An Embedded Frame Buffer for Graphics Applications (English)
- New search for: Lazar, P.
- New search for: Yeo, C. F.
- New search for: Selinger, D.
- New search for: Kim, P.-J.
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- New search for: Lazar, P.
- New search for: Yeo, C. F.
- New search for: Selinger, D.
- New search for: Kim, P.-J.
- New search for: Rajsuman, R.
- New search for: Swee, Y.-K.
- New search for: Lau, L.-Y.
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In:
Memory technology, design and testing
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28-33
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1996
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ISBN:
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ISSN:
- Conference paper / Print
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Title:An Embedded Frame Buffer for Graphics Applications
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Contributors:Lazar, P. ( author ) / Yeo, C. F. ( author ) / Selinger, D. ( author ) / Kim, P.-J. ( author ) / Rajsuman, R. / Swee, Y.-K. / Lau, L.-Y. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council
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Conference:International workshop, Memory technology, design and testing ; 1996 ; Singapore
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Published in:
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Publisher:
- New search for: IEEE
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Publication date:1996-01-01
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Size:6 pages
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Remarks:IEEE cat no 96TB100042
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Future Trends in Flash MemoriesGrossman, S. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 6
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Recent Developments in DRAM TestingCockburn, B. F. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 8
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Built-in Self Testing for Detection of Coupling Faults in Semiconductor MemoriesKarpovsky, M. G. / Das, D. / Vardhan, H. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 15
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A Built In Self Test Scheme for 256Meg SDRAMHii, F. / Powell, T. / Cline, D. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 22
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Proposed On-Chip Test Structure to Quantify Trap Densities within Flash MemoriesVerma, V. / Swaneck, A. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 28
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An Embedded Frame Buffer for Graphics ApplicationsLazar, P. / Yeo, C. F. / Selinger, D. / Kim, P.-J. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 34
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A Concurrent Placement and Routing Strategy for Improving the Quality of Application Specific Memory DesignsHegde, S. U. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 38
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Flash Memory Quality and Reliability IssuesVerma, R. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 43
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A Low Power Current Sensing Scheme for CMOS SRAMWang, H. / Liu, P. C. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 52
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Giga-Bit DRAM TrendFuruyama, T. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 53
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Flash Memory Technology - A ReviewRajkanan, K. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 56
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RAMBIST Builder: A Methodology for Automatic Built-In Self-Test Design of Embedded RAMsRajsuman, R. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 63
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A Synthesizable RAM BIST Circuit for Applying an O(n Log~2 n) Test that Detects Scrambled Static Pattern-Sensitive FaultsCockburn, B. F. / Sarda, D. P. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 70
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Methods for Memory Test Time ReductionWu, W.-J. / Tang, C. Y. / Lin, M. Y. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 78
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Design and Analysis of a Synchronous DRAM Memory ModuleLey, G. / Phipps, D. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 85
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Scanning Capacitance Microscopy Analysis of DRAM Trench CapacitorsPey, K. L. / Strausser, Y. E. / Erickson, A. N. / Leslie, A. J. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 92
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Thermal Monitoring of MemoriesSzekely, V. / Rencz, M. / Courtois, B. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 98
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Unexpected Charge Losses from the Floating Gates of EEPROM Memory CellsAllinger, R. / Kerber, M. / Mattausch, H. J. / Braun, H. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 106
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RAM Diagnostic TestsYarmolik, V. N. / Klimets, Y. V. / Van de Goor, A. J. / Demidenko, S. N. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 109
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A True Testprocessor-Per-Pin Algorithmic Pattern GeneratorHilliges, K.-D. / Sundermann, J. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996
- 116
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Design-for-Test Analysis of a Buffered SDRAM DIMMJandhyala, S. / Ley, A. / IEEE; Computer Society; Technical Committee on Test Technology / IEEE; Computer Society; Technical Committee on VLSI / IEEE; Solid State Circuits Council et al. | 1996