Noncontact estimate of grinding-induced subsurface damage [3782-05] (English)
- New search for: Lambropoulos, J. C.
- New search for: Li, Y.
- New search for: Funkenbusch, P. D.
- New search for: Ruckman, J. L.
- New search for: SPIE
- New search for: Lambropoulos, J. C.
- New search for: Li, Y.
- New search for: Funkenbusch, P. D.
- New search for: Ruckman, J. L.
- New search for: Stahl, H. P.
- New search for: SPIE
In:
Optical manufacturing and testing
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41-50
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1999
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Noncontact estimate of grinding-induced subsurface damage [3782-05]
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Contributors:Lambropoulos, J. C. ( author ) / Li, Y. ( author ) / Funkenbusch, P. D. ( author ) / Ruckman, J. L. ( author ) / Stahl, H. P. / SPIE
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Conference:Conference; 3rd, Optical manufacturing and testing ; 1999 ; Denver, CO
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Published in:
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Publisher:
- New search for: SPIE
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Publication date:1999-01-01
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Size:10 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 2
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Recent advances in aspheric and conformal grinding at the Center for Optics Manufacturing [3782-01]Ruckman, J. L. / Fess, E. / Van Gee, D. / SPIE et al. | 1999
- 2
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Recent advances in aspheric and conformal grinding at the Center for Optics ManufacturingRuckman, Jeffrey L. / Fess, Edward M. / Van Gee, Dennis et al. | 1999
- 11
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Nondimensional parameter for conformal grinding: combining machine and process parameters [3782-02]Funkenbusch, P. D. / Takahashi, T. / Gracewski, S. M. / Ruckman, J. L. / SPIE et al. | 1999
- 11
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Nondimensional parameter for conformal grinding: combining machine and process parametersFunkenbusch, Paul D. / Takahashi, Toshio / Gracewski, Sheryl M. / Ruckman, Jeffrey L. et al. | 1999
- 22
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Quantifying the effects of tool and workpiece surface evolution during microgrinding of optical glasses [3782-03]Takahashi, T. / Funkenbusch, P. D. / Ruckman, J. L. / SPIE et al. | 1999
- 22
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Quantifying the effects of tool and workpiece surface evolution during microgrinding of optical glassesTakahashi, Toshio / Funkenbusch, Paul D. / Ruckman, Jeffrey L. et al. | 1999
- 32
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Chatter in deterministic microgrinding of optical glasses [3782-04]Li, Y. / Gracewski, S. M. / Funkenbusch, P. D. / Ruckman, J. L. / SPIE et al. | 1999
- 32
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Chatter in deterministic microgrinding of optical glassesLi, Yi / Gracewski, Sheryl M. / Funkenbusch, Paul D. / Ruckman, Jeffrey L. et al. | 1999
- 41
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Noncontact estimate of grinding-induced subsurface damageLambropoulos, John C. / Li, Yi / Funkenbusch, Paul D. / Ruckman, Jeffrey L. et al. | 1999
- 41
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Noncontact estimate of grinding-induced subsurface damage [3782-05]Lambropoulos, J. C. / Li, Y. / Funkenbusch, P. D. / Ruckman, J. L. / SPIE et al. | 1999
- 51
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McCarter Superfinish for silicon [3782-06]Anthony, F. A. / McCarter, D. R. / Bertelsen, J. L. / Tangedahl, M. / SPIE et al. | 1999
- 51
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McCarter Superfinish for siliconAnthony, Frank M. / McCarter, Douglas R. / Bertelsen, Jeff L. / Tangedahl, Matt et al. | 1999
- 61
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Computer control and process monitoring of electrolytic in-process dressing of metal bond fine diamond wheels for NIF opticsBoland, Richard J. et al. | 1999
- 61
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Computer control and process monitoring of electrolytic in-process dressing of metal bond fine diamond wheels for NIF optics [3782-07]Boland, R. J. / SPIE et al. | 1999
