A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity [7155-62] (English)
- New search for: Wang, J.
- New search for: Asundi, A.K.
- New search for: Nanyang Technological University
- New search for: National University of Singapore
- New search for: Singapore
- New search for: Singapore Institue of Manufacturing Technology
- New search for: Wang, J.
- New search for: Asundi, A.K.
- New search for: Quan, Chenggen
- New search for: Asundi, Anand
- New search for: Nanyang Technological University
- New search for: National University of Singapore
- New search for: Singapore
- New search for: Singapore Institue of Manufacturing Technology
In:
International symposium on laser metrology
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7155 1R
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2008
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ISBN:
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ISSN:
- Conference paper / Print
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Title:A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity [7155-62]
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Contributors:Wang, J. ( author ) / Asundi, A.K. ( author ) / Quan, Chenggen / Asundi, Anand / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology
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Conference:9th, International symposium on laser metrology ; 2008 ; Singapore
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Published in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 7155 ; 7155 1R
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Publisher:
- New search for: SPIE
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Place of publication:Bellingham, Wash.
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Publication date:2008-01-01
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Size:7155 1R
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Remarks:Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 71550A
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Structure measurement of phase grating on post-magnification digital micro-holographyZhou, Wenjing / Yu, Yingjie / Asundi, Anand et al. | 2008
- 71550B
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Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive componentsYan, Hao / Asundi, Anand et al. | 2008
- 71550C
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Reduction of speckle noise by multi-kinoforms in holographic three-dimensional displayZheng, Huadong / Yu, Yingjie / Qian, Haiyan / Asundi, Anand et al. | 2008
- 71550D
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Deformation analysis on micro objects using multiple wavelength microscopic TV holographyKumar, U. Paul / Mohan, N. Krishna / Kothiyal, M. P. / Asundi, A. K. et al. | 2008
- 71550E
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Applications of laser ultrasound NDT methods on composite structures in aerospace industryKalms, Michael / Focke, Oliver / v. Kopylow, Christoph et al. | 2008
- 71550F
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Experimental study of unconveniant static and dynamic deformations of piezoelectric actuatorsBorza, D. N. et al. | 2008
- 71550G
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Long-term reliability measurements on MEMS using a laser-Doppler vibrometerDe Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. et al. | 2008
- 71550H
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Defect inspection by an active 3D multiresolution techniqueVargas, Javier / Quiroga, Juan Antonio et al. | 2008
- 71550I
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Development of a metrological atomic force microscope for nano-scale standards calibrationWang, S. H. / Xu, G. / Tan, S. L. et al. | 2008
- 71550J
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In-situ evaluation of nanoparticle diameter for visualizing self-assembly processOta, Satoshi / Hayashi, Terutake / Takaya, Yasuhiro et al. | 2008
- 71550K
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Evaluation on the probing error of a micro-coordinate measuring machineChao, Z. X. / Tan, S. L. / Xu, G. et al. | 2008
- 71550L
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High-resolution interferometry with Nd:YAG laser for local probe microscopyLazar, Josef / Šerý, Mojmír et al. | 2008
- 71550M
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High throughput measurement techniques for wafer level yield inspection of MEMS devicesVarela Pedreira, O. / Lauwagie, T. / De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. et al. | 2008
- 71550N
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Frequency-shifting method for phase retrieval from fringe patternsWang, Haixia / Qian, Kemao / Gao, Wenjing et al. | 2008
- 71550O
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Fast auto-focusing based on partial image characteristicsCui, Jiwen / Tan, Jiubin et al. | 2008
- 71550P
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Inspection method for directional texture defects on steel strip surfaceCong, J. H. / Yan, Y. H. et al. | 2008
- 71550Q
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General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGAGao, Wenjing / Qian, Kemao / Wang, Haixia / Lin, Feng / Seah, Hock Soon / Cheong, Lee Sing et al. | 2008
- 71550R
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Phase measurement via in-line digital holographic microscopyQu, Weijuan / Yu, Yingjie / Zhou, Wenjing / Yan, Hao / Asundi, Anand et al. | 2008
- 71550S
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Random-phase-shift Fizeau interferometerDoloca, Nicolae Radu / Tutsch, Rainer et al. | 2008
- 71550T
