3D profile measurement of large-scale curvature plates using structured light source [7066-26] (English)
- New search for: Heo, E.
- New search for: Kim, B.
- New search for: Lee, H.
- New search for: Han, J.
- New search for: SPIE (Society)
- New search for: Heo, E.
- New search for: Kim, B.
- New search for: Lee, H.
- New search for: Han, J.
- New search for: Huang, Peisen S.
- New search for: Yoshizawa, Taoru
- New search for: Harding, Kevin G.
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In:
Two- and three-dimensional methods for inspection and metrology VI
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7066 0O
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2008
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ISBN:
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ISSN:
- Conference paper / Print
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Title:3D profile measurement of large-scale curvature plates using structured light source [7066-26]
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Contributors:Heo, E. ( author ) / Kim, B. ( author ) / Lee, H. ( author ) / Han, J. ( author ) / Huang, Peisen S. / Yoshizawa, Taoru / Harding, Kevin G. / SPIE (Society)
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Conference:Conference; 6th, Two- and three-dimensional methods for inspection and metrology VI ; 2008 ; San Diego, CA
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Published in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 7066 ; 7066 0O
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Publisher:
- New search for: SPIE
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Place of publication:Bellingham, Wash.
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Publication date:2008-01-01
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Size:7066 0O
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Remarks:Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 70660A
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High dynamic range scanning techniqueZhang, Song / Yau, Shing-Tung et al. | 2008
- 70660B
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Phase-shifting shadow moiré using the Carré algorithmHuang, Peisen S. / Guo, Hong et al. | 2008
- 70660D
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Simultaneous measurement of internal and external profiles using a ring beam deviceWakayama, Toshitaka / Yoshizawa, Toru et al. | 2008
- 70660E
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3-D shape measurement by use of a modified Fourier transform methodGuo, Hong / Huang, Peisen S. et al. | 2008
- 70660F
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Challenges and opportunities for 3D optical metrology: what is needed today from an industry perspectiveHarding, Kevin et al. | 2008
- 70660G
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Camera-based 10KHz distance gageAbramovich, Gil / Harding, Kevin et al. | 2008
- 70660J
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Calibration of a soft x-ray projection systemSchmitt, Robert / Damm, Bjoern / Volk, Raimund et al. | 2008
- 70660K
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Merging of range images for inspection or safety applicationsMure-Dubois, James / Hügli, Heinz et al. | 2008
- 70660L
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Optimal measurement method for diffraction-based overlay metrologyHsu, Wei-Te / Ku, Yi-Sha et al. | 2008
- 70660O
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3D profile measurement of large-scale curvature plates using structured light sourceHeo, EunChang / Kim, ByoungChang / Lee, Hyunho / Han, JongMan et al. | 2008
- 70660R
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Evaluation of large conic concave surfaces using a coordinate measurement machine and genetic algorithmsSantiago-Alvarado, A. / Vázquez-Montiel, S. / González-García, J. / López-López, A. et al. | 2008
- 706601
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Front Matter: Volume 7066| 2008
- 706602
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Standardization of noncontact 3D measurementTakatsuji, Toshiyuki / Osawa, Sonko / Sato, Osamu et al. | 2008
- 706603
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Geometric errors in 3D optical metrology systemsHarding, Kevin / Nafis, Chris et al. | 2008
- 706604
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Modelling and compensating measurement errors caused by scattering in time-of-flight camerasKavli, Tom / Kirkhus, Trine / Thielemann, Jens T. / Jagielski, Borys et al. | 2008
- 706605