- 72
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Fun facts about pitch and the pitfalls of ignorance [3782-09]Gillman, B. E. / Tinker, F. / SPIE et al. | 1999
- 72
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Fun facts about pitch and the pitfalls of ignoranceGillman, Birgit E. / Tinker, Flemming et al. | 1999
- 80
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Magnetorheological finishing (MRF) in commercial precision optics manufacturingGolini, Donald / Kordonski, William I. / Dumas, Paul / Hogan, Stephen J. et al. | 1999
- 80
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Magnetorheological finishing (MRF) in commerical precision optics manufacturing [3782-10]Golini, D. / Kordonski, W. I. / Dumas, P. / Hogan, S. J. / SPIE et al. | 1999
- 92
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Details of the polishing spot in magnetorheological finishing (MRF)Arrasmith, Steven R. / Kozhinova, Irina A. / Gregg, Leslie L. / Shorey, Aril B. / Romanofsky, Henry J. / Jacobs, Stephen D. / Golini, Donald / Kordonski, William I. / Hogan, Stephen J. / Dumas, Paul et al. | 1999
- 92
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Details of the polishing spot in magnetorheological finishing (MRF) [3782-11]Arrasmith, S. R. / Kozhinova, I. A. / Gregg, L. L. / Shorey, A. B. / Romanofsky, H. J. / Jacobs, S. D. / Golini, D. / Kordonski, W. I. / Hogan, S. J. / Dumas, P. et al. | 1999
- 101
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Material removal during magnetorheological finishing (MRF)Shorey, Aril B. / Gregg, Leslie L. / Romanofsky, Henry J. / Arrasmith, Steven R. / Kozhinova, Irina A. / Hubregsen, Joshua / Jacobs, Stephen D. et al. | 1999
- 101
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Material removal during magnetorheological finishing (MRF) [3782-12]Shorey, A. B. / Gregg, L. L. / Romanofsky, H. J. / Arrasmith, S. R. / Kozhinova, I. A. / Hubregsen, J. / Jacobs, S. D. / SPIE et al. | 1999
- 114
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Development of lightweight mirror technology for the NGST program [3782-13]Jacobson, D. N. / Bunton, P. / SPIE et al. | 1999
- 114
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Development of lightweight mirror technology for the NGST programJacobson, David N. / Bunton, Patrick et al. | 1999
- 123
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Manufacture of a 2-m mirror with a glass membrane facesheet and active rigid supportBurge, James H. / Cuerden, Brian / Miller, Stephen M. / Crawford, Robert C. / Dorth, Helmuth H. / Sandler, David G. / Wortley, Richard W. et al. | 1999
- 123
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Manufacture of a 2-m mirror with a glass membrane facesheet and active rigid support [3782-14]Burge, J. H. / Cuerden, B. / Miller, S. M. / Crawford, R. C. / Dorth, H. H. / Sandler, D. G. / Wortley, R. W. / SPIE et al. | 1999
- 134
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Recent developments in hybrid mirror technology for the Next Generation Space TelescopeDodson, Kelly J. / Mehle, Gregory V. / Kasl, Eldon P. et al. | 1999
- 134
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Recent developments in hybrid mirror technology for the Next Generation Space Telescope [3782-15]Dodson, K. J. / Mehle, G. V. / Kasl, E. P. / SPIE et al. | 1999
- 141
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Optical and optomechanical ultralightweight C/SiC components [3782-16]Papenburg, U. / Pfrang, W. / Kutter, G. S. / Mueller, C. / Kunkel, B. P. / Deyerler, M. / Bauereisen, S. / SPIE et al. | 1999
- 141
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Optical and optomechanical ultralightweight C/SiC componentsPapenburg, Ulrich / Pfrang, Wilhelm / Kutter, G. S. / Mueller, Claus E. / Kunkel, Bernd P. / Deyerler, Michael / Bauereisen, Stefan et al. | 1999
- 157
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Manufacturing and testing an 8.3-m astronomical mirrorSmith, W. Scott / Hraba, John F. / Jones, George W. et al. | 1999
- 157
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Manufacturing and testing an 8.3-m astronomical mirror [3782-73]Smith, W. S. / Hraba, J. F. / Jones, G. W. / SPIE et al. | 1999
- 170
-