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Faster window Fourier transform filters for fringe pattern analysisNam, Le Tran Hoai / Qian, Kemao et al. | 2008
- 71550U
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Application of plate vibration and DSPI in evaluation of elastic modulusKumar, Rajesh / Shakher, Chandra et al. | 2008
- 71550V
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Optical metrology of micro- and nanostructures at PTB: status and future developmentsBodermann, Bernd / Buhr, Egbert / Ehret, Gerd / Scholze, Frank / Wurm, Matthias et al. | 2008
- 71550W
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Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometrySchuster, Thomas / Rafler, Stephan / Frenner, Karsten / Osten, Wolfgang et al. | 2008
- 71550X
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Detection and active stabilization of beams position at a high-resolution laser interferometerBuchta, Zdeněk / Šmíd, Radek / Lazar, Josef et al. | 2008
- 71550Y
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Model-free and model-based methods for dimensional metrology during the lifetime of a productWeidner, Peter / Kasic, Alexander / Hingst, Thomas / Ehlers, Carsten / Philipp, Sylke / Marschner, Thomas / Moert, Manfred et al. | 2008
- 71550Z
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Determination of flatness on patterned wafer surfaces using wavefront sensing methodsNutsch, A. / Pfitzner, L. / Grandin, T. / Levecq, X. / Bucourt, S. et al. | 2008
- 71551A
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A double-prism lateral shear interferometer for wavefront analysis and collimation testingHii, K. U. / Kwek, K. H. et al. | 2008
- 71551B
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A cube splitter interferometer for phase shifting interferometry and birefringence analysisBhattacharya, K. / Ghosh, N. et al. | 2008
- 71551C
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Model building and measurement of the temporal noise for thermal infrared imagerYu, Xun / Nie, Liang / Hu, Tieli / Jiang, Xu / Wang, Fang et al. | 2008
- 71551D
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Speckle noise suppression in shape and deformation measurements by phase-shifting digital holographyYamaguchi, Ichirou et al. | 2008
- 71551E
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A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel componentsLiu, T. / Malcolm, A. A. / Yin, X. M. / Liew, S. J. / Prawiradiraja, T. P. et al. | 2008
- 71551F
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Full-field swept-source optical coherence tomography with Gaussian spectral shapingDubey, Satish Kumar / Sheoran, Gyanendra / Anna, Tulsi / Anand, Arun / Mehta, Dalip Singh / Shakher, Chandra et al. | 2008
- 71551G
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Phase shifting interferograms processing for fiber point-diffraction interferometerNie, Liang / Han, Jun / Yu, Xun / Liu, Baoyuan / Jiang, Xu / Wang, Fang et al. | 2008
- 71551H
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Study on a new method for measuring volumetric error of CMMShi, Enxiu / Guo, Junjie / Huang, Yumei et al. | 2008
- 71551I
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Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transformChen, Wen / Quan, Chenggen / Tay, Cho Jui et al. | 2008
- 71551J
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Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrievalMaallo, Anne Margarette S. / Almoro, Percival F. et al. | 2008
- 71551K
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On-line digital holographic measurement of size and shape of microparticles for crystallization processesKhanam, Taslima / Darakis, Emmanouil / Rajendran, Arvind / Kariwala, Vinay / Asundi, Anand K. / Naughton, Thomas J. et al. | 2008
- 71551L
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Reduction of speckle noise in digital holographic images using wavelet transformSharma, Akshay / Sheoran, Gyanendra / Jaffery, Z. A. / Moinuddin, . et al. | 2008
- 71551M
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The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing systemKo, C. L. / Yang, C. Y. / Huang, K. R. / Shih, Ming Chang et al. | 2008
- 71551N
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NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sectionsFindeis, Dirk / Gryzagoridis, Jasson / Musonda, Vincent et al. | 2008
- 71551O
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Development of an inexpensive optical method for studies of dental erosion process in vitroNasution, A. M. T. / Noerjanto, B. / Triwanto, L. et al. | 2008
- 71551P
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Modeling of coupling coefficient as a function of coupling ratioSaktioto, . / Ali, Jalil / Fadhali, Mohammed / Rahman, Rosly Abdul / Zainal, Jasman et al. | 2008
- 71551Q
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3D investigation of photonics elements by means of interferometric and photoelastic tomographyKumar, N. / Kujawinska, M. / Kniazewski, P. et al. | 2008
- 71551R
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A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivityWang, J. / Asundi, Anand K. et al. | 2008
- 71551S
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Precision optical metrology for MEMSmPryputniewicz, Ryszard J. et al. | 2008
- 71551T
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A path planning method for large-scale blade profile measurement based on neutral networkZhang, Fei / Jiang, Zhuang-de / Ding, Jian-jun / Li, Bing / Chen, Lei et al. | 2008
- 71551U
