A new Cu Ka2-elimination algorithmDong, C. et al. | 1999
- 168
-
A new Cu Kα2-elimination algorithmDong, C. / Chen, H. / Wu, F. et al. | 1999
- 174
-
RESEARCH PAPERS - Effect of pressure on phase transitions in K1-xNaxMnF3 (x| 1999
- 174
-
Effect of pressure on phase transitions in K~1~-~xNa~xF~3 (x = 0.04)Aasbrink, S. / Waskowska, A. / Krane, H. G. / Gerward, L. / Olsen, J. S. et al. | 1999
- 174
-
Effect of pressure on phase transitions in K1−xNaxMnF3 (x = 0.04)Åsbrink, S. / Waśkowska, A. / Krane, H. G. / Gerward, L. / Olsen, J. Staun et al. | 1999
- 178
-
Combination of energy minimizations and rigid-body Rietveid refinement: the structure of 2,5-dihydroxybenzo[de]benzo[4,5]imidazo[2,1-a]isoquinolin-7-oneSchmidt, M. U. / Dinnebier, R. E. et al. | 1999
- 178
-
Combination of energy minimizations and rigid-body Rietveld refinement: the structure of 2,5-dihydroxybenzo[de]benzo[4,5]imidazo[2,1-a]isoquinolin-7-oneSchmidt, Martin U. / Dinnebier, Robert E. et al. | 1999
- 178
-
RESEARCH PAPERS - Combination of energy minimizations and rigid-body Rietveld refinement: The structure of 2,5-dihydroxybenzo(de)benzo(4,5)imidazo(2,1-a)isoquinolin-7-oneSchmidt, M.U. et al. | 1999
- 187
-
Synchrotron radiation topographic observation of KTiOPO4 crystals under an electric fieldLiu, W. J. / Jiang, S. S. / Ding, Y. / Wu, X. S. / Wang, J. Y. / Hu, X. B. / Jiang, J. H. et al. | 1999
- 187
-
RESEARCH PAPERS - Synchrotron radiation topographic observation of KTiOPO4 crystals under an electric fieldLiu, W.J. et al. | 1999
- 193
-
RESEARCH PAPERS - Towards general diffractometry. II. Unrestricted normal-beam equatorial geometryDera, R. et al. | 1999
- 193
-
Towards general diffractometry. II. Unrestricted normal-beam equatorial geometryDera, Przemysław / Katrusiak, Andrzej et al. | 1999
- 197
-
RESEARCH PAPERS - Small-angle scattering of interacting particles. II. Generalized indirect Fourier transformation under consideration of the effective structure factor for polydisperse systemsWeyerich, B. et al. | 1999
- 197
-
Small-angle scattering of interacting particles. II. Generalized indirect Fourier transformation under consideration of the effective structure factor for polydisperse systemsWeyerich, B. / Brunner-Popela, J. / Glatter, O. et al. | 1999
- 210
-
Topological analysis of experimental electron densitiesSouhassou, Mohamed / Blessing, Robert H. et al. | 1999
- 210
-
RESEARCH PAPERS - Topological analysis of experimental electron densitiesSouhassou, M. et al. | 1999
- 218
-
Correction of diffraction optics and P–V–T determination using thermoelastic equations of state of multiple phasesZhao, Yusheng / Von Dreele, Robert B. / Weidner, Donald J. et al. | 1999
- 218
-
RESEARCH PAPERS - Correction of diffraction optics and P-V-T determination using thermoelastic equations of state of multiple phasesZhao, Y. et al. | 1999
- 226
-
Morphological characterization of ion-sputtered C–Ag, C/C–Ag and Ag/C films by GISAXSBabonneau, D. / Naudon, A. / Thiaudière, D. / Lequien, S. et al. | 1999
- 226
-
RESEARCH PAPERS - Morphological characterization of ion-sputtered C-Ag, C-C-Ag and Ag-C films by GISAXSBabonneau, D. et al. | 1999
- 234
-
RESEARCH PAPERS - Grazing-incidence X-ray diffraction in the study of metallic dusters buried in glass obtained by ion implantationD'Acapito, F. et al. | 1999