Novel approaches to generate aspherical optical surfacesFaehnle, Oliver W. / van Brug, Hedser H. et al. | 1999
- 170
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Novel approaches to generate aspherical optical surfaces [3782-19]Fahnle, O. W. / van Brug, H. H. / SPIE et al. | 1999
- 181
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Accuracy analysis of the FAUST and WAGNER production process [3782-20]Fahnle, O. W. / van Brug, H. H. / SPIE et al. | 1999
- 181
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Accuracy analysis of the FAUST and WAGNER production processFaehnle, Oliver W. / van Brug, Hedser H. et al. | 1999
- 193
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Fabrication of (a)spheres: a process simulation [3782-21]van Brug, H. H. / Fahnle, O. W. / SPIE et al. | 1999
- 193
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Fabrication of (a)spheres: a process simulationvan Brug, Hedser H. / Faehnle, Oliver W. et al. | 1999
- 203
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Computer-controlled fabrication of free-form glass lens [3782-22]Li, Q. / Cheng, Y. / Tang, D. / Zhang, B. / Cai, F. / SPIE et al. | 1999
- 203
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Computer-controlled fabrication of free-form glass lensLi, Quansheng / Cheng, Ye / Tang, Dong / Zhang, Bopeng / Cai, Fuzhi et al. | 1999
- 214
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Manufacture of LIGO core optics at CSIRO [3782-24]Walsh, C. J. / Leistner, A. J. / Oreb, B. F. / Seckold, J. A. / Farrant, D. I. / Bulla, R. W. / Davis, G. / Lennox, P. J. / Lesha, F. J. / Pavlovic, E. et al. | 1999
- 214
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Manufacture of LIGO core optics at CSIROWalsh, Christopher J. / Leistner, Achim J. / Oreb, Bozenko F. / Seckold, Jeffrey A. / Farrant, David I. / Bulla, Ronald W. / Davis, Glenn / Lennox, Phillip J. / Lesha, Frank J. / Pavlovic, Edita et al. | 1999
- 224
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LIGO optics manufacture: figuring transmission core optics for best performanceLeistner, Achim J. / Farrant, David I. / Oreb, Bozenko F. / Pavlovic, Edita / Seckold, Jeffrey A. / Walsh, Christopher J. et al. | 1999
- 224
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LIGO optics manufacture: figuring transmission core optics for best performance [3782-25]Leistner, A. J. / Farrant, D. I. / Oreb, B. F. / Pavlovic, E. / Seckold, J. A. / Walsh, C. J. / SPIE et al. | 1999
- 232
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Characterization of wavefront variations in coated opticsOreb, Bozenko F. / Netterfield, Roger P. / Walsh, Christopher J. / Freund, Christopher H. / Leistner, Achim J. / Seckold, Jeffrey A. et al. | 1999
- 232
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Characterization of wavefront variations in coated optics [3782-26]Oreb, B. F. / Netterfield, R. P. / Walsh, C. J. / Freund, C. H. / Leistner, A. J. / Seckold, J. A. / SPIE et al. | 1999
- 246
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Thermally induced distortion of a high-average-power laser system by an optical transport system [3782-27]Chow, R. / Ault, L. E. / Taylor, J. R. / Jedlovec, D. / SPIE et al. | 1999
- 246
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Thermally induced distortion of a high-average-power laser system by an optical transport systemChow, Robert / Ault, Linda E. / Taylor, John R. / Jedlovec, Don et al. | 1999
- 255
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Performance and production requirements for the optical components in a high-average-power laser systemTaylor, John R. / Chow, Robert / Doss, Fred W. / Wong, Jen Nan et al. | 1999
- 255
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Performance and production requirements for the optical components in a high-average-power laser system [3782-28]Taylor, J. R. / Chow, R. / Doss, F. W. / Wong, J. N. / SPIE et al. | 1999
- 266
-
Large-mirror figure measurement by optical profilometry techniquesTakacs, Peter Z. / Qian, Shinan / Kester, Thomas / Li, Haizhang et al. | 1999
- 266
-
Large-mirror figure measurement by optical profilometry techniques [3782-29]Takacs, P. Z. / Qian, S. / Kester, T. / Li, H. / SPIE et al. | 1999
- 275
-
Long trace profiler survey resultsIrick, Steven C. et al. | 1999
- 275
-