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Optical bi-sensorial measurement system for production control of extruded profilesWeckenmann, A. / Bernstein, J. et al. | 2008
- 71551V
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Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diodeAketagawa, Masato / Hoshino, Yuta / Ishige, Masashi / Banh Quoc, Tuan et al. | 2008
- 71551W
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Adaptive confocal system for 3-D profilingK., Ravi Kumar / Shen, Vernon Jialiang / Talukdar, Amitava / Asundi, Anand et al. | 2008
- 71551X
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Measurement of temperature field in steady laminar free convection flow using digital holographyShakher, Chandra / Hossain, Md. Mosarraf / Mehta, Dalip Singh / Sheoran, Gyanendra et al. | 2008
- 71551Y
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Laser spectroscopic study of acetate-capped colloidal ZnO nanoparticlesOh, S. A. / Sim, X. W. / Tripathy, S. et al. | 2008
- 71551Z
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The output characteristics of the erbium-doped fiber Bragg grating ring laserYang, C. Y. / Ko, C. L. / Huang, K. R. / Shih, Ming Chang et al. | 2008
- 71552A
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Static and dynamic 3D contouring by using structured lightRodriguez-Vera, R. / Vasquez, D. / Genovese, K. / Rayas, J. A. / Mendoza-Santoyo, F. et al. | 2008
- 71552B
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Temporal Paul wavelet analysis for phase retrieval using shadow moire techniqueNiu, H. T. / Quan, C. / Tay, C. J. et al. | 2008
- 71552C
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Whole field residual stress measurement using computer aided reflection gratingNg, Chi Seng / Goh, Yoke Chin / Asundi, Anand K. et al. | 2008
- 71552D
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The effects of post-annealing on pulse laser deposition of Zr0.8Sn0.2TiO4thin film on Si(100)Chuang, C. T. / Shih, Ming Chang / Weng, M. H. et al. | 2008
- 71552E
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Ultra-thin-film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR)Burki, Ibrahim / Rivas, Cristian et al. | 2008
- 71552F
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Infrared of thin film graphene in a magnetic field and the Hall effectShrivastava, Keshav N. et al. | 2008
- 71552G
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Inspection of electroplated goldNg, T. W. / Yong, F. Y. et al. | 2008
- 71552H
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Sub-pixel matching with consideration of lens distortionDong, Shihao / Zhao, Xiaobo / Yin, Yongkai / Tian, Jindong / Peng, Xiang et al. | 2008
- 71552I
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The measurement of polymerization shrinkage of composite resins with ESPIZhang, Zhang / Yang, Guo Biao et al. | 2008
- 71552J
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Study on topography measurement of ultra-smooth surfaceLi, Yuhe / Tong, XiaoLei / Lin, Haoshan / Li, Huiyu / Li, Qingxiang et al. | 2008
- 71552K
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Study on measurement method for projectile location based on light screenHan, Feng / Liu, QunHua / Sun, GuoBin et al. | 2008
- 71552L
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Microlens testing: an applicationNg-Lee, Hooi Leng / Goh, Seach Chyr Ernest / Ranjit, Chris Stephen Naveen / Maryanto, . / Ng, Jie Ying Sarah / Asundi, Anand et al. | 2008
- 71552M
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Application of laser tracker used in the measuring and the adjusting of the workbench for SAR antennaYan, Bixi / Wang, Jun / Lu, Naiguang / Deng, Wenyi / Dong, Mingli / Lou, Xiaoping et al. | 2008
- 71552N
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Study on key algorithm for scanning white-light interferometryTian, Ailing / Wang, Chunhui / Jiang, Zhuangde / Wang, Hongjun / Liu, Bingcai et al. | 2008
- 71552O
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High-power laser diode array system for optical pumping of RbBuchta, Zdenek / Cíp, Ondrej / Rychnovský, Jan / Lazar, Josef et al. | 2008
- 71552P
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Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratchLin, Haoshan / Li, Yuhe / Wang, Dongsheng / Liu, Mei et al. | 2008
- 71552Q
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Error analysis and compensation of binocular-stereo-vision measurement systemZhang, Tao / Guo, Junjie et al. | 2008
- 71552R
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Research of the conical cavity high-energy laser energy meter energy loss compensation techniqueYu, Xun / Li, Qian / Nie, Liang / Shang, Xiaoyan / Liu, Baoyuan et al. | 2008
- 71552S
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Design of laser source for fiber point diffraction interferometerYu, Xun / Nie, Liang / Han, Jun / Liu, Baoyuan / Jiang, Xu et al. | 2008
- 71552T
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Stabilization of semiconductor lasers by fiber Bragg gratingsMikel, Bretislav / Helan, Radek / Cip, Ondrej / Jedlicka, Petr et al. | 2008
- 71552U
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The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurementZhang, Lu / Zhao, Hong / Wang, Xiaopin / Zhang, Weiguang et al. | 2008
- 71552V
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Vibration influence and error compensation of aspherical surface interferometerWang, Hongjun / Cao, Jianfeng / Tian, Ailing / Liu, Bingcai et al. | 2008
- 71552W
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Investigation of light scattering for scratch detectionZhong, Z. W. / Zhao, L. P. / Wang, L. J. et al. | 2008
