Electronmicroscopic characterization of microcrystalline silicon thin films deposited by ECR-CVD (English)
- New search for: Sieber, I.
- New search for: Wanderka, N.
- New search for: Kaiser, I.
- New search for: Fuhs, W.
- New search for: Czechoslovak Society for Electron Microscopy
- New search for: Sieber, I.
- New search for: Wanderka, N.
- New search for: Kaiser, I.
- New search for: Fuhs, W.
- New search for: Czechoslovak Society for Electron Microscopy
In:
European congress on electron microscopy
;
P493-P494
;
2000
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ISBN:
- Conference paper / Print
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Title:Electronmicroscopic characterization of microcrystalline silicon thin films deposited by ECR-CVD
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Contributors:Sieber, I. ( author ) / Wanderka, N. ( author ) / Kaiser, I. ( author ) / Fuhs, W. ( author ) / Czechoslovak Society for Electron Microscopy
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Conference:12th, European congress on electron microscopy ; 2000 ; Brno, Czech Republic
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Published in:European congress on electron microscopy ; P493-P494PROCEEDINGS OF THE EUROPEAN CONGRESS ON ELECTRON MICRISCOPY ; 2 ; P493-P494
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Publisher:
- New search for: Czechoslovak Society for Electron Microscopy
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Publication date:2000-01-01
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Size:P493-P494
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Remarks:Also known as EUREM 2000
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ISBN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
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Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- P1
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TEM of nanostructured materialsVan Tendeloo, G. / Pauwels, B. / Geuens, P. / Lebedev, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P9
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TEM analysis of atomic structures of metals and alloysKarnthaler, H. P. / Mingler, B. / Rentenberger, C. / Waitz, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P13
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Structural and analytical characterization of advanced metallic systemsNeumann, W. / Wanderka, N. / Schumacher, G. / Schneider, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P17
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Microstructure of model Ni-based superalloys with CoBursik, J. / Svoboda, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P19
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Precipitation at early stage during aging in Al-Mg-Si alloysMatsuda, K. / Kawabata, T. / Sato, T. / Kamio, A. / Ikeno, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P21
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Structure studies of GP-zones in the Al-Zn-Mg alloy systemBerg, L. K. / Hansen, V. / Knutson-Wedel, M. / Wallenberg, L. R. / Schryvers, D. / Langsrud, Y. / Gjonnes, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P23
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ELNES in a substitutional alloy: the Cu-Ni systemClair, S. / Hebert-Souche, C. / Eisenmenger-Sittner, C. / Bangert, H. / Schattschneider, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P25
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Alloying distribution as probe of rapidly solidification analysis in welded joints of Alloy 600Buso, S. J. / de Almeida Filho, A. / Monteiro, W. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P27
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Alloy Elements Distribution on a PM Tool SteelBorro, A. / Monteiro, W. A. / Vatavuk, J. / Almeida, F. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P29
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SEM Study of Pipes Annealing from 100Cr6 SteelGojic, M. / Kosec, L. / Matkovic, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P31
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TEM-STEM analysis of ultrafine precipitation and segregation in pearlitic structure of microalloyed steelKhalid, F. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P33
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TEM study of the P phase in model Ni-based superalloysBursik, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P35
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Microstructural study of plasma sprayed coatings on Ni-Cr-Al alloysSvoboda, M. / Bursik, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P37
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A SEM study on direct relationship between exogeneous inclusions and surface defects in steelsTekin, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P39
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HRTEM investigation of precipitates in a Cu-Ag alloyMingler, B. / Berger, A. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P41
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Measurements of a stacking fault energy of stainless steelsWasilkowska, A. / Rodak, K. / Hetmanczyk, M. / Czyrska-Filemonowicz, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P43
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Reversed martensitic transformation in a composite-like Fe-30%Ni alloyCiura, F. / Wasilkowska, A. / Osuch, W. / Czyrska-Filemonowicz, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P45
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TEM investigations of gamma' and gamma" precipitates in IN706 alloyDubiel, B. / Penkalla, H. J. / Wosik, J. / Lucki, M. / Czyrska-Filemonowicz, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P47
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Electron Microscopy of an MA-treated ternary alloy, Mg~0~.~3~3Ni~0~.~3~3Ti~0~.~3~3Kitano, Y. / Yamada, K. / Miyamoto, M. / Orimo, S. / Fujii, H. / Aono, K. / Tanabe, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P49
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Electron Microscopy of an MA-treated ternary alloy, Mg~0~.~5Ni~0~.~2~5Pd~0~.~2~5Kitano, Y. / Miyamoto, M. / Yamada, K. / Orimo, S. / Fujii, H. / Aoki, M. / Kawasaki, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P51
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TEM studies of precipitates in a melt-spun Cu-Al-Ni-Mn-Ti shape memory alloyStroz, D. / Lelatko, J. / Morawiec, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P53
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Solute drag effect on the grain growth kinetics of the Ti-0.2Pd alloysGil, F. J. / Manero, J. M. / Marsal, M. / Ginebra, M. P. / Planell, J. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P55
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TEM studies of precipitates in creep deformed 9-10%Cr steelsZielinska-Lipiec, A. / de Sas Stupnicka, H. / Ennis, P. J. / Czyrska-Filemonowicz, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P57
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Relationship between microstructure and thermomechanical properties of Cu-Al-Ni shape memory alloys obtained by powder metallurgyRodriguez, P. P. / Perez-Saez, R. B. / Recarte, V. / Juan, J. S. / No, M. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P59
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Connection between surface layer structure on highly dispersed aluminium powders and whisker formation upon the particlesZaporina, N. / Korsaks, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P61
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Different types of carbide in austempered ductile cast ironHonarbakhsh-Raouf, A. / Edmonds, D. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P65
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Dislocation core geometry and mechanical strength in Ni~3Al compoundsKruml, T. / Spatig, P. / Martin, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P69
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Interaction between a mechanical twin and a twin interface in a PST TiAl alloyCouret, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P73
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The Orthorhombic Ti~2Al Nb PhaseSarosi, P. / Partridge, A. / Jones, I. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P75
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Lattice deformations at martensite-martensite interfaces in Ni-AlBoullay, P. / Schryvers, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P77