Long trace profiler survey results [3782-72]Irick, S. C. / SPIE et al. | 1999
- 283
-
Absolute measurement of surface profiles with phase-shifting projected fringe profilometryLiu, Hongyu / Bard, Benjamin A. / Lu, Guowen / Wu, Shudong et al. | 1999
- 283
-
Absolute measurement of surface profiles with phase-shifting projected fringe profilometry [3782-30]Liu, H. / Bard, B. A. / Lu, G. / Wu, S. / SPIE et al. | 1999
- 291
-
Three-dimensional surface profilometry using structured liquid crystal gratingYamatani, Ken / Fujita, Hiroo / Yamamoto, Masayuki / Suguro, Akira / Otani, Yukitoshi / Morokawa, Shigeru / Yoshizawa, Toru et al. | 1999
- 291
-
Three-dimensional surface profilometry using structured liquid crystal grating [3782-31]Yamatani, K. / Fujita, H. / Yamamoto, M. / Suguro, A. / Otani, Y. / Morokawa, S. / Yoshizawa, T. / SPIE et al. | 1999
- 297
-
Using linear variable differential transformers and ultrasonic transducers to measure flatness and parallelism for NIF opticsBoland, Richard J. et al. | 1999
- 297
-
Using linear variable differential transformers and ultrasonic transducers to measure flatness and parallelism for NIF optics [3782-33]Boland, R. J. / SPIE et al. | 1999
- 306
-
Novel scanning technique for ultraprecise measurement of topographyWeingaertner, Ingolf / Schulz, Michael / Elster, Clemens et al. | 1999
- 306
-
Novel scanning technique for ultraprecise measurement of topography [3782-34]Weingartner, I. / Schulz, M. / Elster, C. / SPIE et al. | 1999
- 320
-
Optical figure testing by scanning deflectometryvan Amstel, Willem D. / Baumer, Stefan M. B. / Horijon, Jef L. et al. | 1999
- 320
-
Optical figure testing by scanning deflectometry [3782-37] [originally published in Optical Fabrication and Testing, Roland Geyl, Jonathan Maxwell, Editors, Proceedings of SPIE Vol. 3739, pp. 283-290 (1999)]van Amstel, W. D. / Baumer, S. M. B. / Horijon, J. L. / SPIE et al. | 1999
- 328
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Knife-edge test for characterization of subnanometer deformations in micro-optical surfacesZamkotsian, Frederic / Dohlen, Kjetil / Lanzoni, Patrick / Mazzanti, Silvio P. / Michel, Marie-Laurence / Buat, Veronique / Burgarella, Denis et al. | 1999
- 328
-
Knife-edge test for characterization of subnanometer deformations in micro-optical surfaces [3782-38]Zamkotsian, F. / Dohlen, K. / Lanzoni, P. / Mazzanti, S. / Michel, M.-L. / Buat, V. / Burgarella, D. / SPIE et al. | 1999
- 337
-
Method of "truss" approximation in wavefront testing [3782-40]Agurok, I. P. / SPIE et al. | 1999
- 337
-
Method of "truss" approximation in wavefront testingAgurok, Il'ya P. et al. | 1999
- 348
-
Efficient testing of off-axis aspheres with test plates and computer-generated holograms [3782-43]Burge, J. H. / SPIE et al. | 1999
- 348
-
Efficient testing of off-axis aspheres with test plates and computer-generated hologramsBurge, James H. et al. | 1999
- 358
-
Error analysis for CGH optical testingChang, YuChun R. / Burge, James H. et al. | 1999
- 358
-
Error analysis for CGH optical testing [3782-45]Chang, Y.-C. / Burge, J. H. / SPIE et al. | 1999
- 367
-
Method and system of compensating test for high-order aspherics [3782-47]Lin, G. / Yi, M. / SPIE et al. | 1999
- 367
-
Method and system of compensating test for high-order asphericsLin, Guanqing / Yi, Meiliang et al. | 1999
- 378
-
Surface profilometry of a thick liquid lens on a solid surface using a high-numerical-aperture phase-shifting laser feedback interferometerFischer, David G. / Ovryn, Ben et al. | 1999
- 378
-
Surface profilometry of a thick liquid lens on a solid surface using a high-numerical-aperture phase-shifting laser feedback interferometer [3782-50]Fischer, D. G. / Ovryn, B. / SPIE et al. | 1999
- 390
-
Visible light interferometer for EUVL system alignment [3782-52]Gaughan, R. J. / SPIE et al. | 1999
- 390
-
Visible light interferometer for EUVL system alignmentGaughan, Richard J. et al. | 1999
- 399
-
Vibration-compensated interferometer for measuring cryogenic mirrors [3782-53]Zhao, C. / Burge, J. H. / SPIE et al. | 1999
- 399
-
Vibration-compensated interferometer for measuring cryogenic mirrorsZhao, Chunyu / Burge, James H. et al. | 1999
- 407
-
Mirror surface testing by optical feedback interferometry using laser diodeLiu, Jiyuan / Yamaguchi, Ichirou et al. | 1999
- 407
-
