Manufacturing and testing of two off-axis aspherical mirrors [4451-15] (English)
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In:
Optical manufacturing and testing
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118-125
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2001
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Manufacturing and testing of two off-axis aspherical mirrors [4451-15]
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Contributors:
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Conference:Conference; 4th, Optical manufacturing and testing ; 2001 ; San Diego, CA
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Published in:Optical manufacturing and testing ; 118-125PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4451 ; 118-125
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Publisher:
- New search for: SPIE
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Publication date:2001-01-01
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Size:8 pages
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 1
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Development of lightweight mirror technology for the next generation space telescope [4451-01]Stahl, H. P. / SPIE et al. | 2001
- 1
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Development of lightweight mirror technology for the next generation space telescopeStahl, H. Philip et al. | 2001
- 5
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Final results of the Subscale Beryllium Mirror Demonstrator (SBMD) program [4451-02]Reed, T. / Kendrick, S. E. / Brown, R. J. / Hadaway, J. B. / Byrd, D. A. / SPIE et al. | 2001
- 5
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Final results of the Subscale Beryllium Mirror Demonstrator (SBMD) programReed, Timothy / Kendrick, Stephen E. / Brown, Robert J. / Hadaway, James B. / Byrd, Donald A. et al. | 2001
- 15
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Cryogenic optical testing results for the Subscale Beryllium Mirror Demonstrator (SBMD) [4451-03]Hadaway, J. B. / Geary, J. M. / Reardon, P. J. / Peters, B. R. / Stahl, H. P. / Eng, R. / Keidel, J. W. / Kegley, J. R. / Reed, T. / Byrd, D. A. et al. | 2001
- 15
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Cryogenic optical testing results for the Subscale Beryllium Mirror Demonstrator (SBMD)Hadaway, James B. / Geary, Joseph M. / Reardon, Patrick J. / Peters, Bruce R. / Stahl, H. Philip / Eng, Ron / Keidel, John W. / Kegley, Jeffrey R. / Reed, Timothy / Byrd, Donald A. et al. | 2001
- 27
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NGST mirror system demonstrator from the University of ArizonaBurge, James H. / DeRigne, Scott T. / Angel, James Roger P. / Cuerden, Brian / Clapp, S. / Rivlis, G. / Woida, Patrick M. / Gohman, Paul / Bell, Steve / Kingston, R. et al. | 2001
- 27
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NGST mirror system demonstrator from the University of Arizona [4451-04]Burge, J. H. / DeRigne, S. T. / Angel, J. R. P. / Cuerden, B. / Clapp, S. / Rivlis, G. / Woida, P. M. / Gohman, P. / Bell, S. / Kingston, R. et al. | 2001
- 39
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AMSD test error budget sensitivity analysis [4451-05]Reardon, P. J. / Hadaway, J. B. / Geary, J. M. / Peters, B. R. / Stahl, H. P. / Eng, R. / Keidel, J. W. / Kegley, J. R. / SPIE et al. | 2001
- 39
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AMSD test error budget sensitivity analysisReardon, Patrick J. / Hadaway, James B. / Geary, Joseph M. / Peters, Bruce R. / Stahl, H. Philip / Eng, Ron / Keidel, John W. / Kegley, Jeffrey R. et al. | 2001
- 51
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Semi-rigid active mirror technology advancements [4451-06]Matthews, G. / Carbone, F. A. / Clark, P. / Mack, D. M. / SPIE et al. | 2001
- 51
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Semi-rigid active mirror technology advancementsMatthews, Gary / Carbone, Frank A. / Clark, Patrick / Mack, Devin M. et al. | 2001
- 58
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In-process status of the 1.4-m beryllium semi-rigid Advanced Mirror System Demonstrator (AMSD) [4451-07]Kendrick, S. E. / Reed, T. / Streetman, S. / SPIE et al. | 2001
- 58