- 71552X
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The interaction performance of white light, laser diode and He-Ne laser with two wavefront sensing systemsZhong, Z. W. / Zhao, L. P. / Hein, A. A. et al. | 2008
- 71552Y
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The high resolution actuator based on giant magnetostrictionWang, Lei / Tan, Jiu-bin / Zhang, Shan et al. | 2008
- 71552Z
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Rigorous accuracy analysis of the fiber point diffraction interferometerHan, Jun / Nie, Liang / Yu, Xun / Jiang, Xu / Wang, Fang et al. | 2008
- 71553A
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Application research of spectrum measurement technology in thin-film thickness wideband monitoring systemHan, Jun / Shang, Xiao-yan / An, Yu-ying / Jiang, Xu / Wang, Fang et al. | 2008
- 71553B
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Raman scattering from Zn/ZnO core-shell nanoparticlesBajaj, Geetika / Soni, R. K. et al. | 2008
- 71553C
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Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopyHabib, K. / Al-Sabti, F. et al. | 2008
- 715501
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Front Matter: Volume 7155| 2008
- 715503
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Some answers to new challenges in optical metrologyOsten, W. et al. | 2008
- 715505
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Hardware-based error compensation in 3D optical metrology systemsHarding, Kevin et al. | 2008
- 715506
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Characterization of optical surfaces for the present generations of synchrotron sourcesThomasset, M. / Polack, F. et al. | 2008
- 715508
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Enhanced resolution methods in shearography and holography for time-average vibration measurementBorza, D. N. et al. | 2008
- 715509
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Characterisation of laser marks using digital holographic microscopySingh, Vijay Raj / Chee, Oi Choo / Sim, Eddy / Asundi, Anand et al. | 2008
- 715510
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New simplified measuring method for distributed low-level birefringenceGomi, Kenji / Suzuki, Tomoyuki / Niitsu, Yasushi / Ichinose, Kensuke et al. | 2008
- 715511
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Phase shift polarimetry for non-invasive detection of laser-induced damageWang, Pin / Asundi, Anand et al. | 2008
- 715512
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Residual stress in silicon wafer using IR polariscopeLu, Zhijia / Wang, Pin / Asundi, Anand et al. | 2008
- 715513
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Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniquesPfister, Thorsten / Günther, Philipp / Büttner, Lars / Czarske, Jürgen et al. | 2008
- 715514
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An endoscopic optical system for inner cylindrical measurement using fringe projectionAlbertazzi G., Armando / Hofmann, Allan C. / Fantin, Analucia V. / Santos, João M. C. et al. | 2008
- 715515
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Surface measurement with Shack-Hartmann wavefront sensing technologyLi, X. / Zhao, L. P. / Fang, Z. P. / Asundi, A. / Yin, X. M. et al. | 2008
- 715516
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A simple method to estimate surface reflectance parameters for three light photometric stereoYounes, Mohammad A. / Al-Nady, M. A. et al. | 2008
- 715517
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A low-cost antenna reflector shape and distortion measuring system with high accuracyLi, Xudong / Jiang, Hongzhi / Zhou, Jie / Li, Dong / Zhao, Huijie et al. | 2008
- 715518
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The comparison of different temporal phase analysis algorithms in optical dynamic measurementMiao, H. / Fu, Y. et al. | 2008
- 715519
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A polarization sensitive interferometer for stress analysisSarkar, Mahuya / Sarkar, S. K. / Basuray, A. et al. | 2008
- 715520
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Active alignment and reliable pigtailing of laser diode transmitterFadhali, M. / Saktioto, . / Zainal, J. / Munajat, Y. / Ali, J. / Rahman, R. et al. | 2008
- 715521
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Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan techniqueSreeja, R. / Reshmi, R. / Manu, George / Jayaraj, M. K. et al. | 2008
- 715522
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Influence of iodine cell quality onto the stability and absolute frequency shifts of laser etalonsHrabina, Jan / Lazar, Josef / Jedlicka, Petr / Cip, Ondrej et al. | 2008
- 715523
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Investigation of laser produced Fe plasma plume dynamics using time resolved imaging and snow plow modelMahmood, S. / Jiaji, L. / Springham, S. V. / Tan, T. L. / Rawat, R. S. / Lee, P. et al. | 2008
- 715524
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Processing of digital holograms for size measurements of microparticleseDarakis, Emmanouil / Khanam, Taslima / Rajendran, Arvind / Kariwala, Vinay / Asundi, Anand K. / Naughton, Thomas J. et al. | 2008
- 715525
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A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurementAlbertazzi G., Armando / Viotti, Matias R. / Kapp, Walter A. et al. | 2008
- 715526
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Electronics speckle interferometry applications for NDE of spacecraft structural componentsRao, M. V. / Samuel, R. / Ananthan, A. / Dasgupta, S. / Nair, P. S. et al. | 2008