Mirror surface testing by optical feedback interferometry using laser diode [3782-54]Liu, J. / Yamaguchi, I. / SPIE et al. | 1999
- 415
-
Compound phase-stepping algorithm by Lissajous figures technique and iterative least-squares fitting [3782-55]Wei, C. / Chen, M. / Yuan, C. / Cheng, W. / Wang, Z. / SPIE et al. | 1999
- 415
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Compound phase-stepping algorithm by Lissajous figures technique and iterative least-squares fittingWei, Chunlong / Chen, Mingyi / Yuan, Cao / Cheng, Weiming / Wang, Zhijiang et al. | 1999
- 426
-
Distance measurement using internal cavity interferometerLi, Mengchao / Zhuang, Songlin / Zheng, Gang / Zhang, Ling / Zhao, Xiaorong et al. | 1999
- 426
-
Distance measurement using internal cavity interferometer [3782-57]Li, M. / Zhuang, S. / Zheng, G. / Zhang, L. / Zhao, X. / SPIE et al. | 1999
- 432
-
Phase-shifting via wavelength tuning in very large aperture interferometersDeck, Leslie L. / Soobitsky, James A. et al. | 1999
- 432
-
Phase-shifting via wavelength tuning in very large aperture interferometers [3782-58]Deck, I. I. / Soobitsky, J. A. / SPIE et al. | 1999
- 443
-
Stitching interferometry: side effects and PSDBray, Michael et al. | 1999
- 443
-
Stitching interferometry: side effects and PSD [3782-59]Bray, M. / SPIE et al. | 1999
- 453
-
Polished homogeneity testing of Corning fused silica boules [3782-60]Fanning, A. / Ellison, J. F. / Green, D. E. / SPIE et al. | 1999
- 453
-
Polished homogeneity testing of Corning fused silica boulesFanning, Andrew W. / Ellison, Joseph F. / Green, Daniel E. et al. | 1999
- 464
-
Calculation of an iris size in 24-in. Fizeau interferometerHan, Sen et al. | 1999
- 464
-
Calculation of an iris size in 24-in. Fizeau interferometer [3782-62]Han, S. / SPIE et al. | 1999
- 469
-
Laser alignment for 610-mm large-aperture Fizeau interferometer [3782-62]Han, S. / SPIE et al. | 1999
- 469
-
Laser alignment for 610-mm large-aperture Fizeau interferometerHan, Sen et al. | 1999
- 476
-
Overview of small optics for the National Ignition Facility [3782-63]Aikens, D. M. / Bissinger, H. D. / SPIE et al. | 1999
- 476
-
Overview of small optics for the National Ignition FacilityAikens, David M. / Bissinger, Horst D. et al. | 1999
- 488
-
NIF optical systems design: preamplifier beam transport system optomechanical designLaumann, Curt W. / Korniski, Ronald J. et al. | 1999
- 488
-
NIF optical systems design: preamplifier beam transport system optomechanical design [3782-64]Laumann, C. W. / Korniski, R. J. / SPIE et al. | 1999
- 496
-
Alignment and diagnostics of the National Ignition Facility laser systemBoyd, Robert D. / Bliss, Erlan S. / Boege, Steven J. / Demaret, Robert D. / Feldman, Mark / Gates, Alan J. / Holdener, Fred R. / Hollis, J. / Knopp, Carl F. / McCarville, Tom J. et al. | 1999
- 496
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Alignment and diagnostics of the National Ignition Facility laser system [3782-65]Boyd, R. D. / Bliss, E. S. / Boege, S. J. / Demaret, R. D. / Feldman, M. / Gates, A. J. / Holdener, F. R. / Hollis, J. / Knopp, C. F. / McCarville, T. J. et al. | 1999
- 502
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Implementation of ISO 10110 optics drawing standards for the National Ignition Facility [3782-66]Wang, D. Y. / English, R. E. / Aikens, D. M. / SPIE et al. | 1999
- 502
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Implementation of ISO 10110 optics drawing standards for the National Ignition FacilityWang, David Y. / English, R. Edward / Aikens, David M. et al. | 1999
- 510
-
Surface figure and roughness tolerances for NIF optics and the interpretation of the gradient, P-V wavefront, and RMS specificationsLawson, Janice K. / Aikens, David M. / English, R. Edward / Whistler, Wayne T. / House, Will / Nichols, Michael A. et al. | 1999
- 510
-
Surface figure and roughness tolerances for NIF optics and the interpretation of the gradient, P-V wavefront, and RMS specifications [3782-67]Lawson, J. K. / Aikens, D. M. / English, R. E. / Whistler, W. T. / House, W. / Nichols, M. A. / SPIE et al. | 1999
- 518
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National Ignition Facility small optics laser-induced damage and photometry measurements programSheehan, Lynn M. / Hendrix, James L. / Battersby, Colin L. / Oberhelman, Stan et al. | 1999
