Comparative Interferometric Measurements by Holographic Illumination (English)
- New search for: Gyimesi, F.
- New search for: Fuezessy, Z.
- New search for: Raczkevi, B.
- New search for: Makai, J.
- New search for: Gyimesi, F.
- New search for: Fuezessy, Z.
- New search for: Raczkevi, B.
- New search for: Makai, J.
- New search for: Fuzessy, Z.
- New search for: Juptner, W.
- New search for: Osten, W.
In:
Laser applications in precision measurements: Simulation and experiment in laser metrology
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140-145
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1996
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Comparative Interferometric Measurements by Holographic Illumination
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Contributors:Gyimesi, F. ( author ) / Fuezessy, Z. ( author ) / Raczkevi, B. ( author ) / Makai, J. ( author ) / Fuzessy, Z. / Juptner, W. / Osten, W.
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Conference:International symposium, Laser applications in precision measurements: Simulation and experiment in laser metrology ; 1996 ; Balatonfured; Hungary
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Published in:Laser applications in precision measurements: Simulation and experiment in laser metrology ; 140-145AKADEMIE VERLAG SERIES IN OPTICAL METROLOGY ; 2 ; 140-145
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Publisher:
- New search for: Akademie Verlag
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Place of publication:Berlin
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Publication date:1996-01-01
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Size:6 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 15
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Safety Valuation of Large Structures - Reality and PerspectivesLaermann, K.-H. et al. | 1996
- 27
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Optical Range-Sensing with Spatially Modulated CoherenceBail, M. / Gebhardt, B. / Haeusler, G. / Herrmann, J. et al. | 1996
- 34
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Flatness Measurement of Large Plane ObjectsNyarsik, L. / Koerner, K. / Fritz, H. et al. | 1996
- 40
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High Precision Two-Dimensional Spatial Fringe Analysis MethodArai, Y. / Yokozeki, S. / Shiraki, K. / Yamada, T. et al. | 1996
- 46
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Optical 3D Measurements of Objects with Technical SurfacesSchreiber, W. / Notni, G. / Kuehmstedt, P. / Gerber, J. et al. | 1996
- 52
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Shape and Normal Displacement Measurement of Real Objects in a Wide Dynamic RangeSainov, V. / Stoilov, G. / Tontchev, D. / Dragostinov, T. et al. | 1996
- 61
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Fast Implementation of In-Line Holography for High Resolution Shape MeasurementKreuzer, H. J. / Pawlitzek, R. A. et al. | 1996
- 67
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Single-Transform Fourier/Hartley Fringe Analysis for Holographic InterferometryTakeda, M. / Taniguchi, K. / Hirayama, T. / Kohgo, H. et al. | 1996
- 74
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New Developments in Absolute Interferometric Testing of Non-Rotationally Symmetric Aspherics for Calibration PurposesElssner, K.-E. / Bluemel, T. / Burow, R. / Kafka, R. et al. | 1996
- 82
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Axicon-Type Test Interferometer for Cylindrical SurfacesBrinkmann, S. / Dresel, T. / Schreiner, R. / Schwider, J. et al. | 1996
- 88
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Interferometric Test of MicrolensesSchreiber, H. / Zhou, L. / Schwider, J. et al. | 1996
- 94
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Automatic Measurements of Paraxial Focal Distances in Ophthalmic Lenses by Moire DeflectometryYonte, T. / Gomez-Pedrero, J. A. / Canabal, H. / Bernabeu, E. et al. | 1996
- 100
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Optimization of Kinoform LensesBokor, N. / Papp, Z. et al. | 1996
- 106
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Interference Measurement of Rough SurfacesAngelsky, O. V. et al. | 1996
- 109
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Interference Device for Noncontact Diagnostics of Arbitrarily Shaped Rough SurfacesMaksimyak, P. P. / Angelsky, O. V. et al. | 1996
- 112
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Polarization Superrezolution in Surface MicroscopyUshenko, A. G. / Yermolenko, S. B. et al. | 1996
- 121
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Hybrid Panel Acoustic Contribution Analysis for Minimizing Vehicle Noise and WeightBrown, G. M. / Zhang, Y. K. / Allen, T. E. / Chen, F. et al. | 1996
- 129
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Non Contact and Whole Field Strain Analysis with a Laseroptical Strain SensorEttemeyer, A. et al. | 1996
- 134
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Comparative Studies of ESPI and Grating Interferometry Methods used for the Determination of In-Plane Displacements in Presence of Out-Off-Plane Displacement GradientsOlszak, A. / Patorski, K. / Salbut, L. et al. | 1996
- 140
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Comparative Interferometric Measurements by Holographic IlluminationGyimesi, F. / Fuezessy, Z. / Raczkevi, B. / Makai, J. et al. | 1996
- 146
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Comparative Digital Speckle Pattern InterferometryLazlo, I. / Fuezessy, Z. / Kornis, J. / Gyimesi, F. et al. | 1996