- 234
-
Grazing-incidence X-ray diffraction in the study of metallic clusters buried in glass obtained by ion implantationd'Acapito, Francesco / Zontone, Federico et al. | 1999
- 234
-
Grazing-incidence X-ray diffraction in the study of metallic dusters buried in glass obtained by ion implantationD'Acapito, F. / Zontone, F. et al. | 1999
- 241
-
Crystalline and microstructure study of the AIN-Al~2O~3 section in the Al-N-O system. I. Polytypes and -AION spinel phaseTabary, P. / Servant, C. et al. | 1999
- 241
-
RESEARCH PAPERS - Crystalline and microstructure study of the AlN-Al2O3 section in the Al-N-O system. I. Polytypes and g-AlON spinel phaseTabary, R. et al. | 1999
- 241
-
Crystalline and microstructure study of the AlN–Al2O3 section in the Al–N–O system. I. Polytypes and γ-AlON spinel phaseTabary, P. / Servant, C. et al. | 1999
- 253
-
Crystalline and microstructure study of the AIN-Al~2O~3 section in the Al-N-O system. II. psi- and - AION spinel phasesTabary, P. / Servant, C. et al. | 1999
- 253
-
RESEARCH PAPERS - Crystalline and microstructure study of the AlN-Al2O3 section in the Al-N-O system. II. f' - and d-AlON spinel phasesTabary, R. et al. | 1999
- 253
-
Crystalline and microstructure study of the AlN–Al2O3 section in the Al–N–O system. II. ϕ′- and δ-AlON spinel phasesTabary, P. / Servant, C. et al. | 1999
- 273
-
Investigation of particle size distribution and aggregate structure of various ferrofluids by small-angle scattering experimentsEberbeck, Dietmar / Bläsing, Jürgen et al. | 1999
- 273
-
RESEARCH PAPERS - Investigation of particle size distribution and aggregate structure of various ferrofluids by small-angle scattering experimentsEberbeck, D. et al. | 1999
- 281
-
Phenomenological model of anisotropic peak broadening in powder diffractionStephens, Peter W. et al. | 1999
- 281
-
RESEARCH PAPERS - Phenomenological model of anisotropic peak broadening in powder diffractionStephens, R.W. et al. | 1999
- 290
-
RESEARCH PAPERS - The dislocation model of strain anisotropy in whole powder-pattern fitting: The case of an U-Mn cubic spinelUngár, I. et al. | 1999
- 290
-
The dislocation model of strain anisotropy in whole powder-pattern rifling: the case of an Li-Mn cubic spinelUngar, T. / Leoni, M. / Scardi, P. et al. | 1999
- 290
-
The dislocation model of strain anisotropy in whole powder-pattern fitting: the case of an Li–Mn cubic spinelUngár, T. / Leoni, M. / Scardi, P. et al. | 1999
- 296
-
Crystal structures and voids in diesel waxesGerson, A. R. / Nyburg, S. C. / McAleer, A. et al. | 1999
- 296
-
RESEARCH PAPERS - Crystal structures and voids in diesel waxesGerson, A.R. et al. | 1999
- 300
-
Secondary extinction in textured filmsYamakov, V. / Tomov, I. et al. | 1999
- 300
-
RESEARCH PAPERS - Secondary extinction in textured filmsYamakov, V. et al. | 1999
- 309
-
RESEARCH PAPERS - Diffuse X-ray scattering by 2,3-dimethyinaphthaleneSchreier, R. et al. | 1999
- 309
-
Diffuse X-ray scattering by 2,3-dimethylnaphthaleneSchreier, R. / Kalus, J. et al. | 1999
- 322
-
RESEARCH PAPERS - Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experimentsLaaziri, K. et al. | 1999
- 322
-