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In-process status of the 1.4-m beryllium semi-rigid Advanced Mirror System Demonstrator (AMSD)Kendrick, Stephen E. / Reed, Timothy / Streetman, Scott et al. | 2001
- 67
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Results for silicon lightweight mirrors (SLMS)Jacoby, Marc T. / Goodman, William A. / Content, David A. et al. | 2001
- 67
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Results for silicon lightweight mirrors (SLMS) [4451-08]Jacoby, M. T. / Goodman, W. A. / Content, D. A. / SPIE et al. | 2001
- 77
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Design manufacture and test of a cryo-stable Offner relay using aluminum foam core opticsMcClelland, Ryan S. / Content, David A. et al. | 2001
- 77
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Design manufacture and test of a cryo-stable Offner relay using aluminum foam core optics [4451-09]McClelland, R. S. / Content, D. A. / SPIE et al. | 2001
- 86
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Demonstration of a 0.5-m ultralightweight mirror for use at geosynchronous orbitBaiocchi, Dave / Burge, James H. / Cuerden, Brian et al. | 2001
- 86
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Demonstration of a 0.5-m ultralightweight mirror for use at geosynchronous orbit [4451-10]Baiocchi, D. / Burge, J. H. / Cuerden, B. / SPIE et al. | 2001
- 96
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Manufacturing and evaluation of membrane optical elements for ultralightweight optics [4451-11]Patrick, B. G. / Moore, J. D. / Brantley, W. / Kester, T. / Lehner, D. L. / SPIE et al. | 2001
- 96
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Manufacturing and evaluation of membrane optical elements for ultralightweight opticsPatrick, Brian G. / Moore, James D. / Brantley, Whitt / Kester, Thomas / Lehner, David L. et al. | 2001
- 105
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Stretched membrane with electrostatic curvature (SMEC) mirrors for extremely large space telescopes [4451-12]Stamper, B. L. / Angel, J. R. P. / Burge, J. H. / Connors, T. / Duffy, B. / Woolf, N. J. / SPIE et al. | 2001
- 105
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Stretched membrane with electrostatic curvature (SMEC) mirrors for extremely large space telescopesStamper, Brian L. / Angel, James Roger P. / Burge, James H. / Connors, Tom / Duffy, Brian / Woolf, Neville J. et al. | 2001
- 114
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Large aspheric optics for high-power, high-energy laserGeyl, Roland / Houbre, Francois et al. | 2001
- 114
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Large aspheric optics for high-power, high-energy laser [4451-13]Geyl, R. / Houbre, F. / SPIE et al. | 2001
- 118
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Manufacturing and testing of two off-axis aspherical mirrors [4451-15]Zhang, X. / Weng, Z. / Zhang, Z. / Wang, Q. / Zhang, F. / SPIE et al. | 2001
- 118
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Manufacturing and testing of two off-axis aspherical mirrorsZhang, Xuejun / Weng, Zhicheng / Zhang, Zhongyu / Wang, Quandou / Zhang, Fengdong et al. | 2001
- 126
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SOFIA primary mirror fabrication and testing [4451-16]Geyl, R. / Tarreau, M. / Plainchamp, P. / SPIE et al. | 2001
- 126
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SOFIA primary mirror fabrication and testingGeyl, Roland / Tarreau, Michel / Plainchamp, Patrick et al. | 2001
- 131
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Manufacturing of primary mirrors from Sitall CO-115M for European projects TTL, NOA, and VSTAbdulkadyrov, Magomed A. / Belousov, Sergey P. / Ignatov, Alexandr N. / Patrikeev, Vladimir E. / Pridnya, Vitaliy V. / Polyanchikov, Andrey V. / Rumyantsev, Victor / Samuylov, Anatoly V. / Semenov, Alexandr P. / Sharov, Yury A. et al. | 2001
- 131
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Manufacturing of primary mirrors from Sitall CO-115M for European projects TTL, NOA, and VST [4451-17]Abdulkadyrov, M. A. / Belousov, S. P. / Ignatov, A. N. / Patrikeev, V. E. / Pridnya, V. V. / Polyanchikov, A. V. / Rumyantsev, V. V. / Samuylov, A. V. / Semenov, A. P. / Sharov, Y. A. et al. | 2001
- 138
