ZERODUR for stress mirror polishing [8126-04] (English)
- New search for: Jedamzik, R.
- New search for: Kunisch, C.
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- New search for: Jedamzik, R.
- New search for: Kunisch, C.
- New search for: Westerhoff, T.
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In:
Optical manufacturing and testing
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8126 06
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2011
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ISBN:
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ISSN:
- Conference paper / Print
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Title:ZERODUR for stress mirror polishing [8126-04]
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Contributors:Jedamzik, R. ( author ) / Kunisch, C. ( author ) / Westerhoff, T. ( author ) / Burge, James H. / Fahnle, Oliver W. / Williamson, Ray A. / SPIE (Society)
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Conference:conference; 9th, Optical manufacturing and testing ; 2011 ; San Diego, CA
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Published in:Optical manufacturing and testing ; 8126 06PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 8126 ; 8126 06
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Publisher:
- New search for: SPIE
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Place of publication:Bellingham
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Publication date:2011-01-01
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Size:8126 06
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Remarks:"SPIE Optics+Photonics" --cover. Includes bibliographical references and index. Optical manufacturing and testing 9. Optical manufacturing and testing nine.
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ISBN:
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ISSN:
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Type of media:Conference paper
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Type of material:Print
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Language:English
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Keywords:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents conference proceedings
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 81260A
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Progress in 4m class ZERODUR mirror productionWesterhoff, Thomas / Gruen, Steffen / Jedamzik, Ralf / Klein, Christopher / Werner, Thomas / Werz, Alexander et al. | 2011
- 81260B
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Open-source data analysis and visualization software platform: SAGUAROKim, Dae Wook / Lewis, Benjamin J. / Burge, James H. et al. | 2011
- 81260C
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Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moiré interferometerChen, Hsi-Chao / Huang, Kuo-Ting / Lo, Yen-Ming / Chiu, Hsuan-Yi / Chen, Guan-Jhen et al. | 2011
- 81260D
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MicroFinish Topographer: surface finish metrology for large and small opticsParks, Robert E. et al. | 2011
- 81260E
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Scanning Long-wave Optical Test System: a new ground optical surface slope test systemSu, Tianquan / Park, Won Hyun / Parks, Robert E. / Su, Peng / Burge, James H. et al. | 2011
- 81260F
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Phase-shifting Zernike interferometer wavefront sensorWallace, J. Kent / Rao, Shanti / Jensen-Clem, Rebecca M. / Serabyn, Gene et al. | 2011
- 81260H
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Dynamic surface roughness profilerKimbrough, Brad / Brock, Neal / Millerd, James et al. | 2011
- 81260I
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Cryo-stability of HB-Cesic opticsKrödel, Matthias et al. | 2011
- 81260J
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Analysis of fine-grinding techniques in terms of achievable surface qualitiesFähnle, O. / Hauser, K. et al. | 2011
- 81260K
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Fabricating and testing complex optical elements with high precisionWang, Hexin / Giggel, Volkmar / Derst, Gerhard / Koch, Thomas et al. | 2011