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The sequence of phase formation in Al-Pt thin films by continuously varying compositionKovacs, A. / Barna, P. B. / Labar, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P79
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TEM identification of dislocations originated above and below the peak temperature in [001] oriented Ni~3AlLang, C. / Rentenberger, C. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P81
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The study of microstructure of gamma titanium alluminides treated by melts flux methodSkrinsky, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P83
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Anti-phase-boundary structures in a Fe-Al alloyKorner, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P85
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Weak-beam observation of dislocation core in Ni~3(Al, Hf)Kruml, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P87
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A HREM study of Ni~1~0Sn~5P~3Garcia-Garcia, F. J. / Larsson, A. K. / Furuseth, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P89
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TEM contrast of APB-tubes in Ni~3Al caused by a non-crystallographic displacement vectorRentenberger, C. / Lang, C. / Waitz, T. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P91
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Microstructure of MeV Ni-ion implanted aluminiumHessler-Wyser, A. / Cuenat, A. / Dobeli, M. / Gotthardt, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P93
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TEM investigation of dislocation reactions in a gamma' Ni base alloy above the peak temperatureBayreder, C. / Rentenberger, C. / Karnthaler, H. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P97
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Electron microscopy for studying interfacial chemistry in metal-oxide compositesBackhaus-Ricoult, M. / Imhoff, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P101
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Characterization of ceramic materials by electron microscopy techniquesSigle, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P105
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Quantitative composition analysis of every atomic column in ceramic devices using HAADF-STEMKawasaki, M. / Yamazaki, T. / Watanabe, K. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P107
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Analysis of segregation behaviour of grain boundaries in alpha-Al~2O~3 by analytical and high-resolution TEMNufer, S. / Gemming, T. / Kurtz, W. / Ruhle, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P109
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TEM and EELS investigations of new Ti-rich Ba-Ti-O phasesSchneider, R. / Graff, A. / Senz, S. / Zakharov, N. D. / Hesse, D. / Neumann, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P111
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Natural and synthetic mesoporous materialsEspinosa, M. E. / Yacaman, M. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P113
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Quantitative composition analysis of every atomic column in materials using HAADF-STEMShiojiri, M. / Kawasaki, M. / Yamazaki, T. / Watanabe, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P115
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Quantitative composition analysis of every atomic column in As-implanted Si crystals using HAADF-STEMYamazaki, T. / Watanabe, K. / Kikuchi, Y. / Kawasaki, M. / Hashimoto, I. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P117
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Deformation mechanism of fine-grained ZrO~2 and Al~2O~3 with additivesKumao, A. / Okamoto, Y. / Endoh, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P119
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(Ti,Zr)~x Si~y silicides (S2) as a reaction and diffusion barrier in titanium matrix composites investigated by analytical TEMDudek, H. J. / Weber, K. / Borath, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P121
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Second and ternary silicium rich phases identified by TEM in MMC reinforced with alumina, after heat treatmentsde Salazar, J. M. G. / Baldonedo, J. L. / Barrena, M. I. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P123
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Carbon fiber/carbon matrix (CFC) composites: microstructure and influence of hot isostatic pressure treatmentsReznik, B. / Gerthsen, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P125
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High-temperature superconducting polymer-ceramic compositions and the morphological peculiaritiesHayrapetyan, S. M. / Tonoyan, A. O. / Davtyan, S. P. / Hasratyan, L. K. / Israyelyan, V. R. / Hovnanyan, K. O. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P127
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Microstructural characterization of aluminium phosphate sealed Al~2O~3 coatingVippola, M. / Ahmaniemi, S. / Keranen, J. / Lepisto, T. / Mantyla, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P129
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X-ray mapping of cement clinker using SEM and NMPEmanuelson, A. / Elfman, M. / Hansen, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P131
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WDX microprobe quality analysis of solidified refinery waste used for the cement productionPetric, B. / Danjanovic, S. / Jovanic, P. / Kovacevic, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P133
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Modeling of the SiC wetting process using morphological analysis of the SEM imagesStankovic, D. G. / Jovanic, P. B. / Markovic, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P135
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Structure and hardening in Al~2O~3-Cr~2O~3 system studied by TEMLelatko, J. / Gigla, M. / Niihara, K. / Morawiec, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P137
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Boron nitride films deposited by RF magnetron sputteringYoshizawa, I. / Watanabe, K. / Kondo, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P139
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Flexibility in the Ba-Co-O SystemGonzalez-Calbet, J. M. / Boulahya, K. / Parras, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P141
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EPMA study of PLZT ceramicsSamardzija, Z. / Marinenko, R. B. / Bernik, S. / Malic, B. / Ceh, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P143
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Aluminium matrix composites reinforced by ceramic preformsMartinez-Cores, C. / Gutierrez-Urrutia, I. / Juan, J. S. / No, M. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P147
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Magnetic thin films and nanostructures: structure- property correlations at relevant length scalesKrishnan, K. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P151
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TEM Study of novel Sm-Co based high temperature magnetsFidler, J. / Schrefl, T. / Matthias, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P155
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Observation of magnetisation reversal processesZweck, J. / Schneider, M. / Henzelmann, S. / Uhlig, T. / Heumann, M. / Sattler, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P159
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Imaging magnetic nanostructuresChapman, J. N. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P163
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New methodical ways in the investigation of magnetic nanostructures by using off-axis electron holographyHuhle, R. / Goldberg, R. / Lichte, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P165
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Study of antiferromagnetic domains in LaFeO~3 thin filmsSeo, J. W. / Fompeyrine, J. / Siegwart, H. / Scholl, A. / Nolting, F. / Stohr, J. / Locquet, J.-P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P167
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In-situ observation of re- and demagnetisation processes of a thin magnetic film between micron structured tunnel elementsHenzelmann, S. / Uhlig, T. / Heumann, M. / Bruckl, J. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P169