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Manufacturing of secondary mirrors from Sitall CO-115M for European projects TTL, NOA, and VST [4451-18]Semenov, A. P. / Abdulkadyrov, M. A. / Belousov, S. P. / Ignatov, A. N. / Patrikeev, V. E. / Pridnya, V. V. / Polyanchikov, A. V. / Rumyantsev, V. V. / Samuylov, A. V. / Sharov, Y. A. et al. | 2001
- 138
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Manufacturing of secondary mirrors from Sitall CO-115M for European projects TTL, NOA, and VSTSemenov, Alexandr P. / Abdulkadyrov, Magomed A. / Belousov, Sergey P. / Ignatov, Alexandr N. / Patrikeev, Vladimir E. / Pridnya, Vitaliy V. / Polyanchikov, Andrey V. / Rumyantsev, Victor / Samuylov, Anatoly V. / Sharov, Yury A. et al. | 2001
- 145
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Modeling of tool shape evolution in conformal (raster) grindingThonggoom, Rattaporn / Funkenbusch, Paul D. / Gracewski, Sheryl M. / Ruckman, Jeffrey L. et al. | 2001
- 145
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Modeling of tool shape evolution in conformal (raster) grinding [4451-19]Thonggoom, R. / Funkenbusch, P. D. / Gracewski, S. M. / Ruckman, J. L. / SPIE et al. | 2001
- 153
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Development of optimal grinding and polishing tools for aspheric surfaces [4451-20]Burge, J. H. / Anderson, B. / Benjamin, S. / Cho, M. K. / Smith, K. Z. / Valente, M. J. / SPIE et al. | 2001
- 153
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Development of optimal grinding and polishing tools for aspheric surfacesBurge, James H. / Anderson, Bill / Benjamin, Scott / Cho, Myung K. / Smith, Koby Z. / Valente, Martin J. et al. | 2001
- 165
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Surface features and residual strains in AlON grindingBurns, Stephen J. / Funkenbusch, Paul D. / Gracewski, Sheryl M. / Lambropoulos, John C. / Ruckman, Jeffrey L. et al. | 2001
- 165
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Surface features and residual strains in AlON grinding [4451-21]Burns, S. J. / Funkenbusch, P. D. / Gracewski, S. M. / Lambropoulos, J. C. / Ruckman, J. L. / SPIE et al. | 2001
- 174
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Suitability of igneous rock for precision tooling [4451-22]Valente, M. J. / Burge, J. H. / DiCenso, R. / Abusafieh, A. A. / Federico, D. R. / SPIE et al. | 2001
- 174
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Suitability of igneous rock for precision toolingValente, Martin J. / Burge, James H. / DiCenso, R. / Abusafieh, Abdel A. / Federico, Dan R. et al. | 2001
- 181
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Manufacturing-induced residual stresses in optical glasses and crystals: Example of residual stress relief by magnetorheological finishing (MRF) in commercial silicon wafersLambropoulos, John C. / Arrasmith, Steven R. / Jacobs, Stephen D. / Golini, Donald et al. | 2001
- 181
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Manufacturing-induced residual stresses in optical glasses and crystals: Example of residual stress relief by magnetorheological finishing (MRF) in commercial silicon wafers [4451-23]Lambropoulos, J. C. / Arrasmith, S. R. / Jacobs, S. D. / Golini, D. / SPIE et al. | 2001
- 191
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Ultraprecision grinding machining of optical aspheric surface in ductile mode [4451-54]Chen, M. / Zhang, F. / Zhao, Q. / Dong, S. / SPIE et al. | 2001
- 191
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Ultraprecision grinding machining of optical aspheric surface in ductile modeChen, Mingjun / Zhang, Feihu / Zhao, Qingliang / Dong, Shen et al. | 2001
- 200
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Effects of diamond cutting tool's rake angle and edge radius on the diamond turned surface quality [4451-55]Zhao, Q. / Dong, S. / Liang, Y. / Zhao, Y. / SPIE et al. | 2001
- 200
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Effects of diamond cutting tool's rake angle and edge radius on the diamond turned surface qualityZhao, Qingliang / Dong, Shen / Liang, Ying-Chun / Zhao, Yi et al. | 2001
- 209
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Quantitative characterization of optical polishing pitchDeGroote, Jessica E. / Jacobs, Stephen D. / Gregg, Leslie L. / Marino, Anne E. / Hayes, Jennifer C. et al. | 2001
- 209
