New type of common-path heterodyne profilometer [2861-40] (English)
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In:
Laser interferometry VIII: applications
2861
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269-271
;
1996
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ISBN:
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ISSN:
- Conference paper / Print
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Title:New type of common-path heterodyne profilometer [2861-40]
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Contributors:Li, J. ( author ) / Zhao, Y. ( author ) / Li, D. ( author ) / Pryputniewicz, R. J. / Brown, G. M. / Juptner, W. P. O. / SPIE
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Conference:Conference; 8th, Laser interferometry VIII: applications ; 1996 ; Denver; CO
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Published in:Laser interferometry VIII: applications , 2861 ; 269-271PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING , 2861 ; 269-271
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Publisher:
- New search for: SPIE
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Publication date:1996-01-01
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Size:3 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Hybrid techniques in experimental strain/stress analysis by optical methodsLaermann, Karl-Hans et al. | 1996
- 2
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Hybrid techniques in experimental strain/stress analysis by optical methods (Invited Paper) [2861-01]Laermann, K.-H. / SPIE et al. | 1996
- 13
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Hybrid, experimental and computational, investigation of mechanical components [2861-02]Furlong, C. / Pryputniewicz, R. J. / SPIE et al. | 1996
- 13
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Hybrid, experimental and computational, investigation of mechanical componentsFurlong, Cosme / Pryputniewicz, Ryszard J. et al. | 1996
- 26
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Composite-embedded highly birefringent optical fiber strain gauge with zero thermal-apparent strainLuke, David G. / McBride, Roy / Jones, Julian D. C. / Lloyd, Peter A. / Burnett, James G. / Greenaway, Alain H. et al. | 1996
- 26
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Composite-embedded highly birefringent optical fiber strain gauge with zero thermal-apparent strain [2861-03]Luke, D. G. / McBride, R. / Jones, J. D. C. / Lloyd, P. A. / SPIE et al. | 1996
- 32
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Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) film [2861-05]Dovgalenko, G. E. / Kniazkov, A. / Onischenko, Y. / Salamo, G. J. / SPIE et al. | 1996
- 32
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Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) filmDovgalenko, George E. / Kniazkov, Anatoli / Onischenko, Yuri I. / Salamo, Gregory J. et al. | 1996
- 41
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Vibration analysis and nondestructive testing by digital shearography [2861-07]Steinchen, W. / Yang, L. / Kupfer, G. / SPIE et al. | 1996
- 41
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Vibration analysis and nondestructive testing by digital shearographySteinchen, Wolfgang / Yang, Lian Xiang / Kupfer, Gerhard et al. | 1996
- 52
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High-sensitivity displacement measurement using a novel fiber optic electronically scanned white light interferometer [2861-08]Marshall, R. H. / Ning, Y. N. / Palmer, A. W. / Grattan, K. T. V. / SPIE et al. | 1996
- 52
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High-sensitivity displacement measurement using a novel fiber optic electronically scanned white light interferometerMarshall, Raymond H. / Ning, Yanong N. / Palmer, Andrew W. / Grattan, Kenneth T. V. et al. | 1996
- 62
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Aspects of the use of self-mixing interference in laser diodes for displacement sensingAddy, Richard C. / Palmer, Andrew W. / Grattan, Kenneth T. V. et al. | 1996
- 62
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Aspects of the use of self-mixing interference in laser diodes for displacement sensing [2861-09]Addy, R. C. / Palmer, A. W. / Grattan, K. T. V. / SPIE et al. | 1996
- 72
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Three-dimensional displacement analysis by projected fringes and speckle correlationWolf, Thomas / Gutmann, Bernd / Weber, H. et al. | 1996
- 72
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Three-dimensional displacement analysis by projected fringes and speckle correlation [2861-10]Wolf, T. / Gutmann, B. / Weber, H. / SPIE et al. | 1996
- 86