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Lorentz transmission electron microscopy of micron and submicron permalloy elementsSchneider, M. / Hoffmann, H. / Weiss, D. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P171
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New techniques for investigation of magnetic structures with applied magnetic inplane fields in Lorentz TEMHeumann, M. / Uhlig, T. / Schneider, M. / Hoffmann, H. / Zweck, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P173
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Effect of laser irradiation on microstructure of Ag-Co magnetoresistive granular filmsAgostinelli, E. / Caliendo, C. / Fiorani, D. / Testa, A. M. / Antisari, M. V. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P175
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Cross sectional transmission electron microscopic investigation of thin films for perpendicular magnetic recording mediaRadnoczi, G. / Czigany, Z. / Barna, P. B. / Adamik, M. / Ariake, J. / Honda, N. / Ouchi, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P179
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Charge ordering and phase transitions in perovskite manganites: correlation with CMR propertiesHervieu, M. / Martin, C. / Van Tendeloo, G. / Mercey, B. / Maignan, A. / Jirak, Z. / Raveau, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P183
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The role of electron microscopy in the research on structure-properties relations of perovskitesZandbergen, H. W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P187
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New type of charge-order structure in Pr~0~.~6~2~5Ca~0~.~3~7~5MnO~3 examined by low-temperature electron diffraction and microscopyAsaka, T. / Tsutsumi, S. / Yamada, S. / Arima, T. / Tsuruta, C. / Kimoto, K. / Matsui, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P189
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Substitution, phase relations, and structure in La-Sr-Fe-OBardal, A. / Vullum, P. E. / Bredesen, R. / Menon, M. / Grande, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P191
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Oxidation mechanism and ferroelectricity in La~2Ti~2O~7 thin filmsSeo, J. W. / Fompeyrine, J. / Siegwart, H. / Locquet, J.-P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P193
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Structural changes in fluorinated T' and T^* phasesHadermann, J. / Abakumov, A. M. / Lebedev, O. I. / Antipov, E. V. / Van Tendeloo, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P195
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HRTEM study of cation-deficient-related A~nB~n~-~d~e~l~t~aO~3~n (n>or=4delta) microphases (A=La, Ba, Sr and B=Ti, Nb)Teneze, N. / Trolliard, G. / Mercurio, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P197
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TEM investigation of intergrowths in the Aurivillius phasesBoullay, P. / Trolliard, G. / Manier, M. / Soulestin, B. / Mercurio, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P199
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Influence of oxygen content on the charge-ordering process in La~0~.~5Ca~0~.~5MnO~3Schuddinck, W. / Van Tendeloo, G. / Martin, C. / Hervieu, M. / Raveau, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P201
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Strained La~1~-~xSr~xMnO~3 (x=0.1-0.3) thin films studied by HREMLebedev, O. I. / Van Tendeloo, G. / Amelinckx, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P203
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Light element analysis in oxycarbonate superconductor using TEM-EELS with gain correctionKimoto, K. / Anan, Y. / Asaka, T. / Muromachi, E. / Matsui, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P205
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Structure studies of Sr~3(Sr~1~+~xNb~2~-~x)O~9~-~3~/~2~x by use of analytical TEMGunnaes, A. E. / Fjellvag, H. / Glockner, R. / Goringe, M. / Norby, T. / Olsen, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P207
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TEM investigation of manganite thin films on different substratesBrand, K. / Lehmann, M. / Walter, T. / Dorr, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P209
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TEM analysis of the reduction / reoxidation process in donor-doped BaTiO~3Makovec, D. / Drofenik, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P211
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Study of the (La, Sr)(Fe, Al)O~3/YSZ interface by EDS analysisKuscer, D. / Bernik, S. / Holc, J. / Hrovat, M. / Kolar, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P213
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Electron holography of ferroelectricsLichte, H. / Reibold, M. / Schulze, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P215
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New brownmillerite related phases in the La-Ba-Sr-Cu-Ga-O systemRuiz-Gonzalez, M. L. / Ramirez-Castellanos, J. / Gonzalez-Calbet, J. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P217
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New structural frameworks and ordering phenomena in the Bi-Sr-M-O system (M=Co,Mn)Pelloquin, D. / Masset, A. C. / Hervieu, M. / Michel, C. / Raveau, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P219
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Analytical electron microscopy (AEM) of isolated planar faults and ordered polytypic sequences in polycrystalline CaTiO~3Ceh, M. / Recnik, A. / Kawasaki, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P221
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EDS study of planar faults in SrO doped SrTiO~3Sturm, S. / Recnik, A. / Scheu, C. / Ceh, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P225
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Quantitative electron diffraction study of single-wall carbon nanotubesHenrard, L. / Loiseau, A. / Journet, C. / Bernier, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P227
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Low dimensional crystallisation behaviour within single walled carbon nanotubes revealed by HRTEMSloan, J. / Hutchison, J. L. / Green, M. L. H. / Dunin-Borkowski, R. E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P229
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Multicomponent and multiphase nanotubes: BN, BN-C and filled tubesWillaime, F. / Loiseau, A. / Demoncy, N. / Suenaga, K. / Colliex, C. / Pascard, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P233
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Spatially resolved EELS study of surface plasmons in locally highly anisotropic nanotubes and nanospheresKociak, M. / Stephan, O. / Henrard, L. / Suenaga, K. / Sandre, E. / Colliex, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P235
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Single- and multi-walled nanotubes in the B-C-N system explored by HRTEM and EELSGolberg, D. / Bando, Y. / Bourgeois, L. / Kurashima, K. / Sato, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P237
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The cross-sectional structure of vanadium oxide nanotubesKrumeich, F. / Muhr, H.-J. / Niederberger, M. / Bieri, F. / Nesper, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P239
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Crystallic peculiarities of carbon fibers formed on Fe-catalystBlank, V. / Kulnitskiy, B. / Batov, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P241
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Electron energy-loss spectroscopy investigation of CN nanostructuresTrasobares, S. / Raty, R. / Sikora, T. / Hug, G. / Colliex, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P243
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TEM and STM characterization of CN~x thin films deposited from DC arcRadnoczi, G. / Safran, G. / Kovacs, I. / Geszti, O. / Biro, L. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P245
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TEM investigation of nano-structured carbon filmsReibold, M. / Meyer, C.-F. / Schultrich, B. / Schultrich, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P247
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TEM simulation of nano-structured carbon filmsSchultrich, H. / Schultrich, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P249
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Structural investigations on carbon nanofibres produced by catalytic chemical vapour depositionGraff, A. / Edelmann, J. / Ritschel, M. / Leonhardt, A. / Pippel, E. / Woltersdorf, J. / Fink, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P251