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Quantitative characterization of optical polishing pitch [4451-24]DeGroote, J. E. / Jacobs, S. D. / Gregg, L. L. / Marino, A. E. / Hayes, J. C. / SPIE et al. | 2001
- 222
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Nanometer accurate shaping with fluid jet polishing [4451-25]Booij, S. M. / van Brug, H. H. / Singh, M. / Braat, J. J. M. / SPIE et al. | 2001
- 222
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Nanometer accurate shaping with fluid jet polishingBooij, Silvia M. / van Brug, Hedser H. / Singh, Mandeep / Braat, Joseph J. M. et al. | 2001
- 233
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Constellation-X cylinder figuring and polishing studies [4451-26]Waluschka, E. / Arsenovic, P. / Content, D. A. / Saha, T. T. / Strojny, C. R. / Wright, G. A. / Fleetwood, C. M. / SPIE et al. | 2001
- 233
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Constellation-X cylinder figuring and polishing studiesWaluschka, Eugene / Arsenovic, Petar / Content, David A. / Saha, Timo T. / Strojny, Carl R. / Wright, Geraldine A. / Fleetwood, Charles M. et al. | 2001
- 242
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Precision optical asphere fabrication by plasma jet chemical etching (PJCE) and ion beam figuring [4451-27]Schindler, A. / Boehm, G. / Haensel, T. / Frank, W. / Nickel, A. / Rauschenbach, B. / Bigl, F. / SPIE et al. | 2001
- 242
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Precision optical asphere fabrication by plasma jet chemical etching (PJCE) and ion beam figuringSchindler, Axel / Boehm, Georg / Haensel, Thomas / Frank, Wilfried / Nickel, Andreas / Rauschenbach, Bernd / Bigl, Frieder et al. | 2001
- 249
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Wet-etch figuring: optical surfacing by controlled application of etchant solution using the Marangoni effect [4451-28]Rushford, M. C. / Britten, J. A. / Hoaglan, C. R. / Thomas, I. M. / Summers, L. J. / Dixit, S. N. / SPIE et al. | 2001
- 249
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Wet-etch figuring: optical surfacing by controlled application of etchant solution using the Marangoni effectRushford, Michael C. / Britten, Jerald A. / Hoaglan, Curly R. / Thomas, Ian M. / Summers, Leslie J. / Dixit, Sham N. et al. | 2001
- 259
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Research on the microstructure of ceramic glass and its polished surface quality [4451-29]Zhang, F. / Zhao, Q. / Xie, D. / Han, R. / Pei, S. / SPIE et al. | 2001
- 259
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Research on the microstructure of ceramic glass and its polished surface qualityZhang, Feihu / Zhao, Qingliang / Xie, Dagang / Han, Rongjiu / Pei, Shu et al. | 2001
- 267
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First aspheric form and texture results from a production machine embodying the precession process [4451-61]Walker, D. D. / Brooks, D. / Freeman, R. / King, A. / McCavana, G. / Morton, R. / Riley, D. / Simms, J. / SPIE et al. | 2001
- 267
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First aspheric form and texture results from a production machine embodying the precession processWalker, David D. / Brooks, David / Freeman, Richard / King, Andrew / McCavana, Gerry / Morton, Roger / Riley, David / Simms, John et al. | 2001
- 277
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Exploring anisotropy in removal rate for single-crystal sapphire using MRF [4451-30]Kozhinova, I. A. / Arrasmith, S. R. / Lambropoulos, J. C. / Jacobs, S. D. / Romanofsky, H. J. / SPIE et al. | 2001
- 277
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Exploring anisotropy in removal rate for single crystal sapphire using MRFKozhinova, Irina A. / Arrasmith, Steven R. / Lambropoulos, John C. / Jacobs, Stephen D. / Romanofsky, Henry J. et al. | 2001
- 286
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Use of magnetorheological finishing (MRF) to relieve residual stress and subsurface damage on lapped semiconductor silicon wafers [4451-31]Arrasmith, S. R. / Jacobs, S. D. / Lambropoulos, J. C. / Maltsev, A. / Golini, D. / Kordonski, W. I. / SPIE et al. | 2001
- 286
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Use of magnetorheological finishing (MRF) to relieve residual stress and subsurface damage on lapped semiconductor silicon wafersArrasmith, Steven R. / Jacobs, Stephen D. / Lambropoulos, John C. / Maltsev, Alexander / Golini, Donald / Kordonski, William I. et al. | 2001