- 715528
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Moire fringe method for the measurement of distortions of hot-embossed polymeric substratesTaylor, Hayden K. / Xu, Zhiguang / Li, Shiguang / Youcef-Toumi, Kamal / Fatt, Yoon Soon / Boning, Duane S. et al. | 2008
- 715529
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Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matchingChan, H. M. / Yen, K. S. / Ratnam, M. M. et al. | 2008
- 715530
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Robust isoclinic calculation for automatic analysis of photoelastic fringe patternsQuiroga, J. A. / Pascual, E. / Villa-Hernandez, J. et al. | 2008
- 715531
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Fast wavefront estimation using multiple directional derivatives and quadrature transformLegarda-Saenz, Ricardo et al. | 2008
- 715532
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Influence of TFT-LCD pixel structure on holographic representationWang, Hongjun / Wang, Zhao / Tian, Ailing / Liu, Bingcai et al. | 2008
- 715533
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Research of the automatic imaging focusing measurement for off-axis Fresnel digital holographyYu, Xun / Nie, Liang / Wang, Fang / Jiang, Xu et al. | 2008
- 715533
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Research of the automatic imaging focusing measurement for off-axis Fresnel digital holography [7155-110]Yu, X. / Nie, L. / Wang, F. / Jiang, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
- 715535
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Measurement of human embryonic stem cell in the growing cycleLi, X. / Zhao, L. / Oh, Steve K. W. / Chong, W. K. / Ong, J. K. / Chen, Allen K. / Choo, Andre B. H. et al. | 2008
- 715536
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Complete deformation analysis of transparent samples using digital shearography and holographyCatalan, Francesca Celine I. / Santos, Raphael D. / Almoro, Percival F. et al. | 2008
- 715537
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The nondestructive testing research on porcelain-fused-to-metal (PFM) of oral cavityYang, Guo-biao / Zhang, Zhang / Ding, Yi et al. | 2008
- 715538
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Development of a multi-resolution measurement system based on light sectioning methodZhang, Weiguang / Zhao, Hong / Zhou, Xiang / Zhang, Lu et al. | 2008
- 715539
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Three-dimensional profile measurement using a flexible new multiview connection methodZheng, Peng / Guo, Hongwei / Yu, Yingjie / Chen, Mingyi et al. | 2008
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Hardware-based error compensation in 3D optical metrology systems [7155-04]Harding, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Experimental study of unconveniant static and dynamic deformations of piezoelectric actuators [7155-14]Borza, D.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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In-situ evaluation of nanoparticle diameter for visualizing self-assembly process [7155-18]Ota, S. / Hayashi, T. / Takaya, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Fast auto-focusing based on partial image characteristics [7155-23]Cui, J. / Tan, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection method for directional texture defects on steel strip surface [7155-24]Cong, J.H. / Yan, Y.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Random-phase-shift Fizeau interferometer [7155-27]Doloca, N.R. / Tutsch, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Detection and active stabilization of beams position at a high-resolution laser interferometer [7155-32]Cip, O. / Buchta, Z. / Cizek, M. / Smid, R. / Lazar, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A low-cost antenna reflector shape and distortion measuring system with high accuracy [7155-42]Li, X. / Jiang, H. / Zhou, J. / Li, D. / Zhao, H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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On-line digital holographic measurement of size and shape of microparticles for crystallization processes [7155-55]Khanam, T. / Darakis, E. / Rajendran, A. / Kariwala, V. / Asundi, A.K. / Naughton, T.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Investigation of laser produced Fe plasma plume dynamics using time resolved imaging and snow plow model [7155-74]Mahmood, S. / Jiaji, L. / Springham, S.V. / Tan, T.L. / Rawat, R.S. / Lee, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Processing of digital holograms for size measurements of microparticles [7155-75]Darakis, E. / Khanam, T. / Rajendran, A. / Kariwala, V. / Asundi, A.K. / Naughton, T.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Temporal Paul wavelet analysis for phase retrieval using shadow moire technique [7155-82]Niu, H.T. / Quan, C. / Tay, C.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The measurement of polymerization shrinkage of composite resins with ESPI [7155-89]Zhang, Z. / Yang, G.B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
-