- 81260L
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Analytical process design for chemo-mechanical polishing of glass aspheresWaechter, Daniel / Dambon, Olaf / Klocke, Fritz et al. | 2011
- 81260M
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Non-contact profilometry of E-ELT segments at OpTIC GlyndwrAtkins, Carolyn / Mitchell, John / Rees, Paul et al. | 2011
- 81260N
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Electronic speckle pattern interferometric testing of JWST primary mirror segment assemblySmith, Koby Z. / Chaney, David M. / Saif, Babak N. et al. | 2011
- 81260O
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Cryogenic optical testing results of JWST aspheric test plate lensSmith, Koby Z. / Towell, Timothy C. et al. | 2011
- 81260P
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The optical metrology system for cryogenic testing of the JWST primary mirror segmentsHadaway, James B. / Chaney, David M. / Carey, Larkin B. et al. | 2011
- 81260Q
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The design of MTF test system based on point light sourceFu, Rongguo / Wu, Ning / Zhang, Xinlong / Qiu, Yafeng / Chang, Benkang et al. | 2011
- 81260R
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Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devicesXiao, Muzheng / Jujo, Satomi / Takahashi, Satoru / Takamasu, Kiyoshi et al. | 2011
- 81260T
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A complete qualification methodology for coatings of precision glass molding toolsKlocke, F. / Georgiadis, K. / Dambon, O. / Bouzakis, K.-D. / Gerardis, S. / Skordaris, G. et al. | 2011
- 81260U
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Fluid jet and bonnet polishing of optical moulds for application from visible to x-rayBeaucamp, Anthony T. H. / Freeman, Richard R. / Matsumoto, Akihiro / Namba, Yoshiharu et al. | 2011
- 81260V
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From Herschel to Gaia: 3-meter class SiC space opticsBougoin, Michel / Lavenac, Jérôme et al. | 2011
- 81260W
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Swing arm optical CMM: self calibration with dual probe shear testSu, Peng / Wang, Yuhao / Oh, Chang Jin / Parks, Robert E. / Burge, James H. et al. | 2011
- 81260X
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Determining parametric TIS behavior from optical fabrication metrology dataHarvey, James E. / Shröder, Sven / Choi, Narak / Duparré, Angela et al. | 2011
- 81260Y
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Extended vertical range roughness measurements in non-ideal environmentsCreath, Katherine et al. | 2011
- 81261A
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Manufacturing process optimization of phase plates for depth extension microscopy systemsHsu, Chih-Cheng / Sung, Hsin-Yueh / Chen, Yung-Lin / Chang, Chuan-Chung / Chang, Chir-Weei / Cheng, Wen-Hung / Liang, Chin-Tsia et al. | 2011
- 81261B
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An intuitive concept for manufacturing and inspecting of aspherical componentsChou, Hsiao-Yu / Chang, Keng-Shou et al. | 2011
- 81261C
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Verification program for a high-precision large cryogenic lens holderBoesz, A. / Grupp, F. / Leberle, T. / Mottaghibonab, A. / Geis, N. / Bender, R. et al. | 2011
- 81261D
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Flexible manufacturing of large aspheres for VLT's Optical Tube AssembliesGubbels, G. / Henselmans, R. / van Drunen, C. et al. | 2011
- 81261E
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New approach for pre-polish grinding with low subsurface damageJohnson, James B. / Kim, Dae Wook / Parks, Robert E. / Burge, James H. et al. | 2011
- 81261F
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Optical contacting of low-expansion materialsKalkowski, G. / Risse, S. / Rothhardt, C. / Rohde, M. / Eberhardt, R. et al. | 2011
- 81261G
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Package technology for microcavitiesZhang, Wen-Dong / Yan, Ying-Zhan / Liu, Jun / Yan, Shu-Bin / Xue, Chen-Yang / Xiong, Ji-Jun et al. | 2011