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Chemically sensitive imaging of hard coatings by XANES-spectromicroscopyZiethen, C. / Schmidt, O. / Escher, M. / Merkel, M. / Schonhense, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P253
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TEM and AFM characterisation of carbon nanotubes ropesHamon, A.-L. / Marraud, A. / Jouffrey, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P255
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Si(001) substrate allows the coherent growth of a new carbon nitride phaseBarucca, G. / Majni, G. / Mengucci, P. / Leggieri, G. / Luches, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P257
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High yield incorporation of ZrCl~4 into single wall carbon nanotubes imaged by HRTEMBrown, G. / Bailey, S. R. / Sloan, J. / Coleman, K. S. / Williams, V. C. / Hutchison, J. L. / Dunin-Borkowski, R. E. / Green, M. L. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P259
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HRTEM studies of alkali halides incorporated into single walled carbon nanotubesBailey, S. R. / Sloan, J. / Novotny, M. C. / Brown, G. / Williams, V. C. / Hutchison, J. L. / Dunin-Borkowski, R. E. / Green, M. L. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P261
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Catalyst free synthesis of BN single-wall nanotubes by laser ablationGavillet, J. / de la Chapelle, M. L. / Cochon, J. L. / Pigache, D. / Loiseau, A. / Willaime, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P263
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BN ropes and nanotubes: elaboration and mechanical behaviourLaude, T. / Jouffrey, B. / Gevrey, S. / Marraud, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P267
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Scanning electron microscopy of epitaxial structuresMerli, P. G. / Migliori, A. / Morandi, V. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P271
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HRTEM of epitaxial structures from high-Tc materialsVerbist, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P275
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Structural characterisation of (GaIn)(NAs)/GaAs multi-quantum wells grown by MOVPEVolz, K. / Schaper, A. K. / Hasse, A. / Weirich, T. E. / Hohnsdorf, F. / Koch, J. / Stolz, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P277
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Study of the effect of vertical size uniformity on diffraction contrast images of stacked In~xGa~1~-~xAs/GaAS quantum dotsTaurino, A. / Catalano, M. / De Giorgi, M. / Passaseo, A. / Cingolani, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P279
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Extracting structural parameters of quantum dotsLiao, X. Z. / Zou, J. / Cockayne, D. H. J. / Leon, R. / Lobo, C. / Jiang, Z. M. / Wang, X. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P281
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Influence of the growth duration on the In concentration in epitaxial InGaN layersNeubauer, B. / Rosenauer, A. / Gerthsen, D. / Schon, O. / Heuken, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P283
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HRTEM study of the structure of nanoparticles of beta-zeoliteLuibich, E. / Talianker, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P285
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Effect of oxygen treatment of epitaxial (001) SrTiO~3 thin filmsRyen, L. / Petrov, P. K. / Ivanov, Z. G. / Olsson, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P287
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CoSi~2 growth on Si~1~-~xC~x(001) substratesFalke, M. / Teichert, S. / Giesler, H. / Beddies, G. / Hinneberg, H.-J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P289
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TEM on wurtzite AlN films on Si(001) substratesJinschek, J. / Kaiser, U. / Lebedev, V. / Richter, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P291
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Investigation of rocksalt surfaces as substrate for epitaxial growth of thin films after treatment with water and chlorine gasOtt, P. / Gunter, J. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P293
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Electron microscopy investigations of the growth of manganese silicide films on Si(001)Mogilatenko, A. / Falke, M. / Teichert, S. / Sarkar, D. / Hinneberg, H.-J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P295
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TEM investigations of self-organization phenomena in stacked InAs/GaAs quantum dotsKirmse, H. / Schneider, R. / Neumann, W. / Steimetz, E. / Richter, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P297
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Nanostructure of epitaxial ReSi~1~.~7~5 thin films on SiHofman, D. / Kleint, C. / Thomas, J. / Wetzig, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P299
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Direct strain measurements in InP/GaInP quantum dots by HREMJin-Phillipp, N. Y. / Phillipp, F. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P301
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Defects and nanowire formation on TiTe~2 layered crystalsDieker, C. / Adelung, R. / Kipp, L. / Skibowski, M. / Jager, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P303
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HRTEM image processing analysis of nanocrystalline iron-titanium powdersTonejc, A. M. / Djerdj, I. / Tonejc, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P305
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Application of TEM energy filtered measurements to the study of Ge redistribution in ion-implanted thin SiO~2 filmsKlimenkov, M. / Borany, J. v. / Matz, W. / Schulze, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P307
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HRTEM of epitaxial growth of Ni-rich Ni-Al thin films onto AgYandouzi, M. / Schryvers, D. / Toth, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P309
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Micro-, atomic and surface structure of epitaxial silver thin films evaporated onto NaClYandouzi, M. / Cannaerts, M. / Van Haesendonck, C. / Toth, L. / Schryvers, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P311
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TEM Study of BaTiO~3 films used as wave guidesLei, C. / Jia, C. L. / Siegert, M. / Urban, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P313
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A transmission electron microscopy study of the depth distribution of excess Ga or As during recrystallisation of amorphous GaAsLlewellyn, D. J. / Belay, K. B. / Ridgway, M. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P317
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Polymer microscopy in the year 2000 and beyondMartin, D. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P321
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New microscopic methods to study morphology and micromechanical processes in polymersMichler, G. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P325
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Cryo-TEM of composite latex particles containing silica beadsPutaux, J. L. / Chalaye, S. / Bourgeat-Lami, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P327
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Electron holography of polymersSimon, P. / Huhle, R. / Lichte, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P329
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Ultrathin sectioning of polymeric materials for low-voltage transmission electron microscopyLednicky, F. / Hromadkova, J. / Pientka, Z. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P331
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Evaluation of crystal structure and morphology of liquid crystal polymers by EM and EDRybnikar, F. / Saha, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P335
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SEM investigation of syndiotactic polystyrene blended with olefinic polymers and copolymersBraglia, R. / Pirato, S. / Abis, L. / Giannotta, G. / Po , R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P337
