Nanodispersion, nonlinear image filtering, and materials classification [8036-17] (English)
- New search for: Crosta, G.F.
- New search for: Lee, J.S.
- New search for: Crosta, G.F.
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- New search for: Postek, Michael T.
In:
Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences
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8036 0I
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2011
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ISBN:
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ISSN:
- Conference paper / Print
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Title:Nanodispersion, nonlinear image filtering, and materials classification [8036-17]
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Contributors:
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Conference:Conference, Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 2011 ; Orlando, FL
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Published in:PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8036 ; 8036 0I
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Publisher:
- New search for: SPIE
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Place of publication:Bellingham, WA
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Publication date:2011-01-01
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Size:8036 0I
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Remarks:Also known as SCANNING 2011. Held with SPIE defense, security, and sensing 2011 (DSS 2011) conference. Includes bibliographical references and author index.
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 80360D
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Advanced image composition with intra-frame drift correctionCizmar, Petr / Vladár, András E. / Postek, Michael T. et al. | 2011
- 80360E
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The characterization of nanoparticles using analytical electron microscopyHill, Whitney B. et al. | 2011
- 80360F
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Transmission electron microscopy of electrospun GaN nanofibersRobles-García, Joshua L. / Meléndez, Anamaris / Yates, Douglas / Santiago-Avilés, Jorge J. / Ramos, Idalia / Campo, Eva M. et al. | 2011
- 80360G
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Study of LCE nanocomposites through electron microscopyTorras, N. / Jobet, J. / Marshall, J. E. / Zinoviev, K. / Yates, D. / Rotkina, L. / Esteve, J. / Terentjev, E. M. / Campo, E. M. et al. | 2011
- 80360H
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Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosionCrosta, Giovanni F. et al. | 2011
- 80360I
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Nanodispersion, nonlinear image filtering, and materials classificationCrosta, Giovanni F. / Lee, Jun S. et al. | 2011
- 80360K
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Investigation of cellular interactions of nanoparticles by helium ion microscopyArey, B. W. / Shutthanandan, V. / Xie, Y. / Tolic, A. / Williams, N. / Orr, G. et al. | 2011
- 80360M
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Creating nanohole arrays with the helium ion microscopeAnanth, Mohan / Stern, Lewis / Ferranti, David / Huynh, Chuong / Notte, John / Scipioni, Larry / Sanford, Colin / Thompson, Bill et al. | 2011
- 80360O
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Secondary electron emission spectra and energy selective imaging in helium ion microscopePetrov, Yu. / Vyvenko, O. et al. | 2011
- 80360P
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A metrological scanning probe microscope based on a quartz tuning fork detectorBabic, Bakir / Freund, Christopher H. / Lawn, Malcolm / Miles, John R. / Herrmann, Jan et al. | 2011
- 80360Q
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Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFMKorpelainen, V. / Seppä, J. / Lassila, A. et al. | 2011
- 80360R
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Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stageWang, S. H. / Tan, S. L. / Xu, G. et al. | 2011
- 80360S
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Traceable calibration of a critical dimension atomic force microscopeDixson, Ronald / Orji, Ndubuisi G. / McGray, Craig D. / Geist, Jon et al. | 2011
- 80360T
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Particle number density gradient samples for nanoparticle metrology with atomic force microscopyLawn, Malcolm A. / Goreham, Renee V. / Herrmann, Jan / Jämting, Asa K. et al. | 2011
- 80360U
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Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJSugawara, Kentaro / Sato, Osamu / Misumi, Ichiko / Gonda, Satoshi / Lu, Mingzi et al. | 2011
- 80360V
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New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategyDai, G. / Hässler-Grohne, W. / Hüser, D. / Wolff, H. / Fluegge, J. / Bosse, H. et al. | 2011
- 803601
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Front Matter: Volume 8036| 2011
- 803602
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Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shapeNewbury, Dale E. / Ritchie, Nicholas W. M. et al. | 2011
- 803604
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Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summaryWyatt, J. Matney et al. | 2011
- 803605
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Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samplesWhite, Robert S. / Mershon, William J. et al. | 2011
- 803606
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Scientific working group on gunshot residue (SWGGSR): a progress reportTrimpe, Michael A. et al. | 2011
- 803607
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Characterization and source identification of fugitive dusts by light and electron microscopyBrown, Richard S. et al. | 2011
- 803608
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Application possibilities of several modern methods of microscopy and microanalysis in forensic science fieldKotrly, Marek / Turkova, Ivana et al. | 2011
