Applications of optical logic-operated moire in moire topography and deflectometry (Unknown)
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- New search for: He, A.
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In:
APPLIED OPTICS
;
31
, 34
;
7355
;
1992
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ISSN:
- Article (Journal) / Print
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Title:Applications of optical logic-operated moire in moire topography and deflectometry
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Contributors:
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Published in:APPLIED OPTICS ; 31, 34 ; 7355
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Publisher:
- New search for: OSA OPTICAL SOCIETY OF AMERICA
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Publication date:1992-01-01
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Size:7355 pages
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ISSN:
-
Type of media:Article (Journal)
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Type of material:Print
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Language:Unknown
- New search for: 535.05 / 530
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Classification:
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Source:
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Table of contents – Volume 31, Issue 34
The tables of contents are generated automatically and are based on the data records of the individual contributions available in the index of the TIB portal. The display of the Tables of Contents may therefore be incomplete.
- 7164
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Examination of the polished surface character of fused silicaTesar, A. A. / Fuchs, B. A. / Hed, P. P. et al. | 1992
- 7174
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Surface normal rotation: a new technique for grazing-incidence monochromators (Technical Note)Hettrick, M. C. et al. | 1992
- 7178
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Thermal apparent-strain sensitivity of surface-adhered, fiber-optic strain gauges (Technical Note)Valis, T. / Hogg, D. / Measures, R. M. et al. | 1992
- 7180
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Reset-free systems for real-time polarization control and synthesis (Technical Note)Weber, A. / Heffner, B. L. / Dolfi, D. W. / Chou, P. et al. | 1992
- 7182
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Measurement of Mueller matrices: erratum (Technical Note)Anderson, R. et al. | 1992
- 7183
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Calculation of effective index for nonguiding regionsJaeger, N. A. F. / Lai, W. C. et al. | 1992
- 7191
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Optical metrology for two large highly aspheric telescope mirrorsWest, S. C. / Burge, J. H. / Young, R. S. / Anderson, D. S. et al. | 1992
- 7198
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Modulation transfer function measurement technique for small-pixel detectorsMarchywka, M. / Socker, D. G. et al. | 1992
- 7214
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Bolometric detectors: optimization for differential radiometersGlezer, E. N. / Lange, A. E. / Wilbanks, T. M. et al. | 1992
- 7219
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Characterization of an absolute cryogenic radiometer as a standard detector for radiant-power measurementsDatla, R. U. / Stock, K. / Parr, A. C. / Hoyt, C. C. et al. | 1992
- 7226
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International intercomparison of detector responsivity at 1300 and 1550 nmGardner, J. L. / Gallawa, R. L. / Stock, K. D. / Nettleton, D. H. et al. | 1992
- 7232
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Loss mechanisms in optical light pipesRemillard, J. T. / Everson, M. P. / Weber, W. H. et al. | 1992
- 7242
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Differential type of phase-locked laser diode interferometer free from external disturbanceSuzuki, T. / Sasaki, O. / Higuchi, K. / Maruyama, T. et al. | 1992
- 7249
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Determination of refractive properties of fluids for dual-wavelength interferometryVikram, C. S. / Witherow, W. K. / Trolinger, J. D. et al. | 1992
- 7253
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Direct readout of dynamic phase changes in a fiber-optic homodyne interferometerJin, W. / Uttamchandani, D. G. / Culshaw, B. et al. | 1992
- 7259
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Scalable aspheric corrective mirror for end-pumped solid-state lasersCousins, A. K. et al. | 1992
- 7267
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Shared aperture for two beams of different wavelength using reflective phase gratings and the Talbot effectHector, S. D. / Swanson, G. J. et al. | 1992
- 7277
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Methods of choosing sample rays in ray-tracing computationsDavies, P. A. et al. | 1992
- 7283
-
Sensing refractive-turbulence profiles (C~n^2) using wave front phase measurements from multiple reference sourcesWelsh, B. M. et al. | 1992
- 7292
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Aligning lithography on opposite surfaces of a substrateEverett, P. N. / Delancy, W. F. et al. | 1992
- 7295
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Dual-sided lithography: a method for evaluating alignment accuracyFarn, M. W. / Kane, J. S. / Delaney, W. et al. | 1992
- 7301
-
Full-field vibrometry using a Fabry-Perot etalon interferometerOursler, D. A. / Wagner, J. W. et al. | 1992
- 7309
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Optical properties of glasses in the ZnO-CdO-SiO~2 ternary systemZayas, M. E. / Rivera, E. / Rincon, J. M. et al. | 1992
- 7313
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Optical constants of polyimide films in the soft x-ray region from reflection and transmission measurementsWolf, R. / Birken, H.-G. / Kunz, C. et al. | 1992
- 7328
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General ray-tracing formulas for crystalZhang, W.-Q. et al. | 1992
- 7332
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Nonimaging compound parabolic concentrator-type reflectors with variable extremeGordon, J. M. / Rabl, A. et al. | 1992
- 7339
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X-ray focusing using microchannel platesKaaret, P. / Geissbuehler, P. / Chen, A. / Glavinas, E. et al. | 1992
- 7344
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Differential optical microscopy based on higher-order Gaussian-Hermite beam patternsChrusch, P. / Vaez-Iravani, M. et al. | 1992
- 7348
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Projection moire fringe pattern prediction using the optical transfer function in the presence of aberrationsWegdam, A. M. F. / Podzimek, O. / Verhoeven, E. C. M. et al. | 1992
- 7355
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Applications of optical logic-operated moire in moire topography and deflectometryZhang, J. / Zhang, L. / He, A. / Liu, L. et al. | 1992
- 7361
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Optical fibre sensing with a low-finesse Fabry-Perot cavitySantos, J. L. / Leite, A. P. / Jackson, D. A. et al. | 1992
- 7367
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Optical constants of thin silicon films near the silicon L~2~.~3 absorption edgeSeely, J. F. / Hunter, W. R. / Rife, J. C. / Kowalski, M. P. et al. | 1992
- 7371
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Fringe pattern in holographic interferometry for thermal expansion characterization of anisotropic bodiesFraile, D. / Gascon, F. / Varade, A. et al. | 1992