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Structural characterization of reconstituted TF55-alpha oligomersKoeck, P. J. B. / Sliauzyte, J. / Tibbelin, G. / Hebert, H. / Ladenstein, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P339
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Modes of deformation in rubber toughened syndiotactic polystyreneHeckmann, W. / Ramsteiner, F. / McKee, G. E. / Geprags, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P341
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XTEM study of Er implanted LiNbO(3) crystalBlanchin, M. G. / Moretti, P. / Teodorescu, V. S. / Ghica, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P343
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Cryo-TEM of chiral aggregates formed by achiral dye moleculesBerlepsch, H. v. / Kirstein, S. / Burger, C. / Ouart, A. / Dahne, S. / Bottcher, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P345
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SiO~2-supported metallocene catalysts for propene polymerization: electron microscopic studies and tomographical reconstructions of polymer growthSteinmetz, B. / Weimann, B. / Fink, G. / Tesche, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P347
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Catalytical and electron microscopic investigations of heterogeneous Ziegler-catalysts fixed on two-dimensional model-supportsHahn, S. / Fink, G. / Tesche, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P351
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Designing meso- and nanostructures for catalysisWallenberg, L. R. / Skarman, B. / Klint, D. / Lundberg, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P355
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Bimetallic particles elaborated by sequential impregnations of oxide powdersGiorgio, S. / Henry, C. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P357
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Imaging of Ni particles in steam reforming catalystsCarlsson, A. / Datye, A. K. / Janssens, T. V. W. / Sehested, J. / Hansen, P. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P359
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Nanoscale characterisation of TWC-model catalystsCalvino, J. J. / Gatica, J. M. / Lopez-Cartes, C. / Mira, C. / Perez-Omil, J. A. / Rodriguez-Izquierdo, J. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P363
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Characterisation of silicon nanocrystals and Er^3^+ in silicaSharma, N. / Chryssou, C. / Kenyon, A. J. / Pitt, C. W. / Humphreys, C. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P365
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CdSe nanoparticle layers buried in SiO~x thin filmsHofmeister, H. / Nesheva, D. / Levi, Z. / Hopfe, S. / Matthias, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P367
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Cherry-like bimetallic PdPb supported particlesAires, F. J. C. S. / Touroude, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P369
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Gold particles supported on TiO~2 (anatase)Giorgio, S. / Henry, C. R. / Pauwels, B. / Van Tendeloo, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P371
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Imaging and analysis of protein-supported metallic nanoparticles by a modified transmission electron detector and EDX in a FE-SEMHabicht, W. / Behrens, S. / Boukis, N. / Dinjus, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P373
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Preparation, structure, and sintering of nickel nanoparticlesStappert, S. / Fell, C. / Zahres, H. / Rellinghaus, B. / Wassermann, E. F. / Sauer, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P375
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Nanoscale Ag particles in glass studied by HREM and EXAFSDubiel, M. / Mohr, C. / Brunsch, S. / Hofmeister, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P377
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The effect of reoxidation treatments on metal-support interaction effects in Rh/cerium oxide catalystsBernal, S. / Calvino, J. J. / Cauqui, M. A. / Colliex, C. / Lopez-Cartes, C. / Perez-Omil, J. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P379
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Microstructure of nanocrystalline phosphorsAllsop, N. A. / Wakefield, G. / Hutchison, J. L. / Dobson, P. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P381
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Electrostatic spray pyrolysis of CdS, ZnO and In~2O~3Gledhill, S. E. / Hutchison, J. L. / Dobson, P. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P383
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Structural properties of Au clusters on MgOPauwels, B. / Van Tendeloo, G. / Bouwen, W. / Kuhn, L. T. / Lievens, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P385
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TEM characterization of TiO~2 nanoparticles synthesized in a tube flow reactorRichard, O. / Ahonen, P. P. / Joutsensaari, J. / Kauppinen, E. I. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P387
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Characterization of CoMo catalysts containing zeolitesBerti, D. / Ferrari, M. / Zanibelli, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P389
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Preparation and investigation of nanoscaled gold catalysts supported on TiO~2, SiO~2 and MCM41Pohl, M.-M. / Schulke, U. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P391
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Evidence for inter-grain diffusion of Pt[NH~3]~4^2^+ species during Pt/SiO~2 catalyst preparation by ionic exchangeAouine, M. / Goguet, A. / Aires, F. J. C. S. / Candy, J. P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P393
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Evidence for the formation of a thin surface SiO~x layer on Si~3N~4 during methane's partial oxidation reactions at high temperatureAires, F. J. C. S. / Monnet, F. / Bertolini, J. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P395
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Study of bimetallic Pd~8~0Au~2~0 films obtained by cluster beam deposition as the early stages of H~2 separation membranes formationAires, F. J. C. S. / Rousset, J. L. / Szkutnik, P. D. / Bergeret, G. / Renouprez, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P397
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SEM/EDS analysis of the surface reaction layer of BaTiO~3 ceramics exposed to a fluorine-containing atmosphereUle, N. / Makovec, D. / Drofenik, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P399
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TEM study of Ti doped ZSM-5 zeoliteKlimenkov, M. / Nepijko, S. A. / Bao, X. / Matz, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P401
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Electron beam induced structural variations of divanadium pentoxide (V~2O~5) crystalsWieske, M. / Su, D. / Beckmann, E. / Blume, A. / Schlogl, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P405
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Studying interfaces by high resolution transmission electron microscopy: possibilities and limits through some examplesRouviere, J.-L. / Arlery, M. / Charleux, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P409
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Quantification of segregation to grain boundaries and diffusion at interfaces by energy-filtered transmission electron microscopyWalther, T. / Barf, J. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P413
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A combined approach of analytical and high-resolution TEM to determine the interface structure of Cu/(1120) alpha-Al~2O~3Scheu, C. / Stein, W. / Schweinfest, R. / Wagner, T. / Ruhle, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P415
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Characterization of the interface between lanthanum hexaaluminate and sapphire by exit wave reconstructionSteinecker, A. / Wessler, B. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P417
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Volume expansion of Sigma3 coherent twin grain boundary in MoVystavel, T. / Gemperlova, J. / Gemperle, A. / Penisson, J. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P419
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Investigations of substitutional impurity segregation to the Sigma 5(310)/[001] STGB in FCC metals: a EFTEM and HRTEM studyPlitzko, J. M. / Campbell, G. H. / King, W. E. / Foiles, S. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P421