Quantitative treatment for extracting coherent elastic scattering from X-ray scattering experimentsLaaziri, Khalid / Robertson, J. L. / Roorda, S. / Chicoine, M. / Kycia, S. / Wang, J. / Moss, S. C. et al. | 1999
- 327
-
Crystallographic CourseWareKastner, M. E. et al. | 1999
- 327
-
TEACHING AND EDUCATION IN CRYSTALLOGRAPHY - Crystallographic CourseWareKastner, M.E. et al. | 1999
- 332
-
Automatic determination of diffuse-peak positions and the centre of a diffraction patternWilkinson, S. J. / Hukins, D. W. L. et al. | 1999
- 332
-
SHORT COMMUNICATIONS - Automatic determination of diffuse-peak positions and the centre of a diffraction patternWilkinson, S.J. et al. | 1999
- 336
-
Making the most of commercial sparse-matrix protein crystallization screening kitsAlbert, Armando / Martínez-Ripoll, Martín et al. | 1999
- 336
-
SHORT COMMUNICATIONS - Making the most of commercial sparse-matrix protein crystallization screening kitsAlbert, A. et al. | 1999
- 339
-
EXPO: a program for full powder pattern decomposition and crystal structure solutionAltomare, Angela / Burla, Maria Cristina / Camalli, Mercedes / Carrozzini, Benedetta / Cascarano, Giovanni Luca / Giacovazzo, Carmelo / Guagliardi, Antonietta / Moliterni, Anna Grazia Giuseppina / Polidori, Giampiero / Rizzi, Rosanna et al. | 1999
- 339
-
COMPUTER PROGRAMS - EXPO: A program for full powder pattern decomposition and crystal structure solutionAltomare, A. et al. | 1999
- 341
-
COMPUTER PROGRAMS - VALMAP2.0: Contour maps using the bond-valencesum methodGonzález-Platas, J. et al. | 1999
- 341
-
VALMAP2.0: contour maps using the bond-valence-sum methodGonzález-Platas, Javier / González-Silgo, Cristina / Ruiz-Pérez, Catalina et al. | 1999
- 345
-
COMPUTER PROGRAMS - AXES1.9: new tools for estimation of crystallite size and shape by Williamson-Hall analysisMändar, H. et al. | 1999
- 345
-
AXES1.9: new tools for estimation of crystallite size and shape by Williamson–Hall analysisMändar, Hugo / Felsche, Jürgen / Mikli, Valdek / Vajakas, Toivo et al. | 1999
- 351
-
COMPUTER PROGRAMS - LAYER - a computer program for the graphic display of intensity data as simulated precession photographsBarbour, L.J. et al. | 1999
- 351
-
LAYER – a computer program for the graphic display of intensity data as simulated precession photographsBarbour, Leonard J. et al. | 1999
- 353
-
SECTION – a computer program for the graphic display of cross sections through a unit cellBarbour, Leonard J. et al. | 1999
- 353
-
COMPUTER PROGRAMS - SECTION - A computer program for the graphic display of cross sections through a unit cellBarbour, L.J. et al. | 1999
- 355
-
COMPUTER PROGRAMS - UMWEG-98: A program for calculation and graphical representation of multiple diffraction patternsRossmanith, E. et al. | 1999
- 355
-
UMWEG-98: a program for calculation and graphical representation of multiple diffraction patternsRossmanith, Elisabeth et al. | 1999
- 362
-
MESO – a program to convert X-ray diffraction data from angular to reciprocal spaceLocherer, K. R. / Buckley, A. / Salje, E. K. H. et al. | 1999
- 362
-
COMPUTER PROGRAMS - MESO - A program to convert X-ray diffraction data from angular to reciprocal spaceLocherer, K.R. et al. | 1999
- 365
-
FINDNCS: a program to detect non-crystallographic symmetries in protein crystals from heavy-atom sitesLu, Guoguang et al. | 1999