- 518
-
National Ignition Facility small optics laser-induced damage and photometry measurements program [3782-68]Sheehan, L. M. / Hendrix, J. L. / Battersby, C. L. / Oberhelman, S. / SPIE et al. | 1999
- 525
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Optical cleanliness specifications and cleanliness verificationStowers, Irving F. et al. | 1999
- 525
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Optical cleanliness specifications and cleanliness verification [3782-69]Stowers, I. F. / SPIE et al. | 1999
- 531
-
NIF small mirror mountsMcCarville, Tom J. et al. | 1999
- 531
-
NIF small mirror mounts [3782-70]McCarville, T. J. / SPIE et al. | 1999
- 537
-
Opto-mechanical assembly procurement for the National Ignition Facility [3782-71]Simon, T. M. / House, W. / SPIE et al. | 1999
- 537
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Opto-mechanical assembly procurement for the National Ignition FacilitySimon, Thomas M. / House, Will et al. | 1999
- 546
-
Mirror replication techniqueZhu, Zheng / Li, Depei / Lu, Feicui / Qiao, Liaoyun et al. | 1999
- 546
-
Mirror replication technique [3782-23]Zhu, Z. / Li, D. / Lu, F. / Qiao, L. / SPIE et al. | 1999
- 554
-
Two error sources in grating projection profilometry: analysis and compensationHao, Yudong / Zhao, Yang / Li, Dacheng et al. | 1999
- 554
-
Two error sources in grating projection profilometry: analysis and compensation [3782-32]Hao, Y. / Zhao, Y. / Li, D. / SPIE et al. | 1999
- 559
-
Simplified spectral imaging using a pair of CCD's with filters for shape measurementDai, Xiaoli L. / Minoshima, Kaoru / Seta, Katuo et al. | 1999
- 559
-
Simplified spectral imaging using a pair of CCDs with filters for shape measurement [3782-35]Dai, X. / Minoshima, K. / Seta, K. / SPIE et al. | 1999
- 567
-
Length-measured method for virtual coordinate measurement by laser tracking systemLiu, Yongdong / Wang, Jia / Liang, Jinwen et al. | 1999
- 567
-
Length-measured method for virtual coordinate measurement by laser tracking system [3782-36]Liu, Y. / Wang, J. / Liang, J. / SPIE et al. | 1999
- 576
-
Any-orientation shear-plate tester by two rotating waysXu, Deyan et al. | 1999
- 576
-
Any-orientation shear-plate tester by two rotating ways [3782-41]Xu, D. / SPIE et al. | 1999
- 585
-
Testing pulse laser wavefront radius of curvature using large shearing interference with four platesChen, Shuqin et al. | 1999
- 585
-
Testing pulse laser wavefront radius of curvature using large shearing interference with four plates [3782-42]Chen, S. / SPIE et al. | 1999
- 591
-
Tolerancing and testing of CGH aspheric nulls [3782-44]Curatu, E. O. / Wang, M. / SPIE et al. | 1999
- 591
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Tolerancing and testing of CGH aspheric nullsCuratu, Eugene O. / Wang, Min et al. | 1999
- 601
-
Interferometric alignment and figure testing of large (0.5 m) off-axis parabolic mirrors in a challenging cleanroom environment [3782-46]Barkhouser, R. H. / Ohl, R. G. / SPIE et al. | 1999
- 601
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Interferometric alignment and figure testing of large (0.5 m) off-axis parabolic mirrors in a challenging cleanroom environmentBarkhouser, Robert H. / Ohl, Raymond G. et al. | 1999
- 615
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Simple mirror interferometers for optics testingPopov, Yevgen G. et al. | 1999
- 615
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Simple mirror interferometers for optics testing [3782-48]Popov, E. G. / SPIE et al. | 1999
- 619
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3D profilometry based on the white light interferometer for rough surfacesRyoo, Seok-moon / Seong, Yeong K. / Choi, Tae-Sun et al. | 1999
- 619
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3D profilometry based on the white light interferometer for rough surfaces [3782-51]Ryoo, S. / Seong, Y. K. / Choi, T. S. / SPIE et al. | 1999
- 627
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Precision calibration and systematic error reduction in the long trace profilerQian, Shinan / Sostero, Giovanni / Takacs, Peter Z. et al. | 1999
- 627
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Precision calibration and systematic error reduction in the long trace profiler [3782-74]Qian, S. / Sostero, G. / Takacs, P. Z. / SPIE et al. | 1999