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Electronic structure investigations of metal/strontiumtitanate interfacesvan Benthem, K. / Scheu, C. / Sigle, W. / Ruhle, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P423
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Strain fields near the plate-like oxygen precipitate/Si-matrix interfaceOkuyama, T. / Matsunaga, K. / Nakayama, M. / Tomokiyo, Y. / Mori, K. / Van der Biest, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P425
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Dynamical microstructure change with diffusion at metal/metal interface during electron irradiationTakahashi, H. / Ohta, S. / Shibayama, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P427
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Grain boundaries in highly anisotropic silicon nitride: `special' grain boundariesBrito, M. E. / Watari, K. / Hirao, K. / Toriyama, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P429
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TEM, photoetching and AFM study of Cu-diffused GaAsFrigeri, C. / Weyher, J. L. / Muller, S. / Hiesinger, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P431
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SEM investigation of electromigration damage in small copper interconnects - influence of microstructure and local orientationWendrock, H. / Menzel, S. / Koetter, T. / Wetzig, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P433
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Solid-state reactions between BaTiO~3(001) substrates and SiO~2 thin films studied by TEMGraff, A. / Senz, S. / Zakharov, N. D. / Hesse, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P435
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Structure and composition of inversion boundaries in Sn-doped ZnODaneu, N. / Walther, T. / Recnik, A. / Bernik, S. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P437
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Charge balance models for inversion boundaries in ZnORecnik, A. / Ceh, M. / Daneu, N. / Walther, T. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P439
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Comparing empirical crystal chemistry methods with ab-initio simulations of the Sigma5 grain boundary in SrTiO~3Zaborac, J. A. / Browning, N. D. / Kim, M. / Duscher, G. / Chisholm, M. F. / Pennycook, S. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P441
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SEM analysis in a study of the processes occuring on metal-mould contact surfaceJanjusevic, Z. / Kovacevic, K. / Acimovic, Z. / Pavlovic, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P443
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Interpretation of HREM-images of projected 3D misfit dislocation networks using a combined molecular statics and multislice approachLevay, A. / Mobus, G. / Vitek, V. / Ruhle, M. / Tichy, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P445
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HREM of an heterophase interface: artifacts in the distance profile measurementLamy, M. / Thibault, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P449
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Refinement of amorphous structures using modelling, microscopy and diffractionCockayne, D. / McKenzie, D. / McBride, W. / McCulloch, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P453
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HRTEM investigation of stable quasicrystalsBeeli, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P457
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Determination of the medium range structure of amorphous foils from inelastically filtered images using inelastic transfer functionsKnippelmeyer, R. / Kohl, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P459
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ESI on amorphous materials in the systems Si-B-N-C and Si-B-OAssenmacher, W. / Mader, W. / Kroschel, M. / Friede, B. / Jansen, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P461
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HREM of crystals with unusual internal lattice bending formed in amorphous filmsKolosov, V. Y. / Tholen, A. R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P463
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Imaging and analysis of erbium B-phase glass-ceramicsMenke, Y. / Falk, L. K. L. / Hampshire, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P465
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Structural and spectroscopic characterisation of amorphous silicon suboxidesSchulmeister, K. / Walther, T. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P467
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Quasicrystal formation in (001) Cu/Al/Fe thin layersSafran, G. / Labar, J. L. / Barna, P. B. / Grenet, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P469
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RDF of amorphous materials from diffraction patterns measured in the energy filtering transmission electron microscopeSchulze, S. / Stenzel, O. / Deutschmann, S. / Hietschold, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P473
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The use of modern electron crystallography to probe the molecular parameters of two dimensional SHG chromophoresVoigt-Martin, I. G. / Kothe, H. / Yakimanski, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P477
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Direct methods for phase determination in protein electron crystallographyDorset, D. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P481
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Structure determination of an organo-metallic saltFryer, J. R. / Boyce, G. / Gilmore, C. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P483
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Obtaining the correct polarity of GaN using CBEDSharma, N. / Tricker, D. / Humphreys, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P485
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Reduction of electron diffraction data for structure refinementWilke, U. / Mader, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P487
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Measurement of oxygen concentration and charges of YBa~2Cu~3O~y by means of energy filtering convergent-beam electron diffractionAkase, Z. / Tomokiyo, Y. / Watanabe, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P489
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Unequivocal determination of lattice parameters from CBEDHeinrich, H. / Vananti, A. / Kostorz, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P491
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Micro-characterisation and orientation-relationship of two carbide-phases of S 6-5-2-5- high speed steelPapst, I. / Warbichler, P. / Hofer, F. / Prantl, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P493
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Electronmicroscopic characterization of microcrystalline silicon thin films deposited by ECR-CVDSieber, I. / Wanderka, N. / Kaiser, I. / Fuhs, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P495
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The origin of anomalous spots in the electron diffraction patterns of diamond filmsNistor, L. / Teodorescu, V. / Van Landuyt, J. / Ralchenko, V. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P497
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Accelerated growth of C-54 TiSi~2 via template mechanism in the poly-Si(Mo)/Ti systemGribelyuk, M. / Kittl, J. A. / Samavedam, S. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P499
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LACBED and HRTEM methods for structure and defects determination in (Al, Cu)~3Ti ordered intermetallicJezierska, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P501
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Structural investigations of CuIn~3Se~5 by TEMTham, A. T. / Su, D. S. / Neumann, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P503
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Composite incommensurate phases in Pb-Cr-S(I) systemGomez-Herrero, A. / Landa-Canovas, A. R. / Otero-Diaz, L. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P505
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The alpha-AlFeMnSi structure studied by crystallographic image processingGigla, M. / Morawiec, H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P507