- 151
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Experimental-Numerical Analysis of 3D Residual Stresses in Engineering ObjectsKujawinska, M. et al. | 1996
- 159
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Numerical Simulation of a Transition from Holographically measured Displacement Near Drilled Hole to Residual Strains and StressesPisarev, V. S. / Grigoriev, V. D. / Dzuba, A. S. et al. | 1996
- 170
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Deformation Measurement of Several Materials in Cooling Down Process from Room Temperature to 77K Using Electronic Speckle Pattern InterferometryNakahara, S. / Sakiyama, H. / Hisada, S. / Fujita, T. et al. | 1996
- 170
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Deformation measurement of several materials in cooling processes from room temperature to 77 K using electronic speckle pattern interferometryNakahara, S. / Sakiyama, H. / Hisada, S. / Fujita, T. et al. | 1996
- 176
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The Use of Holographic Interferometry Data for the Refinement of Local Elasto-Plastic Strain Calculations by FEMDzuba, A. S. / Grigoriev, V. D. / Pisarev, V. S. et al. | 1996
- 184
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Some Practical Aspects of Residual Stresses Determination in Structures Through the Use of Holographic Interferometry DataSchikanov, A. Y. / Shchepinov, V. P. et al. | 1996
- 188
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Analysis of Holographic Interference Fringe Patterns Related to Residual Stress Redistribution Near Drilled HoleShchepinov, V. P. / Schikanov, A. Y. et al. | 1996
- 192
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Holographic and speckle metrology: from concepts to applicationsJüptner, W. et al. | 1996
- 192
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Holographic and Speckle Metrologies: From Concepts to ApplicationsJueptner, W. et al. | 1996
- 203
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Holographic Interferometric Microscopy with Conjugate Reconstruction Applied for the Measurement of DeformationsWernicke, G. / Kruschke, O. / Huth, T. / Demoli, N. et al. | 1996
- 209
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Numerical Investigations on the Appearance of Material Flaws in Holographic Interference PatternsMieth, U. / Osten, W. / Jueptner, W. et al. | 1996
- 217
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Weight Functions Determination for the Cracks in Curved Shells from Holographic Interferometry DataAnpilov, A. V. / Balalov, V. V. / Morozov, E. M. / Shchepinov, V. P. et al. | 1996
- 225
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Detection of Defects by Holographic Interferometry and FEM during the Transient Heat Up PhaseHolstein, D. / Bischof, T. / Jueptner, W. et al. | 1996
- 233
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Simulations in Speckle MetrologyKornis, J. / Bokor, N. et al. | 1996
- 238
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A Phase-Shifting Device for Interferometric Measurements by the Phase-Stepping MethodStoilov, G. / Dragostinov, T. / Tontchev, D. / Sainov, V. et al. | 1996
- 245
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Holography as a Quantitative Modal Testing TechniqueSteinbichler, H. / Klingele, H. et al. | 1996
- 251
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Theoretical and practical Study of Polymer Pipe VibrationMarkov, V. B. / Khizhnyak, A. I. / Boone, P. M. / Vanspeybroeck, P. et al. | 1996
- 261
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Synthesis of Experimental and Simulation in Speckle Interferometry: A Medical ApplicationHoefling, R. / Aswendt, P. / Liebig, V. / Brueckner, S. et al. | 1996
- 269
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Sound Frequency Band Vibrations on Submicron Amplitude Scale in Rigid Mechanical StructuresJani, P. / Czitrovszky, A. et al. | 1996
- 277
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Optical Tomography of Strongly Refracting Phase Objects by Holographic InterferometryNeger, T. / Philipp, H. / Jaeger, H. et al. | 1996
- 285
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Mathematical Modellization of Experimental Objects and Simulation of their Thomographic Reconstruction in "Optical Tomography Preparatory Study"Becker, J. / Gatti, L. / Solitro, F. et al. | 1996
- 291
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Time- and Space-Resolved Temperature Measurements in Turbulent Combustion Based on Laser Deflection and Algebraic Reconstruction for TomographyGerstner, K. / Fehl, A. / Otten, J. / Neidhardt, D. et al. | 1996
- 295
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Application of Automatic Phase Stepping to the Measurement of Heat TransferDavies, R. N. / Bryanston-Cross, P. J. et al. | 1996
- 300
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Flow Visualization and Plasma Diagnostics by Digital-Speckle-Pattern-InterferometryFliesser, W. / Hipp, M. / Neger, T. / Jaeger, H. et al. | 1996
- 306
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Interference Method for Measuring Particle Size and ConcentrationAngelsky, O. V. / Maksimyak, P. P. et al. | 1996
- 312
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An Optical Alignment System for the High Precision Silicon Tracker of the Alpha Magnetic Spectrometer (AMS) on the International Space Station AlphaBattiston, R. / Ambrosi, G. / Burger, W. / Kornis, J. et al. | 1996