- 803610
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Through-focus scanning optical microscopyAttota, Ravikiran / Dixson, Ronald G. / Vladár, Andras E. et al. | 2011
- 803612
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Dispersion free all reflective confocal microscope objectiveWalecki, Wojtek J. / Scaggs, Mike / Walecki, Peter S. / Szondy, Fanny et al. | 2011
- 803613
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Use of fluorescence and scanning electron microscopy as tools in teaching biologyGhosh, Nabarun / Silva, Jessica / Vazquez, Aracely / Das, A B. / Smith, Don W. et al. | 2011
- 803615
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3D-measurement using a scanning electron microscope with four Everhart-Thornley detectorsVynnyk, Taras / Scheuer, Renke / Reithmeier, Eduard et al. | 2011
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Creating nanohole arrays with the helium ion microscope [8036-22]Ananth, M. / Stern, L. / Ferranti, D. / Huynh, C. / Notte, J. / Scipioni, L. / Sanford, C. / Thompson, B. et al. | 2011
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Investigation of cellular interactions of nanoparticles by helium ion microscopy [8036-20]Arey, B.W. / Shutthanandan, V. / Xie, Y. / Tolic, A. / Williams, N. / Orr, G. et al. | 2011
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Probative value of gunshot residue on victims of shootings and comparison of gunshot residue results with modern technology versus older testing of samples [8036-04]White, R.S. / Mershon, W.J. et al. | 2011
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Nanodispersion, nonlinear image filtering, and materials classification [8036-17]Crosta, G.F. / Lee, J.S. et al. | 2011
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Through-focus scanning optical microscopy [8036-36]Attota, R. / Dixson, R.G. / Vladar, A.E. et al. | 2011
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Secondary electron emission spectra and energy selective imaging in helium ion microscope [8036-24]Petrov, Y. / Vyvenko, O. et al. | 2011
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Development of photomask linewidth measurement and calibration using AFM and SEM in NMIJ [8036-30]Sugawara, K. / Sato, O. / Misumi, I. / Gonda, S. / Lu, M. et al. | 2011
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Is scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDS) quantitative? Effect of specimen shape (Keynote Paper) [8036-01]Newbury, D.E. / Ritchie, N.W.M. et al. | 2011
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The characterization of nanoparticles using analytical electron microscopy [8036-13]Hill, W.B. et al. | 2011
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New developments at PTB in 3D-AFM with tapping and torsion AFM mode and vector approach probing strategy [8036-31]Dai, G. / Hassler-Grohne, W. / Huser, D. / Wolff, H. / Fluegge, J. / Bosse, H. et al. | 2011
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Morphological classification and microanalysis of tire tread particles worn by abrasion or corrosion [8036-16]Crosta, G.F. et al. | 2011
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Particle number density gradient samples for nanoparticle metrology with atomic force microscopy [8036-29]Lawn, M.A. / Goreham, R.V. / Herrmann, J. / Jamting, A.K. et al. | 2011
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Measurement strategies and uncertainty estimations for pitch and step height calibrations by metrological AFM [8036-26]Korpelainen, V. / Seppa, J. / Lassila, A. et al. | 2011
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Analysis of particles produced during airbag deployment by scanning electron microscopy with energy dispersive x-ray spectroscopy and their deposition on surrounding surfaces: a mid-research summary [8036-18]Wyatt, J.M. et al. | 2011
-
Study of LCE nanocomposites through electron microscopy [8036-15]Torras, N. / Jobet, J. / Marshall, J.E. / Zinoviev, K. / Yates, D. / Rotkina, L. / Esteve, J. / Terentjev, E.M. / Campo, E.M. et al. | 2011
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Scientific working group on gunshot residue (SWGGSR): a progress report [8036-05]Trimpe, M.A. et al. | 2011
-
Application possibilities of several modern methods of microscopy and microanalysis in forensic science field [8036-07]Kotrly, M. / Turkova, I. et al. | 2011
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Transmission electron microscopy of electrospun GaN nanofibers [8036-14]Robles-Garcia, J.L. / Melendez, A. / Yates, D. / Santiago-Aviles, J.J. / Ramos, I. / Campo, E.M. et al. | 2011
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Study of a large range metrological atomic force microscope applied for calibration of a vertical PZT stage [8036-27]Wang, S.H. / Tan, S.L. / Xu, G. et al. | 2011
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Use of fluorescence and scanning electron microscopy as tools in teaching biology [8036-40]Ghosh, N. / Silva, J. / Vazquez, A. / Das, A.B. / Smith, D.W. et al. | 2011
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3D-measurement using a scanning electron microscope with four Everhart-Thornley detectors [8036-42]Vynnyk, T. / Scheuer, R. / Reithmeier, E. et al. | 2011
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Traceable calibration of a critical dimension atomic force microscope [8036-28]Dixson, R. / Orji, N.G. / McGray, C.D. / Geist, J. et al. | 2011
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Dispersion free all reflective confocal microscope objective [8036-38]Walecki, W.J. / Scaggs, M. / Walecki, P.S. / Szondy, F. et al. | 2011
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Characterization and source identification of fugitive dusts by light and electron microscopy [8036-06]Brown, R.S. et al. | 2011
-
Advanced image composition with intra-frame drift correction [8036-12]Cizmar, P. / Vladar, A.E. / Postek, M.T. et al. | 2011
-
A metrological scanning probe microscope based on a quartz tuning fork detector [8036-25]Babic, B. / Freund, C.H. / Lawn, M. / Miles, J.R. / Herrmann, J. et al. | 2011