Error analysis and compensation of binocular-stereo-vision measurement system [7155-97]Zhang, T. / Guo, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Research of the conical cavity high-energy laser energy meter energy loss compensation technique [7155-98]Yu, X. / Li, Q. / Nie, L. / Shang, X. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Application of plate vibration and DSPI in evaluation of elastic modulus [7155-29]Kumar, R. / Shakher, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Active alignment and reliable pigtailing of laser diode transmitter [7155-71]Fadhali, M. / Saktioto / Zainal, J. / Munajat, Y. / Ali, J. / Rahman, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Vibration influence and error compensation of aspherical surface interferometer [7155-102]Wang, H. / Cao, J. / Tian, A. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The study of sheath flow dark zone phenomenon in dynamic individual cells scattering measurement [7155-101]Zhang, L. / Zhao, H. / Wang, X. / Zhang, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The interaction performance of white light, laser diode, and He-Ne laser with two wavefront sensing systems [7155-104]Zhong, Z.W. / Zhao, L.P. / Hein, A.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Robust isoclinic calculation for automatic analysis of photoelastic fringe patterns [7155-107]Quiroga, J.A. / Pascual, E. / Villa-Hernandez, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Some answers to new challenges in optical metrology [7155-02]Osten, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Characterization of optical surfaces for the present generations of synchrotron sources [7155-05]Thomasset, M. / Polack, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Characterisation of laser marks using digital holographic microscopy [7155-08]Singh, V.R. / Chee, O.C. / Sim, E. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of a metrological atomic force microscope for nano-scale standards calibration [7155-17]Wang, S.H. / Xu, G. / Tan, S.L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Defect inspection by an active 3D multiresolution technique [7155-16]Vargas, J. / Quiroga, J.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Speckle noise suppression in shape and deformation measurements by phase-shifting digital holography [7155-48]Yamaguchi, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Measurement of temperature field in steady laminar free convection flow using digital holography [7155-68]Shakher, C. / Hossain, M.M. / Mehta, D.S. / Sheoran, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Laser spectroscopic study of acetate-capped colloidal ZnO nanoparticles [7155-69]Oh, S.A. / Sim, X.W. / Tripathy, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A radial in-plane DSPI interferometer using diffractive optics for residual stresses measurement [7155-76]Albertazzi G., A. / Viotti, M.R. / Kapp, W.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Whole field residual stress measurement using computer aided reflection grating [7155-83]Ng, C.S. / Goh, Y.C. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Microlens testing: an application [7155-92]Ng-Lee, H.L. / Goh, S.C.E. / Ranjit, C.S.N. / Maryanto / Ng, J.Y.S. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of a multi-resolution measurement system based on light sectioning method [7155-115]Zhang, W. / Zhao, H. / Zhou, X. / Zhang, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Structure measurement of phase grating on post-magnification digital micro-holography [7155-09]Zhou, W. / Yu, Y. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Reduction of speckle noise by multi-kinoforms in holographic three-dimensional display [7155-11]Zheng, H. / Yu, Y. / Qian, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A polarization sensitive interferometer for stress analysis [7155-44]Sarkar, M. / Sarkar, S.K. / Basuray, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Model building and measurement of the temporal noise for thermal infrared imager [7155-47]Yu, X. / Nie, L. / Hu, T. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components [7155-49]Liu, T. / Malcolm, A.A. / Yin, X.M. / Liew, S.J. / Prawiradiraja, T.P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing system [7155-57]Ko, C.L. / Yang, C.Y. / Huang, K.R. / Shih, M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Development of an inexpensive optical method for studies of dental erosion process in vitro [7155-59]Nasution, A.M.T. / Noerjanto, B. / Triwanto, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Moire fringe method for the measurement of distortions of hot-embossed polymeric substrates [7155-79]Taylor, H.K. / Xu, Z. / Li, S. / Youcef-Toumi, K. / Fatt, Y.S. / Boning, D.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection of electroplated gold [7155-87]Ng, T.W. / Yong, F.Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The high resolution actuator based on giant magnetostriction [7155-105]Wang, L. / Tan, J. / Zhang, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Three-dimensional profile measurement using a flexible new multiview connection method [7155-116]Zheng, P. / Guo, H. / Yu, Y. / Chen, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Model-free and model-based methods for dimensional metrology during the lifetime of a product [7155-33]Weidner, P. / Kasic, A. / Hingst, T. / Ehlers, C. / Philipp, S. / Marschner, T. / Moert, M. / Nanyang Technological University / National University of Singapore / Singapore et al. | 2008