- 295
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Fabrication of integrated diffractive micro-optics for MEMS applications [4451-32]Senesac, L. R. / Farahi, R. H. / Corbeil, J. L. / Earl, D. D. / Rajic, S. / Datskos, P. G. / SPIE et al. | 2001
- 295
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Fabrication of integrated diffractive micro-optics for MEMS applicationsSenesac, Larry R. / Farahi, R. H. / Corbeil, James L. / Earl, Dennis D. / Rajic, Slobodan / Datskos, Panos G. et al. | 2001
- 306
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Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2chemistryCakmak, Bulent / Penty, Richard V. / White, Ian H. et al. | 2001
- 306
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Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H~2 chemistry [4451-33]Cakmak, B. / Penty, R. V. / White, I. H. / SPIE et al. | 2001
- 313
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Self-referencing, motion-insensitive approach for absolute aspheric profiling of large optics to the nanometer level and beyond [4451-34]Glenn, P. E. / Hull-Allen, C. G. / SPIE et al. | 2001
- 313
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Self-referencing, motion-insensitive approach for absolute aspheric profiling of large optics to the nanometer level and beyondGlenn, Paul E. / Hull-Allen, C. G. et al. | 2001
- 325
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Analysis of the uncertainty of the ultraprecise large-area curvature scanning technique for measuring steep aspheres and complex surfacesWeingaertner, Ingolf / Schulz, Michael et al. | 2001
- 325
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Analysis of the uncertainty of the ultraprecise large-area curvature scanning technique for measuring steep aspheres and complex surfaces [4451-35]Weingartner, I. / Schulz, M. / SPIE et al. | 2001
- 333
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Calibration of a vertical-scan long trace profiler at MSFC [4451-57]Gubarev, M. V. / Kester, T. / Takacs, P. Z. / SPIE et al. | 2001
- 333
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Calibration of a vertical-scan long trace profiler at MSFCGubarev, Mikhail V. / Kester, Thomas / Takacs, Peter Z. et al. | 2001
- 340
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Applicability of iTIRM for roughness reduction monitoring [4451-37]van der Bijl, R.-J. M. / van Brug, H. H. / Fahnle, O. W. / Braat, J. J. M. / SPIE et al. | 2001
- 340
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Applicability of iTIRM for roughness reduction monitoringvan der Bijl, Robert-Jaap / van Brug, Hedser H. / Faehnle, Oliver W. / Braat, Joseph J. M. et al. | 2001
- 345
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New approach for testing of aspherical micro-optics with high numerical aperture [4451-38]Kebbel, V. / Hartmann, H.-J. / Juptner, W. P. O. / SPIE et al. | 2001
- 345
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New approach for testing of aspherical micro-optics with high numerical apertureKebbel, Volker / Hartmann, Hans-Juergen / Jueptner, Werner P. O. et al. | 2001
- 356
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Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm [4451-39]Hirabayashi, A. / Ogawa, H. / Kitagawa, K. / SPIE et al. | 2001
- 356
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Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithmHirabayashi, Akira / Ogawa, Hidemitsu / Kitagawa, Katsuichi et al. | 2001
- 368
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Design and application of Dall compensator for null testing of large-aperture aspherical surface and convex lensWu, Fan / Tang, Jianguan et al. | 2001
- 368
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Design and application of Dall compensator for null testing of large-aperture aspherical surface and convex lens [4451-58]Wu, F. / Tang, J. / SPIE et al. | 2001
- 375
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Stitching interferometry and absolute surface shape metrology: similaritiesBray, Michael et al. | 2001
- 375
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Stitching interferometry and absolute surface shape metrology: similarities [4451-40]Bray, M. / SPIE et al. | 2001