- 81261H
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The photoanisotropy in the holographic media on the basis of silver halide emulsionShaverdova, Valentina / Petrova, Svetlana / Purtseladze, Anna / Tarasashvili, Lado et al. | 2011
- 81261I
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Development of high-performance, stable, and moisture-resistant polarization-sensitive materialsChaganava, Irakli / Kakauridze, George / Kilosanidze, Barbara / Datukishvili, George et al. | 2011
- 812601
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Front Matter: Volume 8126| 2011
- 812603
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Optical manufacturing and testing requirements identified by the NASA Science Instruments, Observatories, and Sensor Systems Technology AssessmentStahl, H. Philip / Barney, Rich / Bauman, Jill / Feinberg, Lee / McCleese, Dan / Singh, Upendra et al. | 2011
- 812604
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Technologies for producing segments for extremely large telescopesWalker, D. / Atkins, C. / Baker, I. / Evans, R. / Hamidi, S. / Harris, P. / Li, H. / Messelink, W. / Mitchell, J. / Parry-Jones, M. et al. | 2011
- 812606
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ZERODUR for stress mirror polishingJedamzik, Ralf / Kunisch, Clemens / Westerhoff, Thomas et al. | 2011
- 812607
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Design and fabrication of a 3m class light weighted mirror blank for the E-ELT M5Jedamzik, Ralf / Seibert, Volker / Thomas, Armin / Westerhoff, Thomas / Müller, Michael / Cayrel, Marc et al. | 2011
- 812609
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Piezoelectric deformable mirror based on monolithic PVDF membranesFinney, Greg A. / Spradley, Kevin / Farmer, Brandon / Smith, Lensey / Patrick, Brian et al. | 2011
- 812610
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Instantaneous measurement Fizeau interferometer with high spatial resolutionSykora, Daniel M. / de Groot, Peter et al. | 2011
- 812611
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Study of air-driving fluid jet polishingYu, Zong-Ru / Kuo, Ching-Hsiang / Chen, Chun-Cheng / Hsu, Wei-Yao / Tsai, Din Ping et al. | 2011
- 812612
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Optical bonding reinforced by femtosecond laser weldingLacroix, Fabrice / Hélie, David / Vallée, Réal et al. | 2011
- 812613
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Incorporating VIBE into the precision optics manufacturing processDeGroote Nelson, Jessica / Gould, Alan / Klinger, Charles / Mandina, Michael et al. | 2011
- 812614
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Computer-aided manufacturing for freeform optical elements by ultraprecision micromillingStoebenau, Sebastian / Kleindienst, Roman / Hofmann, Meike / Sinzinger, Stefan et al. | 2011
- 812615
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Calibration and optimization of computer-controlled optical surfacing for large opticsKim, Dae Wook / Martin, Hubert M. / Burge, James H. et al. | 2011
- 812616
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Centration of optical elementsMilby, Ezra / Burge, Jim et al. | 2011
- 812617
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Slow tool servo diamond turning of optical freeform surface for astigmatic contact lensChen, Chun-Chieh / Cheng, Yuan-Chieh / Hsu, Wei-Yao / Chou, Hsiao-Yu / Wang, Pei-Jen / Tsai, Din Ping et al. | 2011
- 812618
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The fabrication of high filling factor double side micro lens array with high alignment accuracyCheng, Yuan-Chieh / Chen, Chun-Chieh / Hsu, Wei-Yao / Wang, Pei Jen / Tsai, Din Ping et al. | 2011
- 812619
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Mirror segments for large mirror systems of weak optical signals detectors for UV spectral rangeSchovanek, P. / Hrabovsky, M. / Palatka, M. / Pech, M. / Mandat, D. / Nozka, L. / Dejneka, A. / Jankuj, J. / Vujtek, M. et al. | 2011
- xiii