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Phase-shifting techniques applied to unique applicationsKoliopoulos, Chris L. et al. | 1996
- 86
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Phase-shifting techniques applied to unique applications [2861-13]Koliopoulos, C. L. / SPIE et al. | 1996
- 94
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Realization and accuracy of a phase-shifting speckle interferometer for full 3D shape measurementMaack, Thomas / Kowarschik, Richard M. / Notni, Gunther / Schreiber, Wolfgang et al. | 1996
- 94
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Realization and accuracy of a phase-shifting speckle interferometer for full 3D shape measurement [2861-14]Maack, T. / Kowarschik, R. M. / Notni, G. / Schreiber, W. / SPIE et al. | 1996
- 107
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Multiaperture overlap-scanning technique for moire metrology [2861-16]Chen, M. / Wu, D. / SPIE et al. | 1996
- 107
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Multiaperture overlap-scanning technique for moire metrologyChen, Mingyi / Wu, De-zhu et al. | 1996
- 114
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Ultrahigh resolution interferometry (Invited Paper) [2861-18]Trolinger, J. D. / SPIE et al. | 1996
- 114
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Ultrahigh resolution interferometryTrolinger, James D. et al. | 1996
- 124
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Measurements of transonic shock structures using shearographyBurnett, Mark / Bryanston-Cross, Peter J. et al. | 1996
- 124
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Measurements of transonic shock structures using shearography [2861-19]Burnett, M. / Bryanston-Cross, P. J. / SPIE et al. | 1996
- 136
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Scanning laser speckle photography for temperature field measurement in fluid flowsKulenovic, Rudi / Song, Yaozu / Groll, Manfred et al. | 1996
- 136
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Scanning laser speckle photography for temperature field measurement in fluid flows [2861-20]Kulenovic, R. / Song, Y. Z. / Groll, M. / SPIE et al. | 1996
- 146
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Moire tomography by ARTYan, Dapeng / Liu, Feng / Wang, Zhen-Dang / He, Anzhi et al. | 1996
- 146
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Moire tomography by ART [2861-21]Yan, D.-P. / Liu, F. / Wang, Z.-D. / He, A.-Z. / SPIE et al. | 1996
- 152
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Computer-controlled active phase stabilization for electronic holography [2861-23]Hrebabetzky, F. / SPIE et al. | 1996
- 152
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Computer-controlled active phase stabilization for electronic holographyHrebabetzky, Frank et al. | 1996
- 164
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Real-time interferometric analysis of spinning liquid filmsHorowitz, Flavio / Bacchieri, A. / Michels, Alexandre F. / Yeatman, Eric M. / Grieneisen, H. P. et al. | 1996
- 164
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Real-time interferometric analysis of spinning liquid films [2861-24]Horowitz, F. / Bacchieri, A. / Michels, A. / Yeatman, E. M. / SPIE et al. | 1996
- 170
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Nondestructive quantitative 3D characterization of a car brakeJueptner, Werner P. O. / Osten, Wolfgang / Andrae, Peter / Nadeborn, Werner et al. | 1996
- 170
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Nondestructive quantitative 3D characterization of a car brake [2861-26]Jueptner, W. P. O. / Osten, W. / Andrae, P. / Nadeborn, W. / SPIE et al. | 1996
- 180
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Interferometric analysis of strained thin silicon films [2861-27]Trolard, B. / Tribillon, G. M. / Bonnotte, E. / Delobelle, P. / SPIE et al. | 1996
- 180
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Interferometric analysis of strained thin silicon filmsTrolard, Bertrand / Tribillon, Gilbert M. / Bonnotte, Eric / Delobelle, Patrick / Bornier, Luc et al. | 1996
- 192
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Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary resultsvan Dongeren, Hans / Pryputniewicz, Ryszard J. / Sacco, Albert et al. | 1996
- 192
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Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary results [2861-28]Van Dongeren, H. / Pryputniewicz, R. J. / Sacco, A. / SPIE et al. | 1996
- 203
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New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulationZeng, LiJiang / Ohnuki, Takeshi / Matsumoto, Hirokazu / Kawachi, Keiji et al. | 1996
- 203