- 365
-
COMPUTER PROGRAMS - FINDNCS: A program to detect non-crystallographic symmetries in protein crystals from heavy-atom sitesLu, G. et al. | 1999
- 369
-
X-ray design constraints for in situ electrochemical cells: importance of window material, electrolyte and X-ray wavelengthNahlé, A. H. / Walsh, F. C. / Brennan, C. / Roberts, K. J. et al. | 1999
- 369
-
LABORATORY NOTES - X-ray design constraints for in situ electrochemical cells: Importance of window material, electrolyte and X-ray wavelengthNahlé, A.H. et al. | 1999
- 373
-
A strengthened zero-scattering-alloy pressure cylinder for neutron powder diffractionKnorr, K. / Annighöfer, B. / Depmeier, W. et al. | 1999
- 373
-
LABORATORY NOTES - A strengthened zero-scattering-alloy pressure cylinder for neutron powder diffractionKnorr, K. et al. | 1999
- 375
-
LABORATORY NOTES - Computer Program Abstracts - Java applets for crystallographyWeber, S. et al. | 1999
- 375
-
Java applets for crystallographyWeber, S. et al. | 1999
- 375
-
LABORATORY NOTES - Computer Program Abstracts - PATTERN: A precession simulation program for displaying reciprocal-space reflection dataLu, G. et al. | 1999
- 375
-
PATTERN: a precession simulation program for displaying reciprocal-space reflection dataLu, Guoguang et al. | 1999
- 376
-
Tcl/Tk-based programs. III. CRITXPL: graphical analysis of the X-PLOR refinement log filesUrzhumtseva, L. M. / Urzhumtsev, A. G. et al. | 1999
- 376
-
Tcl/Tk-based programs. IlL CRITXPL: graphical analysis of the X-PLOR refinement log filesUrzhumtseva, L. M. / Urzhumtsev, A. G. et al. | 1999
- 376
-
LABORATORY NOTES - Computer Program Abstracts - Tcl-Tk-based programs. III. CRITXPL: Graphical analysis of the X-PLOR refinement log filesUrzhumtseva, L.M. et al. | 1999
- 377
-
1999 ICDD Crystallography Scholarship Recipients are Announced| 1999
- 377
-
Crystallographers| 1999
- 377
-
LABORATORY NOTES - Computer Program Abstracts - TOPOS3.1 - Program package for multipurpose geometrical and topological analysis of crystal structuresBlarov, V.A. et al. | 1999
- 377
-
TOPOS3.1 – program package for multipurpose geometrical and topological analysis of crystal structuresBlatov, V. A. / Shevchenko, A. P. / Serezhkin, V. N. et al. | 1999
- 378
-
Book Reviews| 1999
- 378
-
Advanced computing in electron microscopy. By EARL J. KIRKLAND. Pp. ix + 250 (CD-ROM included). New York: Plenum Press, 1998. Price: US $72.50. ISBN 0-306-45936-1.Dorset, Douglas L. et al. | 1999
- 379
-
New Commercial Products| 1999
- 379
-
Crystallographica Search-MatchOxford Cryosystems et al. | 1999
- 379
-
Disperse systems. By Makoto Takeo, Pp. xi + 317. Weinheim: Wiley-VCH Verlag GmbH, 1999. Price £85.00. ISBN 3-527-29458-9.| 1999
- 379
-
Group III nitride semiconductor compounds. Physics and applications. Edited by Bernard Gill. New York: Oxford University Press, 1998. Pp. xvii + 470. Price US $145.00. ISBN 0-19-850159-5.| 1999
- 379
-
Scanning probe microscopy of polymers. (ACS Symposium Series 694). Edited by B. D. Ratner and V. V. Tsukruk. New York: Oxford University Press, 1998. Pp. xii + 367. Price US $125.00. ISBN 0-8412-3562-7.| 1999
- 379
-
Books Received| 1999
- 379
-
Portable xenon pressure chamberOxford Cryosystems et al. | 1999