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Characteriazation of the Burgers vector of dislocations from bend contoursMorniroli, J. P. / Cordier, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P509
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Structure analysis on small organic molecules using electron crystallographyKolb, U. / Voigt-Martin, I. G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P513
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In situ REM study of the behavior of monoatomic steps on a Si surfaceLatyshev, A. V. / Nasimov, D. A. / Savenko, V. N. / Aseev, A. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P517
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In situ experiments in the electron microscope to study plastic deformation and fractureMesserschmidt, U. / Bartsch, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P521
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Inhomogeneous recrystallization in directionally solidified, cold rolled pure aluminium, studied by in-situ EBSD analysis in the SEMArno, D. F. / Bostadlokken, E. / Leinum, J. R. / Hjelen, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P523
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In-situ TEM study of thermal-stress induced dislocations in a Cu thin film on a SiN~x coated Si-substrateDehm, G. / Arzt, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P525
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An environmental high resolution transmission electron microscopy study of the in-situ oxidation of Nb~1~2O~2~9 to Nb~1~0O~2~5Sayagues, M. J. / Hutchison, J. L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P527
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Determination of Ce oxidation state during CeO~2 reduction by in situ electron energy-loss spectroscopySharma, R. / Crozier, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P529
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In-situ transmission electron microscopy heating of an intermetallic alloy Fe-28Al-4Cr-0.1CeKarlik, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P531
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In-situ study of failure processes of plasma spraying Mo coatingsSiegl, J. / Adamek, J. / Kovarik, O. / Karlik, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P533
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In-situ ion milling in the transmission electron microscope (TEM) using a low-voltage focused ion beam (LVFIB)Burkhardt, C. / Gnauck, P. / Plies, E. / Nisch, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P535
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In situ electrical resistivity measurements of Al-Ge films in the TEM using a modified heating holderVerheijen, M. A. / Donkers, J. J. T. M. / Thomassen, J. F. P. / van den Broek, J. J. / van der Rijt, R. A. F. / Dona, M. J. J. / Smit, C. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P537
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In-situ reduction of a methanol catalyst in a new FEG TEMHansen, P. L. / Wagner, J. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P539
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In-situ observation of dislocation motion in Al nanowiresInkson, B. J. / Dehm, G. / Wagner, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P541
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In situ SEM investigation of stress induced migration in SAW structuresMenzel, S. / Schmidt, H. / Wetzig, K. / Weihnacht, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P543
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Dynamic studies of creaming and coalescenceMathews, R. G. / Donald, A. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P545
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Defect structure produced by plastic deformation of Al-Pd-Mn single quasicrystalsDietzch, C. / Bartsch, M. / Haussler, D. / Messerschmidt, U. / Feuerbacher, M. / Urban, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P547
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Real time digital imaging by new CCD camera for in-situ TEM studiesAlani, R. / Pan, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P549
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An unusual deformation mode observed during in situ TEM strainingGemperle, A. / Zarubova, N. / Jacques, A. / Gemperlova, J. / Janecek, M. / Veron, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P553
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Recent trends and physical background in the development and application of ion beam techniques for TEM sample preparationBarna, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P557
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Reduction of the side-wall damage and gallium concentration of focused ion beam prepared TEM cross sectionsLangford, R. M. / Petford-Long, A. K. / Doole, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P559
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Principle and application of a new high energy focused ion gunVolz, K. / Hasse, A. / Schaper, A. K. / Barna, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P561
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Preparation of TEM foils for analysis of complex inclusions in steelsWalmsley, J. / van der Eijk, C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P563
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Perpendicular cutting for cross sectional SEM specimen preparation of layered materials by broad ion beamAlani, R. / Hauffe, W. / Mitro, R. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P565
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Improvement of quantitative X-ray spectroscopy for FIB-TEM samplesYasufumi, Y. / Okano, T. / Tametou, S. / Arai, M. / Kouzaki, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P567
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Novel approaches to the preparation of TEM samplesLi, Q. / Newcomb, S. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P569
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Characterization of a stratified particle using a FIB/TEM systemYaguchi, T. / Kamino, T. / Kobayashi, H. / Koike, H. / Tohji, K. / Nakatsuka, K. / Urao, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P571
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Ion beam grid cutting (IBGC) for 3D scanning electron microscopy of heterogeneous solidsHauffe, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P573
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The use of FIB in the TEM characterisation of YSZ buffer layersNewcomb, S. B. / Quinton, W. A. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P575
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The TEM examination of stress corrosion cracks in Al alloysDeshais, G. / Newcomb, S. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P577
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Specimen preparation for electron backscatter diffraction (EBSD) analysis of aluminium silicon cast alloys, electro polishing versus fast atom bombardment (FAB)Gulbrandsen-Dahl, S. / Heiberg, G. / Hjelen, J. / Nogita, K. / Raanes, M. / Dahle, A. K. / Arnberg, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P579
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The microstructure of Si~3N~4 prepared by ion etchingGec, M. / Krnel, K. / Ceh, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P581
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Cross sectional preparation of microelectronic structures with the ion milling system RES 100Grunewald, W. / Hietschold, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P585
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Analysis of nanostructures by EM techniques: Quantum dotsScheerschmidt, K. / Werner, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P589
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Electron microscopy and microanalysis of electronic ceramicsKnowles, K. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P593
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A TEM study of non-parallel twins inducing thickness growth in silver chloride (111) tabular crystalsVan Renterghem, W. / Schryvers, D. / Van Landuyt, J. / Bollen, D. / Van Roost, C. / De Keyzer, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P595
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Defects in semiconductor materials studied with cathodoluminescence microscopySaijo, H. / Isshiki, T. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P597