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New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulation [2861-30]Zeng, L. / Ohnuki, T. / Matsumoto, H. / Kawachi, K. / SPIE et al. | 1996
- 212
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Novel material studies by automatic grating interferometrySalbut, Leszek A. / Kujawinska, Malgorzata et al. | 1996
- 212
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Novel material studies by automatic grating interferometry [2861-31]Salbut, L. A. / Kujawinska, M. / SPIE et al. | 1996
- 220
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Recognition by synthesis: a new approach for the recognition of material faults in HNDEOsten, Wolfgang / Elandaloussi, Frank / Jueptner, Werner P. O. et al. | 1996
- 220
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Recognition by synthesis: a new approach for the recognition of material faults in HNDE [2861-32]Osten, W. / Elandaloussi, F. / Jueptner, W. P. O. / SPIE et al. | 1996
- 225
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Fault detection and classification in and on transparent films by light scatteringStojanoff, Christo G. / Ante, Andreas / Schaller, Johannes K. et al. | 1996
- 225
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Fault detection and classification in and on transparent films by light scattering [2861-33]Stojanoff, C. G. / Ante, A. / Schaller, J. K. / SPIE et al. | 1996
- 234
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Measurement of the ac impedance of aluminum samples by holographic interferometryHabib, Khaled J. et al. | 1996
- 234
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Measurement of the ac impedance of aluminum samples by holographic interferometry [2861-34]Habib, K. J. / SPIE et al. | 1996
- 248
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Recent applications of TV holography and shearographyKrishna Mohan, Nandigana K. / Saldner, Henrik O. / Molin, Nils-Erik et al. | 1996
- 248
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Recent applications of TV holography and shearography [2861-35]Krishna Mohan, N. / Saldner, H. O. / Molin, N.-E. / SPIE et al. | 1996
- 257
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New simple ESPI configurations for deformation studies on large structures based on diffused reference beam [2861-36]Santhanakrishnan, T. / Krishna Mohan, N. / Sirohi, R. S. / SPIE et al. | 1996
- 257
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New simple ESPI configurations for deformation studies on large structures based on diffused reference beamSanthanakrishnan, T. / Krishna Mohan, Nandigana K. / Sirohi, Rajpal S. et al. | 1996
- 264
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In-process laser diode heterodyne profilometer with moving-coil objective lens [2861-39]Wu, Y. / Li, D. / Cao, M. / Lu, Y. / SPIE et al. | 1996
- 264
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In-process laser diode heterodyne profilometer with moving-coil objective lensWu, Yongjun / Li, Dacheng / Cao, Mang / Lu, Yuechuan et al. | 1996
- 269
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New type of common-path heterodyne profilometer [2861-40]Li, J. / Zhao, Y. / Li, D. / SPIE et al. | 1996
- 269
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New type of common-path heterodyne profilometerLi, Jinjin / Zhao, Yang / Li, Dacheng et al. | 1996
- 272
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Measurements of dew droplets deposited on a metal plate by using an interference microscope with laser light [2861-41]Matsumoto, S. / Takayama, K. / Toyooka, S. / SPIE et al. | 1996
- 272
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Measurements of dew droplets deposited on a metal plate by using an interference microscope with laser lightMatsumoto, Shigeaki / Takayama, Kinya / Toyooka, Satoru et al. | 1996
- 278
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Laser sizing of fine particulates [2861-43]Uygur, M. E. / SPIE et al. | 1996
- 278
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Laser sizing of fine particulatesUygur, Mustafa E. et al. | 1996
- 289
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Simple laser interferometers for testing optics [2861-44]Popov, E. G. / SPIE et al. | 1996
- 289
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Simple laser interferometers for testing opticsPopov, Yevgen G. et al. | 1996
- 296
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Optimization of polishing parameters in computer-controlled optical polishing process [2861-46]Zhang, X. / Yu, J. / Zhang, Z. / SPIE et al. | 1996
- 296
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Optimization of polishing parameters in computer-controlled optical polishing processZhang, Xuejun / Yu, Jingchi / Zhang, Zhongyu et al. | 1996