- 384
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Correlation of test data from some NIF small optical componentsChow, Robert / McBurney, Michael S. / Eickelberg, William K. / Williams, Wade H. / Thomas, Michael D. et al. | 2001
- 384
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Correlation of test data from some NIF small optical components [4451-41]Chow, R. / McBurney, M. S. / Eickelberg, W. K. / Williams, W. H. / Thomas, M. D. / SPIE et al. | 2001
- 394
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Use of beam parameters in optical component testingNeal, Daniel R. / Gruetzner, James K. / Roller, James P. et al. | 2001
- 394
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Use of beam parameters in optical component testing [4451-43]Neal, D. R. / Gruetzner, J. K. / Roller, J. P. / SPIE et al. | 2001
- 406
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Analysis of Hartmann testing techniques for large-sized opticsTolstoba, Nadezhda D. et al. | 2001
- 406
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Analysis of Hartmann testing techniques for large-sized optics [4451-59]Tolstoba, N. D. / SPIE et al. | 2001
- 414
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Interferometric measurement of refractive index inhomogeneity on polished sapphire substrates: application to LIGO-IIOreb, Bozenko F. / Leistner, Achim J. / Billingsley, GariLynn / Kells, William P. / Camp, Jordan et al. | 2001
- 414
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Interferometric measurement of refractive index inhomogeneity on polished sapphire substrates: application to LIGO-II [4451-46]Oreb, B. F. / Leistner, A. J. / Billingsley, G. / Kells, W. P. / Camp, J. / SPIE et al. | 2001
- 424
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Multiple-surface phase-shifting interferometryDeck, Leslie L. et al. | 2001
- 424
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Multiple-surface phase-shifting interferometry [4451-47]Deck, L. L. / SPIE et al. | 2001
- 432
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Uncertainties in interferometric measurements of radius of curvatureSchmitz, Tony L. / Davies, Angela D. / Evans, Christopher J. et al. | 2001
- 432
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Uncertainties in interferometric measurements of radius of curvature [4451-49]Schmitz, T. L. / Davies, A. D. / Evans, C. J. / SPIE et al. | 2001
- 448
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High-precision 2D angle measurement using fringe analysis techniquesGe, Zongtao / Saito, Takayuki / Matsuda, Shinichi / Takeda, Mitsuo et al. | 2001
- 448
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High-precision 2D angle measurement using fringe analysis techniques [4451-50]Ge, Z. / Saito, T. / Matsuda, S. / Takeda, M. / SPIE et al. | 2001
- 458
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Silicon carbide high performance optics: a cost-effective, flexible fabrication processCasstevens, John M. / Rashed, Abuagela / Plummer, Ronald / Bray, Don / Gates, Rob L. / Lara-Curzio, Edgar / Ferber, Matt K. / Kirkland, Tim et al. | 2001
- 458
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Silicon carbide high performance optics: a cost-effective flexible fabrication process [4451-62]Casstevens, J. M. / Rashed, A. / Plummer, R. / Bray, D. / Gates, R. L. / Lara-Curzio, E. / Ferber, M. K. / Kirkland, T. / SPIE et al. | 2001
- 468
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Thermo-mechanical performance of precision C/SiC mounts [4451-51]Goodman, W. A. / Muller, C. E. / Jacoby, M. T. / Wells, J. D. / SPIE et al. | 2001
- 468
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Thermo-mechanical performance of precision C/SiC mountsGoodman, William A. / Mueller, Claus E. / Jacoby, Marc T. / Wells, Jim D. et al. | 2001
- 480
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Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensor [4451-53]Brown, M. K. / Gong, T. J. / Neal, D. R. / Roller, J. P. / Luanava, S. / Urey, H. / SPIE et al. | 2001
- 480
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Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensorBrown, Margaret K. / Gong, Timothy J. / Neal, Daniel R. / Roller, James P. / Luanava, Selso / Urey, Hakan et al. | 2001