Effects of gadolinium ions on statocyte ultrastructure in pea roots (English)
- New search for: Belyavskaya, N. A.
- New search for: Czechoslovak Society for Electron Microscopy
- New search for: Belyavskaya, N. A.
- New search for: Czechoslovak Society for Electron Microscopy
In:
European congress on electron microscopy
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S35-S36
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2000
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ISBN:
- Conference paper / Print
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Title:Effects of gadolinium ions on statocyte ultrastructure in pea roots
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Contributors:
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Conference:12th, European congress on electron microscopy ; 2000 ; Brno, Czech Republic
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Published in:European congress on electron microscopy ; S35-S36
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Publisher:
- New search for: Czechoslovak Society for Electron Microscopy
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Publication date:2000-01-01
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Size:S35-S36
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Remarks:Also known as EUREM 2000
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ISBN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- S1
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How to see alpha-helices without having crystals Electron cryomicroscopy of hepatitis B virus core shellsBottcher, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S9
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Alphavirus structure: from 40Angstrom to 9 Angstrom in 14 yearsFuller, S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S17
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Electron optics: The bridge between microscopy and lithographyMankos, M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S29
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Myosin I in the nucleusPestic-Dragovich, L. / Stojiljkovic, L. / Philimonenko, A. A. / Nowak, G. / Ke, Y. / Settlage, B. / Hunt, D. F. / Hozak, P. / de Lanerolle, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S33
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Pollen morphology of Asiatic and European species of genus Salsola (Chenopodiaceae)Toderich, K. N. / Idzikowska, K. / Wozny, A. / Takabe, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S35
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Effects of gadolinium ions on statocyte ultrastructure in pea rootsBelyavskaya, N. A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S37
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Structure of the luminal plasma membrane protein complex from urinary bladderOostergetel, G. T. / Brisson, A. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S39
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Immunocytochemical localization of uroplakins during embryonic development of mice urotheliumRomih, R. / Psenicnik, M. / Jezernik, K. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S41
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Estimation of numerical density and height of synapses in chicks following passive avoidance training by using physical disector counting method: An electron microscopical & stereological studyUnal, B. / Kaplan, S. / Bradley, M. P. / Canan, S. / Inaloz, S. / Aslan, H. / Sahin, B. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S43
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Ultrastructural characteristics of calcitriol-induced nephrocalcinosis in the chick embryoOsguei, G. T. / Rad, J. S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S45
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Nuclear Channel System (NCS) in normal endometrium and after hormonal stimulationNovotny, R. / Malinsky, J. / Oborna, I. / Dostal, J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S47
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Illuminating the natural composite design of mollusc shellsRoss, I. M. / Wyeth, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S51
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The application of high spatial resolution EDS and ELNES to elucidate the grain boundary structure of TZP engineering ceramicsRoss, I. M. / Rainforth, W. M. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S53
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Electron microscopy and X-ray diffraction studies of new intergrowth compounds in the Ba-Nb-Zr-O systemSvensson, G. / Nilsson, G. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S55
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HREM investigation of Eu~1~-~xGa~2~+~3~xRamlau, R. / Sichevich, O. / Schmidt, M. / Grin, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S57
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Microstructural investigation of bio carbon composites by electron microscopyHata, T. / Nishimiya, K. / Bronsveld, P. / De Hosson, J. / Kobayashi, E. / Kikuchi, H. / Imamura, Y. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S61
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Fractal approach to description of the surface structure of polyimide films decorated with goldSukhanova, T. E. / Novikov, D. V. / Vylegzhanina, M. E. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S63
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Segregation in nickel alloysWilliams, P. / Tatlock, G. J. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S65
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Strain-induced modulation versus superlattice ordering in epitaxial (GaIn)P layersJiang, J. / Schaper, A. K. / Spika, Z. / Stolz, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S67
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An new crystallographic orientation relationship between M~2~3C~6 and austenite (gamma)Liu, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S69
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Nonstoichiometry in inorganic fluorite type materials M~1~-~xR~xF~2~+~x where M = Ba and R = rare earthMunoz, R. / Rojas, R. M. / Pascual, L. / Ropero, R. / Sobolev, B. P. / Herrero, P. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S73
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A comparison of surface roughness of pipes as measured by Dektak^3ST profiler, Hommel Tester 1000, and atomic force microscopeFarshad, F. F. / Garber, J. D. / Pesacreta, T. C. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S75
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Linear thickness dependence of electron contrast in single crystal gold films in the TEMPozsgai, I. / Toth, L. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S77
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Nanosecond mirror electron microscopeKleinschmidt, H. / Bostanjoglo, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S79
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Time-resolved transmission electron microscopy on laser pulse-induced melts in glass filmsDomer, H. / Bostanjoglo, O. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S81
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Analysis of strain-balanced semiconductor layers by HREMMeidia, H. / Hetherington, C. J. D. / Cullis, A. G. / Roberts, J. S. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S83
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The Philips Tecnai TEM: applications and possibilities in life and materials sciencesStorms, M. M. H. / Hubert, D. / Lucken, U. / Fliervoet, T. / Freitag, B. / Sidorov, M. / Busing, W. / Czechoslovak Society for Electron Microscopy et al. | 2000
- S85
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Enhancing the detection efficiency of a SEM MCP detector by a coated thin foilCheifetz, E. / Czechoslovak Society for Electron Microscopy et al. | 2000