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The history of telescopes and binoculars: an engineering perspective (Plenary Paper) [8129-100]Greivenkamp, J.E. / Steed, D.L. / SPIE (Society) et al. | 2011
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Measuring the residual stress of transparent conductive oxide films on PET by the double-beam shadow Moire interferometer [8126-10]Chen, H.-C. / Huang, K.-T. / Lo, Y.-M. / Chiu, H.-Y. / Chen, G.-J. / SPIE (Society) et al. | 2011
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Non-contact profilometry of E-ELT segments at OpTlC Glyndwr [8126-21]Atkins, C. / Mitchell, J. / Rees, P. / SPIE (Society) et al. | 2011
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Slow tool servo diamond turning of optical freeform surface for astigmatic contact lens [8126-28]Chen, C.-C. / Cheng, Y.-C. / Hsu, W.-Y. / Chou, H.-Y. / Wang, P.J. / Tsai, D.P. / SPIE (Society) et al. | 2011
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Flexible manufacturing of large aspheres for VLT's Optical Tube Assemblies [8126-46]Gubbels, G. / Henselmans, R. / van Drunen, C. / SPIE (Society) et al. | 2011
-
Phase-shifting Zernike interferometer wavefront sensor [8126-13]Wallace, J.K. / Rao, S. / Jensen-Clem, R.M. / Serabyn, G. / SPIE (Society) et al. | 2011
-
Nanometer profile measurement of large aspheric optical surface by scanning deflectometry with rotatable devices [8126-26]Xiao, M. / Jujo, S. / Takahashi, S. / Takamasu, K. / SPIE (Society) et al. | 2011
-
Optical bonding reinforced by femtosecond laser welding [8126-37]Lacroix, F. / Helie, D. / Vallee, R. / SPIE (Society) et al. | 2011
-
The photoanisotropy in the holographic media on the basis of silver halide emulsion [8126-50]Shaverdova, V. / Petrova, S. / Purtseladze, A. / Tarasashvili, L. / SPIE (Society) et al. | 2011
-
Computer-aided manufacturing for freeform optical elements by ultraprecision micromilling [8126-39]Stoebenau, S. / Kleindienst, R. / Hofmann, M. / Sinzinger, S. / SPIE (Society) et al. | 2011
-
Calibration and optimization of computer-controlled optical surfacing for large optics [8126-40]Kim, D.W. / Martin, H.M. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Manufacturing process optimization of phase plates for depth extension microscopy systems [8126-43]Hsu, C.-C. / Sung, H.-Y. / Chen, Y.-L. / Chang, C.-C. / Chang, C.-W. / Cheng, W.-H. / Liang, C.-T. / SPIE (Society) et al. | 2011
-
New approach for pre-polish grinding with low subsurface damage [8126-47]Johnson, J.B. / Kim, D.W. / Parks, R.E. / Burge, J.H. / SPIE (Society) et al. | 2011
-
MicroFinish Topographer: surface finish metrology for large and small optics [8126-11]Parks, R.E. / SPIE (Society) et al. | 2011
-
Cryo-stability of HB-Cesic optics [8126-16]Krodel, M. / SPIE (Society) et al. | 2011
-
Analysis of fine-grinding techniques in terms of achievable surface qualities [8126-17]Fahnle, O. / Hauser, K. / SPIE (Society) et al. | 2011
-
The optical metrology system for cryogenic testing of the JWST primary mirror segments [8126-25]Hadaway, J.B. / Chaney, D.M. / Carey, L.B. / SPIE (Society) et al. | 2011
-
Optical manufacturing and testing requirements identified by the NASA Science Instruments, Observatories, and Sensor Systems Technology Assessment (Invited Paper) [8126-01]Stahl, H.P. / Barney, R. / Bauman, J. / Feinberg, L. / McCleese, D. / Singh, U. / SPIE (Society) et al. | 2011
-
Design and fabrication of a 3m class light weighted mirror blank for the E-ELT M5 [8126-05]Jedamzik, R. / Seibert, V. / Thomas, A. / Westerhoff, T. / Muller, M. / Cayrel, M. / SPIE (Society) et al. | 2011
-
Analytical process design for chemo-mechanical polishing of glass aspheres [8126-19]Waechter, D. / Dambon, O. / Klocke, F. / SPIE (Society) et al. | 2011
-
Fluid jet and bonnet polishing of optical moulds for application from visible to x-ray [8126-53]Beaucamp, A.T.H. / Freeman, R.R. / Matsumoto, A. / Namba, Y. / SPIE (Society) et al. | 2011
-
Study of air-driving fluid jet polishing [8126-36]Yu, Z.-R. / Kuo, C.-H. / Chen, C.-C. / Hsu, W.-Y. / Tsai, D.-P. / SPIE (Society) et al. | 2011
-
Mirror segments for large mirror systems of weak optical signals detectors for UV spectral range [8126-42]Schovanek, P. / Hrabovsky, M. / Palatka, M. / Pech, M. / Mandat, D. / Nozka, L. / Dejneka, A. / Jankuj, J. / Vujtek, M. / SPIE (Society) et al. | 2011