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Phase shift polarimetry for non-invasive detection of laser-induced damage [7155-36]Wang, P. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Precision optical metrology for MEMS [7155-63]Pryputniewicz, R.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Adaptive confocal system for 3-D profiling [7155-67]K., R.K. / Shen, V.J. / Talukdar, A. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The output characteristics of the erbium-doped fiber Bragg grating ring laser [7155-70]Yang, C.Y. / Ko, C.L. / Huang, K.R. / Shih, M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Determination of third-order optical absorptive nonlinearity of ZnO nanoparticles by Z-scan technique [7155-72]Sreeja, R. / Reshmi, R. / Manu, G. / Jayaraj, M.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Electronics speckle interferometry applications for NDE of spacecraft structural components [7155-77]Rao, M.V. / Samuel, R. / Ananthan, A. / Dasgupta, S. / Nair, P.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Crack displacement sensing and measurement in concrete using circular grating moire fringes and pattern matching [7155-80]Chan, H.M. / Yen, K.S. / Ratnam, M.M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Sub-pixel matching with consideration of lens distortion [7155-88]Dong, S. / Zhao, X. / Yin, Y. / Tian, J. / Peng, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Fast wavefront estimation using multiple directional derivatives and quadrature transform [7155-108]Legarda-Saenz, R. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Rigorous accuracy analysis of the fiber point diffraction interferometer [7155-106]Han, J. / Nie, L. / Yu, X. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Measurement of human embryonic stem cell in the growing cycle [7155-112]Li, X. / Zhao, L. / Oh, S.K.W. / Chong, W.K. / Ong, J.K. / Chen, A.K. / Choo, A.B.H. / Nanyang Technological University / National University of Singapore / Singapore et al. | 2008
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Faster window Fourier transform filters for fringe pattern analysis [7155-28]Nam, L.T.H. / Qian, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Surface measurement with Shack-Hartmann wavefront sensing technology [7155-40]Li, X. / Zhao, L.P. / Fang, Z.P. / Asundi, A. / Yin, X.M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The comparison of different temporal phase analysis algorithms in optical dynamic measurement [7155-43]Miao, H. / Fu, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Design of laser source for fiber point diffraction interferometer [7155-99]Yu, X. / Nie, L. / Han, J. / Liu, B. / Jiang, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Stabilization of semiconductor lasers by fiber Bragg gratings [7155-100]Mikel, B. / Helan, R. / Cip, O. / Jedlicka, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopy [7155-119]Habib, K. / Al-Sabti, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Raman scattering from Zn/ZnO core-shell nanoparticles [7155-118]Bajaj, G. / Soni, R.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Enhanced resolution methods in shearography and holography for time-average vibration measurement [7155-07]Borza, D.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Applications of laser ultrasound NDT methods on composite structures in the aerospace industry [7155-13]Kalms, M. / Focke, O. / Kopylow, C.v. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Evaluation on the probing error of a micro-coordinate measuring machine [7155-19]Chao, Z.X. / Tan, S.L. / Xu, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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An endoscopic optical system for inner cylindrical measurement using fringe projection [7155-39]Albertazzi G., A. / Hofmann, A.C. / Fantin, A.V. / Santos, J.M.C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrieval [7155-54]Maallo, A.M.S. / Almoro, P.F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity [7155-62]Wang, J. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Application of laser tracker used in the measuring and the adjusting of the workbench for SAR antenna [7155-93]Yan, B. / Wang, J. / Lu, N. / Deng, W. / Dong, M. / Lou, X. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Long-term reliability measurements on MEMS using a laser-Doppler vibrometer [7155-15]De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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New simplified measuring method for distributed low-level birefringence [7155-35]Gomi, K. / Suzuki, T. / Niitsu, Y. / Ichinose, K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Reduction of speckle noise in digital holographic images using wavelet transform [7155-56]Sharma, A. / Sheoran, G. / Jaffery, Z.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sections [7155-58]Findeis, D. / Gryzagoridis, J. / Musonda, V. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A path planning method for large-scale blade profile measurement based on neutral network [7155-64]Zhang, F. / Jiang, Z. / Ding, J. / Li, B. / Chen, L. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of iodine cell quality onto the stability and absolute frequency shifts of laser etalons [7155-73]Hrabina, J. / Lazar, J. / Jedlicka, P. / Cip, O. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Infrared of thin film graphene in a magnetic field and the Hall effect [7155-86]Shrivastava, K.N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on key algorithm for scanning white-light interferometry [7155-94]Tian, A. / Wang, C. / Jiang, Z. / Wang, H. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Error analysis of frequency mixing on heterodyne interferometry detecting device for superfinish surface scratch [7155-96]Lin, H. / Li, Y. / Wang, D. / Liu, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Investigation of light scattering for scratch detection [7155-103]Zhong, Z.W. / Zhao, L.P. / Wang, L.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of TFT-LCD pixel structure on holographic representation [7155-109]Wang, H. / Wang, Z. / Tian, A. / Liu, B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Frequency-shifting method for phase retrieval from fringe patterns [7155-22]Wang, H. / Qian, K. / Gao, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Residual stress in silicon wafer using IR polariscope [7155-37]Lu, Z. / Wang, P. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniques [7155-38]Pfister, T. / Gunther, P. / Buttner, L. / Czarske, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on a new method for measuring volumetric error of CMM [7155-52]Shi, E. / Guo, J. / Huang, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Modeling of coupling coefficient as a function of coupling ratio [7155-60]Saktioto / Ali, J. / Fadhali, M. / Rahman, R.A. / Zainal, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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3D investigation of photonics elements by means of interferometric and photoelastic tomography [7155-61]Kumar, N. / Kujawinska, M. / Kniazewski, P. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The effects of post-annealing on pulse laser deposition of Zr~0~.~8Sn~0~.~2TiO~4 thin film on Si(100) [7155-84]Chuang, C.T. / Shih, M.C. / Weng, M.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on measurement method for projectile location based on light screen [7155-91]Han, F. / Liu, Q. / Sun, G. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High-power laser diode array system for optical pumping of Rb [7155-95]Buchta, Z. / Cip, O. / Rychnovsky, J. / Lazar, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive components [7155-10]Yan, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High throughput measurement techniques for wafer level yield inspection of MEMS devices [7155-21]Pedreira, O.V. / Lauwagie, T. / De Coster, J. / Haspeslagh, L. / Witvrouw, A. / De Wolf, I. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGA [7155-25]Gao, W. / Qian, K. / Wang, H. / Lin, F. / Seah, H.S. / Cheong, L.S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Determination of flatness on patterned wafer surfaces using wavefront sensing methods [7155-34]Nutsch, A. / Pfitzner, L. / Grandin, T. / Levecq, X. / Bucourt, S. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A simple method to estimate surface reflectance parameters for three light photometric stereo [7155-41]Younes, M.A. / Al-Nady, M.A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A cube splitter interferometer for phase shifting interferometry and birefringence analysis [7155-46]Bhattacharya, K. / Ghosh, N. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase shifting interferograms processing for fiber point-diffraction interferometer [7155-51]Nie, L. / Han, J. / Yu, X. / Liu, B. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Optical bi-sensorial measurement system for production control of extruded profiles [7155-65]Weckenmann, A. / Bernstein, J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Static and dynamic 3D contouring by using structured light [7155-81]Rodriguez-Vera, R. / Vasquez, D. / Genovese, K. / Rayas, J.A. / Mendoza-Santoyo, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Ultra-thin-film characterization with vacuum ultraviolet spectroscopic reflectometry (VUV-SR) [7155-85]Burki, I. / Rivas, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Study on topography measurement of ultra-smooth surface [7155-90]Li, Y. / Tong, X. / Lin, H. / Li, H. / Li, Q. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Application research of spectrum measurement technology in thin-film thickness wideband monitoring system [7155-117]Han, J. / Shang, X. / An, Y. / Jiang, X. / Wang, F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase measurement via in-line digital holographic microscopy [7155-26]Qu, W. / Yu, Y. / Zhou, W. / Yan, H. / Asundi, A. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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A double-prism lateral shear interferometer for wavefront analysis and collimation testing [7155-45]Hii, K.U. / Kwek, K.H. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Full-field swept-source optical coherence tomography with Gaussian spectral shaping [7155-50]Dubey, S.K. / Sheoran, G. / Anna, T. / Anand, A. / Mehta, D.S. / Shakher, C. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform [7155-53]Chen, W. / Quan, C. / Tay, C.J. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Measurement of air-refractive-index fluctuation from frequency change using phase modulation homodyne interferometer and external cavity laser diode [7155-66]Aketagawa, M. / Hoshino, Y. / Ishige, M. / Quoc, T.B. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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The nondestructive testing research on porcelain-fused-to-metal (PFM) of oral cavity [7155-114]Yang, G. / Zhang, Z. / Ding, Y. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Deformation analysis on micro objects using multiple wavelength microscopic TV holography [7155-12]Kumar, U.P. / Mohan, N.K. / Kothiyal, M.P. / Asundi, A.K. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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High-resolution interferometry with Nd:YAG laser for local probe microscopy [7155-20]Lazar, J. / Cip, O. / Cizek, M. / Sery, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Optical metrology of micro- and nanostructures at PTB: status and future developments [7155-30]Bodermann, B. / Buhr, E. / Ehret, G. / Scholze, F. / Wurm, M. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometry [7155-31]Schuster, T. / Rafler, S. / Frenner, K. / Osten, W. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008
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Complete deformation analysis of transparent samples using digital shearography and holography [7155-113]Catalan, F.C.I. / Santos, R.D. / Almoro, P.F. / Nanyang Technological University / National University of Singapore / Singapore / Singapore Institue of Manufacturing Technology et al. | 2008