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Measurement of optical free-form surfaces with fringe projectionBreitbarth, Martin / Braeuer-Burchardt, Christian / Kuehmstedt, Peter / Heinze, Matthias / Notni, Gunther et al. | 2008
- 706606
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Development of real-time shape measurement system using whole-space tabulation methodFujigaki, Motoharu / Takagishi, Akihiro / Matui, Toru / Morimoto, Yoshiharu et al. | 2008
- 706607
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Measurement and stitching of regular cloud of pointsFantin, A. V. / Pinto, T. L. / de Carvalho, C. A. / Albertazzi, A. et al. | 2008
- 706608
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3D surface defect analysis and evaluationYang, B. / Jia, M. / Song, G. J. / Tao, L. / Harding, K. G. et al. | 2008
- 706609
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Robust depth-from-defocus for autofocusing in the presence of image shiftsKang, Younsik / Tu, Xue / Dutta, Satyaki / Subbarao, Murali et al. | 2008
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3-D shape measurement by use of a modified Fourier transform method [7066-14]Guo, H. / Huang, P.S. / SPIE (Society) et al. | 2008
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Camera-based 10KHz distance gage [7066-16]Abramovich, G. / Harding, K. / SPIE (Society) et al. | 2008
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Measurement of optical free-form surfaces with fringe projection [7066-04]Breitbarth, M. / Brauer-Burchardt, C. / Kuhmstedt, P. / Heinze, M. / Notni, G. / SPIE (Society) et al. | 2008
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Phase-shifting shadow moire using the Carre algorithm [7066-11]Huang, P.S. / Guo, H. / SPIE (Society) et al. | 2008
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High dynamic range scanning technique [7066-09]Zhang, S. / Yau, S.-T. / SPIE (Society) et al. | 2008
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Robust depth-from-defocus for autofocusing in the presence of image shifts [7066-08]Kang, Y. / Tu, X. / Dutta, S. / Subbarao, M. / SPIE (Society) et al. | 2008
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Measurement and stitching of regular cloud of points [7066-06]Fantin, A.V. / Pinto, T.L. / de Carvalho, C.A. / Albertazzi, A. / SPIE (Society) et al. | 2008
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3D profile measurement of large-scale curvature plates using structured light source [7066-26]Heo, E. / Kim, B. / Lee, H. / Han, J. / SPIE (Society) et al. | 2008
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Optimal measurement method for diffraction-based overlay metrology [7066-23]Hsu, W.-T. / Ku, Y.-S. / SPIE (Society) et al. | 2008
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Evaluation of large conic concave surfaces using a coordinate measurement machine and genetic algorithms [7066-31]Santiago-Alvarado, A. / Vazquez-Montiel, S. / Gonzalez-Garcia, J. / Lopez-Lopez, A. / SPIE (Society) et al. | 2008
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3D surface defect analysis and evaluation [7066-07]Yang, B. / Jia, M. / Song, G.J. / Tao, L. / Harding, K.G. / SPIE (Society) et al. | 2008
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Challenges and opportunities for 3D optical metrology: what is needed today from an industry perspective [7066-33]Harding, K. / SPIE (Society) et al. | 2008
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Modelling and compensating measurement errors caused by scattering in time-of-flight cameras [7066-03]Kavli, T. / Kirkhus, T. / Thielemann, J.T. / Jagielski, B. / SPIE (Society) et al. | 2008
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Simultaneous measurement of internal and external profiles using a ring beam device [7066-13]Wakayama, T. / Yoshizawa, T. / SPIE (Society) et al. | 2008
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Geometric errors in 3D optical metrology systems [7066-02]Harding, K. / Nafis, C. / SPIE (Society) et al. | 2008
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Standardization of noncontact 3D measurement (Keynote Paper) [7066-01]Takatsuji, T. / Osawa, S. / Sato, O. / SPIE (Society) et al. | 2008
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Merging of range images for inspection or safety applications [7066-22]Mure-Dubois, J. / Hugli, H. / SPIE (Society) et al. | 2008
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Development of real-time shape measurement system using whole-space tabulation method [7066-05]Fujigaki, M. / Takagishi, A. / Matui, T. / Morimoto, Y. / SPIE (Society) et al. | 2008
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Calibration of a soft x-ray projection system [7066-20]Schmitt, R. / Damm, B. / Volk, R. / SPIE (Society) et al. | 2008