-
Verification program for a high-precision large cryogenic lens holder [8126-45]Boesz, A. / Grupp, F. / Leberle, T. / Mottaghibonab, A. / Geis, N. / Bender, R. / SPIE (Society) et al. | 2011
-
Cryogenic optical testing results of JWST aspheric test plate lens [8126-23]Smith, K.Z. / Towell, T.C. / SPIE (Society) et al. | 2011
-
Incorporating VIBE into the precision optics manufacturing process [8126-38]Nelson, J.D. / Gould, A. / Klinger, C. / Mandina, M. / SPIE (Society) et al. | 2011
-
An intuitive concept for manufacturing and inspecting of aspherical components [8126-44]Chou, H.-Y. / Chang, K.-S. / SPIE (Society) et al. | 2011
-
ZERODUR for stress mirror polishing [8126-04]Jedamzik, R. / Kunisch, C. / Westerhoff, T. / SPIE (Society) et al. | 2011
-
Fabricating and testing complex optical elements with high precision [8126-18]Wang, H. / Giggel, V. / Derst, G. / Koch, T. / SPIE (Society) et al. | 2011
-
Technologies for producing segments for extremely large telescopes [8126-02]Walker, D. / Atkins, C. / Baker, I. / Evans, R. / Hamidi, S. / Harris, P. / Li, H. / Messelink, W. / Mitchell, J. / Parry-Jones, M. et al. | 2011
-
Piezoelectric deformable mirror based on monolithic PVDF membranes [8126-07]Finney, G.A. / Spradley, K. / Farmer, B. / Smith, L. / Patrick, B. / SPIE (Society) et al. | 2011
-
Dynamic surface roughness profiler [8126-15]Kimbrough, B. / Brock, N. / Millerd, J. / SPIE (Society) et al. | 2011
-
Centration of optical elements [8126-41]Milby, E. / Burge, J. / SPIE (Society) et al. | 2011
-
The fabrication of high filling factor double side micro lens array with high alignment accuracy [8126-29]Cheng, Y.-C. / Chen, C.-C. / Hsu, W.-Y. / Wang, P.J. / Tsai, D.P. / SPIE (Society) et al. | 2011
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Progress in 4m class ZERODUR mirror production [8126-08]Westerhoff, T. / Gruen, S. / Jedamzik, R. / Klein, C. / Werner, T. / Werz, A. / SPIE (Society) et al. | 2011
-
Scanning Long-wave Optical Test System: a new ground optical surface slope test system [8126-12]Su, T. / Park, W.H. / Parks, R.E. / Su, P. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Electronic speckle pattern interferometric testing of JWST primary mirror segment assembly [8126-22]Smith, K.Z. / Chaney, D.M. / Saif, B.N. / SPIE (Society) et al. | 2011
-
A complete qualification methodology for coatings of precision glass molding tools [8126-20]Klocke, F. / Georgiadis, K. / Dambon, O. / Bouzakis, K.-D. / Gerardis, S. / Skordaris, G. / SPIE (Society) et al. | 2011
-
Determining parametric TIS behavior from optical fabrication metrology data [8126-32]Harvey, J.E. / Shroder, S. / Choi, N. / Duparre, A. / SPIE (Society) et al. | 2011
-
Extended vertical range roughness measurements in non-ideal environments [8126-33]Creath, K. / SPIE (Society) et al. | 2011
-
Package technology for microcavities [8126-49]Zhang, W.-D. / Yan, Y.-Z. / Liu, J. / Yan, S.-B. / Xue, C.-Y. / Xiong, J.-J. / SPIE (Society) et al. | 2011
-
Optical contacting of low-expansion materials [8126-48]Kalkowski, G. / Risse, S. / Rothhardt, C. / Rohde, M. / Eberhardt, R. / SPIE (Society) et al. | 2011
-
Development of high-performance, stable, and moisture-resistant polarization-sensitive materials [8126-51]Chaganava, I. / Kakauridze, G. / Kilosanidze, B. / Datukishvili, G. / SPIE (Society) et al. | 2011
-
Open-source data analysis and visualization software platform: SAGUARO [8126-09]Kim, D.W. / Lewis, B.J. / Burge, J.H. / SPIE (Society) et al. | 2011
-
Instantaneous measurement Fizeau interferometer with high spatial resolution [8126-35]Sykora, D.M. / de Groot, P. / SPIE (Society) et al. | 2011
-
The design of MTF test system based on point light source [8126-24]Fu, R. / Wu, N. / Zhang, X. / Qiu, Y. / Chang, B. / SPIE (Society) et al. | 2011
-
From Herschel to Gaia: 3-meter class SiC space optics [8126-30]Bougoin, M. / Lavenac, J. / SPIE (Society) et al. | 2011
-
Swing arm optical CMM: self calibration with dual probe shear test [8126-31]Su, P. / Wang, Y. / Oh, C.J. / Parks, R.E. / Burge, J.H. / SPIE (Society) et al. | 2011