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Structure and identification of some metastable phases in Mg-rare earth alloysSmola, B. / Stulikova, I. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P599
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Morphology and interfaces of macropores in n- and p-Si(001)/(111)Jager, C. / Dieker, C. / Jager, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P601
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Investigations of microscopic fractures of Syrian cotton about different maturity degreeWlochowicz, A. / Sarna, E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P603
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Microstructural characterization of superficial zones on brake padsUrban, I. / Dorfel, I. / Osterle, W. / Gesatzke, W. / Schubert-Bischoff, P. / Trepte, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P605
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Electron microscopy study of Sn/SnSb composite electrodes for lithium-ion batteriesRom, I. / Papst, I. / Schmied, M. / Hofer, F. / Wachtler, M. / Besenhard, J. O. / Winter, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P607
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Cathodoluminescence microscopy of defects induced in SiC waferIsshiki, T. / Saijo, H. / Nishino, S. / Shiojiri, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P609
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Enhanced SEM doping contrast on an H-passivated silicon surfaceElliott, S. L. / Broom, R. F. / Humphreys, C. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P611
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Alumina membranes formed by anodical oxidation of aluminumVertesy, Z. / Biro, L. P. / Veress, E. / Mihailescu, G. / Pruneanu, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P613
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Imaging of 2-D doping profiles using electron microscopyMentink, S. A. M. / Overwijk, M. H. F. / Kaiser, M. / Verheijen, M. A. / Dachs, C. / Stolk, P. A. / Elliott, S. L. / Humphreys, C. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P615
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Possibilities for quantitative dopant profiling using TEM/AFM and selective chemical etchingVerheijen, M. A. / Kaiser, M. / van Berkum, J. G. M. / Dachs, C. J. J. / Stolk, P. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P617
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Morphology and composition of airborne particulate (PM2.5) by transmission electron microscopyBerti, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P619
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Behavior of H+ implantation induced defects during heatingIwata, H. / Takagi, M. / Tokuda, Y. / Imura, T. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P621
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TEM analysis of nanocrystalline reaction layers in Ag-Cu-Ti brazed silicon carbideOrmston, D. R. / Knowles, K. M. / Newcomb, S. B. / Fernie, J. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P623
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Ordering in Hf~1~-~yV~yO~z (y=0.1, 0.2, 0.3, 0.5): a HREM and EELS studyLeroux, C. / Turquat, C. / Nihoul, G. / Serin, V. / Gloter, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P625
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Silicides phase transformation in beta Ti-25V-15Cr-3Al-0.6Si (wt%)Kong, G. / Li, Y. G. / Blenkinsop, P. / Loretto, M. H. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P627
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Quantification of real air samples of asbestos fibres by optical microscopy and transmission electron microscopyManero, J. M. / Freixa, A. / Valles, E. / Planell, J. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P629
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EPMA analysis of lead zirconium titanate (PZT) filmsBernik, S. / Marinenko, R. B. / Samardzija, Z. / Malic, B. / Ceh, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P631
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The TEM characterisation of a via sidewall etch residuePirila, N. / Weyland, M. / Newcomb, S. B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P633
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STM/AFM study of Ge quantum dots grown on Si(111)Rosei, F. / Fanfoni, M. / Sgarlata, A. / Motta, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P635
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On the imaging of semiconductor doping using low energy electron microscopyEl-Gomati, M. / Wells, T. C. R. / Frank, L. / Mullerova, I. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P639
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General applications of electron microscopy in art and archaeologyBouquillon, A. / Duval, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P643
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Applications of scanning electron microscopy and microanalysis (SEM-EDX) to the study and characterisation of metallic implements of Roman agede Salazar, J. M. G. / Soria, A. / Quinones, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P649
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Microstructures as recorders of growth and transformation processes in mineralsPutnis, A. / Golla, U. / Pollok, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P651
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The curvature of serpentine minerals: influence of chemical composition, HRTEM observations, and elastic theoryPerbost, R. / Amouric, M. / Olives, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P653
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SEM studies of carbonaceous material in metamorphic rocks of the Bundnerschiefer (eastern Switzerland)Petrova, T. / Rumbholz, J. / Guggenheim, R. / Stern, W. B. / Frey, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P655
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Quantitative investigation of hematite-ilmenite solid solution with EFTEM using oxidation states and elemental distributionsGolla, U. / Putnis, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P657
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Mixed layering of illite-smectite minerals: HRTEM-AEM results and lattice-energy calculationsAmouric, M. / Perbost, R. / Olives, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P659
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The colorings of the St. Peter's facade: A microscopy characterizationMassara, E. P. / Berti, D. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P661
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Preliminary data on the lead-tin yellow used by R. van der Weyden in Descent from the Cross. TEM characterizationAndres, M. S. / Baez, M. I. / Garrido, M. C. / Baldonedo, J. L. / Rodriguez, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P663
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Authentication of metal artefacts: the importance of SEM and EDX into the examination of archaeological bronzes (Cu-Sn alloys)Robbiola, L. / Portier, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P665
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A TEM and XRD study of the decomposition products of laumontite Ca~4Al~8Si~1~6O~4~8-nH~2O zeolite up to 1423 KGomez-Herrero, A. / Rojas, R. M. / Fernandez-Diaz, M. L. / Otero-Diaz, L. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P667
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A system for mineral classification from SEM EDS image analysisFlesche, H. / Rykkje, J. M. / Nielsen, A. A. / Larsen, R. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P669
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Colour zoning and inclusions in sapphires from southern VietnamJersek, M. / Recnik, A. / Daneu, N. / Sturm, S. / Mirtic, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- P671
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Electron diffraction three-dimensional mineral structure orderingSamodurov, V. / Czechoslovak Society for Electron Microscopy et al. | 2000
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Free radical polymerisation of isodecyl acrylate in fluorinated vesiclesSchmutz, M. / Krafft, M. P. / Schildknecht, L. / Giulieri, F. / Nakache, E. / Poulain, N. / Czechoslovak Society for Electron Microscopy et al. | 2000
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Size and polydispersity from polymerparticles obtained by cryo-TEM, SANS and dynamic light scatteringBurauer, S. / Belkoura, L. / Strey, R. / Co, C. C. / Kaler, E. W. / Czechoslovak Society for Electron Microscopy et al. | 2000